Matching Items (2)
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Radiation hardened pulse based D flip flop design

Description
ABSTRACT The D flip flop acts as a sequencing element while designing any pipelined system. Radiation Hardening by Design (RHBD) allows hardened circuits to be fabricated on commercially available CMOS manufacturing process. Recently, single event transients (SET's) have become as important as single event upset (SEU) in radiation hardened high…

ABSTRACT The D flip flop acts as a sequencing element while designing any pipelined system. Radiation Hardening by Design (RHBD) allows hardened circuits to be fabricated on commercially available CMOS manufacturing process. Recently, single event transients (SET's) have become as important as single event upset (SEU) in radiation hardened high speed digital designs. A novel temporal pulse based RHBD flip-flop design is presented. Temporally delayed pulses produced by a radiation hardened pulse generator design samples the data in three redundant pulse latches. The proposed RHBD flip-flop has been statistically designed and fabricated on 90 nm TSMC LP process. Detailed simulations of the flip-flop operation in both normal and radiation environments are presented. Spatial separation of critical nodes for the physical design of the flip-flop is carried out for mitigating multi-node charge collection upsets. The proposed flip-flop is also used in commercial CAD flows for high performance chip designs. The proposed flip-flop is used in the design and auto-place-route (APR) of an advanced encryption system and the metrics analyzed.
ContributorsKumar, Sushil (Author) / Clark, Lawrence (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2014
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Modeling and implementation of threshold logic circuits and architectures

Description
Threshold logic has long been studied as a means of achieving higher performance and lower power dissipation, providing improvements by condensing simple logic gates into more complex primitives, effectively reducing gate count, pipeline depth, and number of interconnects. This work proposes a new physical implementation of threshold logic, the threshold…

Threshold logic has long been studied as a means of achieving higher performance and lower power dissipation, providing improvements by condensing simple logic gates into more complex primitives, effectively reducing gate count, pipeline depth, and number of interconnects. This work proposes a new physical implementation of threshold logic, the threshold logic latch (TLL), which overcomes the difficulties observed in previous work, particularly with respect to gate reliability in the presence of noise and process variations. Simple but effective models were created to assess the delay, power, and noise margin of TLL gates for the purpose of determining the physical parameters and assignment of input signals that achieves the lowest delay subject to constraints on power and reliability. From these models, an optimized library of standard TLL cells was developed to supplement a commercial library of static CMOS gates. The new cells were then demonstrated on a number of automatically synthesized, placed, and routed designs. A two-stage 2's complement integer multiplier designed with CMOS and TLL gates utilized 19.5% less area, 28.0% less active power, and 61.5% less leakage power than an equivalent design with the same performance using only static CMOS gates. Additionally, a two-stage 32-instruction 4-way issue queue designed with CMOS and TLL gates utilized 30.6% less area, 31.0% less active power, and 58.9% less leakage power than an equivalent design with the same performance using only static CMOS gates.
ContributorsLeshner, Samuel (Author) / Vrudhula, Sarma (Thesis advisor) / Chatha, Karamvir (Committee member) / Clark, Lawrence (Committee member) / Shrivastava, Aviral (Committee member) / Arizona State University (Publisher)
Created2010