This collection includes both ASU Theses and Dissertations, submitted by graduate students, and the Barrett, Honors College theses submitted by undergraduate students. 

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Description
Digital architectures for data encryption, processing, clock synthesis, data transfer, etc. are susceptible to radiation induced soft errors due to charge collection in complementary metal oxide semiconductor (CMOS) integrated circuits (ICs). Radiation hardening by design (RHBD) techniques such as double modular redundancy (DMR) and triple modular redundancy (TMR) are used

Digital architectures for data encryption, processing, clock synthesis, data transfer, etc. are susceptible to radiation induced soft errors due to charge collection in complementary metal oxide semiconductor (CMOS) integrated circuits (ICs). Radiation hardening by design (RHBD) techniques such as double modular redundancy (DMR) and triple modular redundancy (TMR) are used for error detection and correction respectively in such architectures. Multiple node charge collection (MNCC) causes domain crossing errors (DCE) which can render the redundancy ineffectual. This dissertation describes techniques to ensure DCE mitigation with statistical confidence for various designs. Both sequential and combinatorial logic are separated using these custom and computer aided design (CAD) methodologies.

Radiation vulnerability and design overhead are studied on VLSI sub-systems including an advanced encryption standard (AES) which is DCE mitigated using module level coarse separation on a 90-nm process with 99.999% DCE mitigation. A radiation hardened microprocessor (HERMES2) is implemented in both 90-nm and 55-nm technologies with an interleaved separation methodology with 99.99% DCE mitigation while achieving 4.9% increased cell density, 28.5 % reduced routing and 5.6% reduced power dissipation over the module fences implementation. A DMR register-file (RF) is implemented in 55 nm process and used in the HERMES2 microprocessor. The RF array custom design and the decoders APR designed are explored with a focus on design cycle time. Quality of results (QOR) is studied from power, performance, area and reliability (PPAR) perspective to ascertain the improvement over other design techniques.

A radiation hardened all-digital multiplying pulsed digital delay line (DDL) is designed for double data rate (DDR2/3) applications for data eye centering during high speed off-chip data transfer. The effect of noise, radiation particle strikes and statistical variation on the designed DDL are studied in detail. The design achieves the best in class 22.4 ps peak-to-peak jitter, 100-850 MHz range at 14 pJ/cycle energy consumption. Vulnerability of the non-hardened design is characterized and portions of the redundant DDL are separated in custom and auto-place and route (APR). Thus, a range of designs for mission critical applications are implemented using methodologies proposed in this work and their potential PPAR benefits explored in detail.
ContributorsRamamurthy, Chandarasekaran (Author) / Clark, Lawrence T (Thesis advisor) / Allee, David (Committee member) / Bakkaloglu, Bertan (Committee member) / Holbert, Keith E. (Committee member) / Arizona State University (Publisher)
Created2017
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Description
Radiation hardening by design (RHBD) has become a necessary practice when creating circuits to operate within radiated environments. While employing RHBD techniques has tradeoffs between size, speed and power, novel designs help to minimize these penalties. Space radiation is the primary source of radiation errors in circuits and two types

Radiation hardening by design (RHBD) has become a necessary practice when creating circuits to operate within radiated environments. While employing RHBD techniques has tradeoffs between size, speed and power, novel designs help to minimize these penalties. Space radiation is the primary source of radiation errors in circuits and two types of single event effects, single event upsets (SEU), and single event transients (SET) are increasingly becoming a concern. While numerous methods currently exist to nullify SEUs and SETs, special consideration to the techniques of temporal hardening and interlocking are explored in this thesis. Temporal hardening mitigates both SETs and SEUs by spacing critical nodes through the use of delay elements, thus allowing collected charge to be removed. Interlocking creates redundant nodes to rectify charge collection on one single node. This thesis presents an innovative, temporally hardened D flip-flop (TFF). The TFF physical design is laid out in the 130 nm TSMC process in the form of an interleaved multi-bit cell and the circuitry necessary for the flip-flop to be hardened against SETs and SEUs is analyzed with simulations verifying these claims. Comparisons are made to an unhardened D flip-flop through speed, size, and power consumption depicting how the RHBD technique used increases all three over an unhardened flip-flop. Finally, the blocks from both the hardened and the unhardened flip-flops being placed in Synthesis and auto-place and route (APR) design flows are compared through size and speed to show the effects of using the high density multi-bit layout. Finally, the TFF presented in this thesis is compared to two other flip-flops, the majority voter temporal/DICE flip-flop (MTDFF) and the C-element temporal/DICE flip-flop (CTDFF). These circuits are built on the same 130 nm TSMC process as the TFF and then analyzed by the same methods through speed, size, and power consumption and compared to the TFF and unhardened flip-flops. Simulations are completed on the MTDFF and CTDFF to show their strengths against D node SETs and SEUs as well as their weakness against CLK node SETs. Results show that the TFF is faster and harder than both the MTDFF and CTDFF.
ContributorsMatush, Bradley (Author) / Clark, Lawrence T (Thesis advisor) / Allee, David (Committee member) / Bakkaloglu, Bertan (Committee member) / Arizona State University (Publisher)
Created2010
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Description
NGExtract 2 is a complete transistor (MOSFET) parameter extraction solution based upon the original computer program NGExtract by Rahul Shringarpure written in February 2007. NGExtract 2 is written in Java and based around the circuit simulator NGSpice. The goal of the program is to be used to produce

