Matching Items (3)
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Description
The use of generalized linear models in loss reserving is not new; many statistical models have been developed to fit the loss data gathered by various insurance companies. The most popular models belong to what Glen Barnett and Ben Zehnwirth in "Best Estimates for Reserves" call the "extended link ratio

The use of generalized linear models in loss reserving is not new; many statistical models have been developed to fit the loss data gathered by various insurance companies. The most popular models belong to what Glen Barnett and Ben Zehnwirth in "Best Estimates for Reserves" call the "extended link ratio family (ELRF)," as they are developed from the chain ladder algorithm used by actuaries to estimate unpaid claims. Although these models are intuitive and easy to implement, they are nevertheless flawed because many of the assumptions behind the models do not hold true when fitted with real-world data. Even more problematically, the ELRF cannot account for environmental changes like inflation which are often observed in the status quo. Barnett and Zehnwirth conclude that a new set of models that contain parameters for not only accident year and development period trends but also payment year trends would be a more accurate predictor of loss development. This research applies the paper's ideas to data gathered by Company XYZ. The data was fitted with an adapted version of Barnett and Zehnwirth's new model in R, and a trend selection algorithm was developed to accompany the regression code. The final forecasts were compared to Company XYZ's booked reserves to evaluate the predictive power of the model.
ContributorsZhang, Zhihan Jennifer (Author) / Milovanovic, Jelena (Thesis director) / Tomita, Melissa (Committee member) / Zicarelli, John (Committee member) / W.P. Carey School of Business (Contributor) / School of Mathematical and Statistical Sciences (Contributor) / Barrett, The Honors College (Contributor)
Created2018-05
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Description
Yield is a key process performance characteristic in the capital-intensive semiconductor fabrication process. In an industry where machines cost millions of dollars and cycle times are a number of months, predicting and optimizing yield are critical to process improvement, customer satisfaction, and financial success. Semiconductor yield modeling is

Yield is a key process performance characteristic in the capital-intensive semiconductor fabrication process. In an industry where machines cost millions of dollars and cycle times are a number of months, predicting and optimizing yield are critical to process improvement, customer satisfaction, and financial success. Semiconductor yield modeling is essential to identifying processing issues, improving quality, and meeting customer demand in the industry. However, the complicated fabrication process, the massive amount of data collected, and the number of models available make yield modeling a complex and challenging task. This work presents modeling strategies to forecast yield using generalized linear models (GLMs) based on defect metrology data. The research is divided into three main parts. First, the data integration and aggregation necessary for model building are described, and GLMs are constructed for yield forecasting. This technique yields results at both the die and the wafer levels, outperforms existing models found in the literature based on prediction errors, and identifies significant factors that can drive process improvement. This method also allows the nested structure of the process to be considered in the model, improving predictive capabilities and violating fewer assumptions. To account for the random sampling typically used in fabrication, the work is extended by using generalized linear mixed models (GLMMs) and a larger dataset to show the differences between batch-specific and population-averaged models in this application and how they compare to GLMs. These results show some additional improvements in forecasting abilities under certain conditions and show the differences between the significant effects identified in the GLM and GLMM models. The effects of link functions and sample size are also examined at the die and wafer levels. The third part of this research describes a methodology for integrating classification and regression trees (CART) with GLMs. This technique uses the terminal nodes identified in the classification tree to add predictors to a GLM. This method enables the model to consider important interaction terms in a simpler way than with the GLM alone, and provides valuable insight into the fabrication process through the combination of the tree structure and the statistical analysis of the GLM.
ContributorsKrueger, Dana Cheree (Author) / Montgomery, Douglas C. (Thesis advisor) / Fowler, John (Committee member) / Pan, Rong (Committee member) / Pfund, Michele (Committee member) / Arizona State University (Publisher)
Created2011
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Description
Bivariate responses that comprise mixtures of binary and continuous variables are common in medical, engineering, and other scientific fields. There exist many works concerning the analysis of such mixed data. However, the research on optimal designs for this type of experiments is still scarce. The joint mixed responses model

Bivariate responses that comprise mixtures of binary and continuous variables are common in medical, engineering, and other scientific fields. There exist many works concerning the analysis of such mixed data. However, the research on optimal designs for this type of experiments is still scarce. The joint mixed responses model that is considered here involves a mixture of ordinary linear models for the continuous response and a generalized linear model for the binary response. Using the complete class approach, tighter upper bounds on the number of support points required for finding locally optimal designs are derived for the mixed responses models studied in this work.

In the first part of this dissertation, a theoretical result was developed to facilitate the search of locally symmetric optimal designs for mixed responses models with one continuous covariate. Then, the study was extended to mixed responses models that include group effects. Two types of mixed responses models with group effects were investigated. The first type includes models having no common parameters across subject group, and the second type of models allows some common parameters (e.g., a common slope) across groups. In addition to complete class results, an efficient algorithm (PSO-FM) was proposed to search for the A- and D-optimal designs. Finally, the first-order mixed responses model is extended to a type of a quadratic mixed responses model with a quadratic polynomial predictor placed in its linear model.
ContributorsKhogeer, Hazar Abdulrahman (Author) / Kao, Ming-Hung (Thesis advisor) / Stufken, John (Committee member) / Reiser, Mark R. (Committee member) / Zheng, Yi (Committee member) / Cheng, Dan (Committee member) / Arizona State University (Publisher)
Created2020