This collection includes both ASU Theses and Dissertations, submitted by graduate students, and the Barrett, Honors College theses submitted by undergraduate students. 

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Description
Pacemakers in the early 1970s were powered by betavoltaic devices which provided long lasting battery life. The betavoltaic devices also emitted gamma radiation due to inadvertent radioisotope contamination, which could not be completely shielded. The betavoltaic devices were quickly replaced by lithium batteries after their invention, and betavoltaics were abandoned.

Pacemakers in the early 1970s were powered by betavoltaic devices which provided long lasting battery life. The betavoltaic devices also emitted gamma radiation due to inadvertent radioisotope contamination, which could not be completely shielded. The betavoltaic devices were quickly replaced by lithium batteries after their invention, and betavoltaics were abandoned. Modern technological advancements made it possible to isolate beta emitting radioisotopes properly and achieve better energy conversion efficiencies which revived the topic of betavoltaics. This research project has studied state-of-the-art pacemakers and modern radioactive power sources in order to determine if modern pacemakers can be safely nuclear powered and if that is a reasonable combination.
ContributorsAwad, Al-Homam Abdualrahman (Author) / Holbert, Keith (Thesis director) / Aberle, James (Committee member) / Barrett, The Honors College (Contributor) / Electrical Engineering Program (Contributor)
Created2014-12
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Description
A novel strain sensing procedure using an optical scanning methodology and diffraction grating is explored. The motivation behind this study is due to uneven thermal strain distribution across semiconductor chips that are composed of varying materials. Due to the unique properties of the materials and the different coefficients of thermal

A novel strain sensing procedure using an optical scanning methodology and diffraction grating is explored. The motivation behind this study is due to uneven thermal strain distribution across semiconductor chips that are composed of varying materials. Due to the unique properties of the materials and the different coefficients of thermal expansion (CTE), one can expect the material that experiences the highest strain to be the most likely failure point of the chip. As such, there is a need for a strain sensing technique that offers a very high strain sensitivity, a high spatial resolution while simultaneously achieving a large field of view. This study goes through the optical setup as well as the evolution of the optical grating in an effort to improve the strain sensitivity of this setup.
ContributorsChen, George (Co-author) / Ma, Teng (Co-author) / Liang, Hanshuang (Co-author) / Song, Zeming (Co-author) / Nguyen, Hoa (Co-author) / Yu, Hongbin (Thesis director) / Jiang, Hanqing (Committee member) / Barrett, The Honors College (Contributor) / Electrical Engineering Program (Contributor)
Created2014-05