NGExtract 2 is a complete transistor (MOSFET) parameter extraction solution based upon the original computer program NGExtract by Rahul Shringarpure written in February 2007. NGExtract 2 is written in Java and based around the circuit simulator NGSpice. The goal of the program is to be used to produce accurate transistor models based around real-world transistor data. The program contains numerous improvements to the original program:
• Completely rewritten with performance and usability in mind
• Cross-Platform vs. Linux Only
• Simple installation procedure vs. compilation and manual library configuration
• Self-contained, single file runtime
• Particle Swarm Optimization routine
NGExtract 2 works by plotting the Ids vs. Vds and Ids vs. Vgs curves of a simulation model and the measured, real-world data. The user can adjust model parameters and re-simulate to attempt to match the curves. The included Particle Swarm Optimization routine attempts to automate this process by iteratively attempting to improve a solution by measuring its sum-squared error against the real-world data that the user has provided.
ContributorsVetrano, Michael Thomas (Author) / Allee, David (Thesis director) / Gorur, Ravi (Committee member) / Bakkaloglu, Bertan (Committee member) / Barrett, The Honors College (Contributor) / Computer Science and Engineering Program (Contributor)
Created2013-05
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Description
Respiratory behavior provides effective information to characterize lung functionality, including respiratory rate, respiratory profile, and respiratory volume. Current methods have limited capabilities of continuous characterization of respiratory behavior and are primarily targeting the measurement of respiratory rate, which has relatively less value in clinical application. In this dissertation, a wireless

Respiratory behavior provides effective information to characterize lung functionality, including respiratory rate, respiratory profile, and respiratory volume. Current methods have limited capabilities of continuous characterization of respiratory behavior and are primarily targeting the measurement of respiratory rate, which has relatively less value in clinical application. In this dissertation, a wireless wearable sensor on a paper substrate is developed to continuously characterize respiratory behavior and deliver clinically relevant parameters, contributing to asthma control. Based on the anatomical analysis and experimental results, the optimum site for the wireless wearable sensor is on the midway of the xiphoid process and the costal margin, corresponding to the abdomen-apposed rib cage. At the wearing site, the linear strain change during respiration is measured and converted to lung volume by the wireless wearable sensor utilizing a distance-elapsed ultrasound. An on-board low-power Bluetooth module transmits the temporal lung volume change to a smartphone, where a custom-programmed app computes to show the clinically relevant parameters, such as forced vital capacity (FVC) and forced expiratory volume delivered in the first second (FEV1) and the FEV1/FVC ratio. Enhanced by a simple, yet effective machine-learning algorithm, a system consisting of two wireless wearable sensors accurately extracts respiratory features and classifies the respiratory behavior within four postures among different subjects, demonstrating that the respiratory behaviors are individual- and posture-dependent contributing to monitoring the posture-related respiratory diseases. The continuous and accurate monitoring of respiratory behaviors can track the respiratory disorders and diseases' progression for timely and objective approaches for control and management.
ContributorsChen, Ang (Author) / Cao, Yu (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Allee, David (Committee member) / Goryll, Michael (Committee member) / Arizona State University (Publisher)
Created2020