Matching Items (9)
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- All Subjects: Metal oxide semiconductors, Complementary
- All Subjects: FPGA
- Creators: Cao, Yu
Description
CMOS technology is expected to enter the 10nm regime for future integrated circuits (IC). Such aggressive scaling leads to vastly increased variability, posing a grand challenge to robust IC design. Variations in CMOS are often divided into two types: intrinsic variations and process-induced variations. Intrinsic variations are limited by fundamental physics. They are inherent to CMOS structure, considered as one of the ultimate barriers to the continual scaling of CMOS devices. In this work the three primary intrinsic variations sources are studied, including random dopant fluctuation (RDF), line-edge roughness (LER) and oxide thickness fluctuation (OTF). The research is focused on the modeling and simulation of those variations and their scaling trends. Besides the three variations, a time dependent variation source, Random Telegraph Noise (RTN) is also studied. Different from the other three variations, RTN does not contribute much to the total variation amount, but aggregate the worst case of Vth variations in CMOS. In this work a TCAD based simulation study on RTN is presented, and a new SPICE based simulation method for RTN is proposed for time domain circuit analysis. Process-induced variations arise from the imperfection in silicon fabrication, and vary from foundries to foundries. In this work the layout dependent Vth shift due to Rapid-Thermal Annealing (RTA) are investigated. In this work, we develop joint thermal/TCAD simulation and compact modeling tools to analyze performance variability under various layout pattern densities and RTA conditions. Moreover, we propose a suite of compact models that bridge the underlying RTA process with device parameter change for efficient design optimization.
ContributorsYe, Yun, Ph.D (Author) / Cao, Yu (Thesis advisor) / Yu, Hongbin (Committee member) / Song, Hongjiang (Committee member) / Clark, Lawrence (Committee member) / Arizona State University (Publisher)
Created2011
Description
Multidimensional (MD) discrete Fourier transform (DFT) is a key kernel algorithm in many signal processing applications, such as radar imaging and medical imaging. Traditionally, a two-dimensional (2-D) DFT is computed using Row-Column (RC) decomposition, where one-dimensional (1-D) DFTs are computed along the rows followed by 1-D DFTs along the columns. However, architectures based on RC decomposition are not efficient for large input size data which have to be stored in external memories based Synchronous Dynamic RAM (SDRAM). In this dissertation, first an efficient architecture to implement 2-D DFT for large-sized input data is proposed. This architecture achieves very high throughput by exploiting the inherent parallelism due to a novel 2-D decomposition and by utilizing the row-wise burst access pattern of the SDRAM external memory. In addition, an automatic IP generator is provided for mapping this architecture onto a reconfigurable platform of Xilinx Virtex-5 devices. For a 2048x2048 input size, the proposed architecture is 1.96 times faster than RC decomposition based implementation under the same memory constraints, and also outperforms other existing implementations. While the proposed 2-D DFT IP can achieve high performance, its output is bit-reversed. For systems where the output is required to be in natural order, use of this DFT IP would result in timing overhead. To solve this problem, a new bandwidth-efficient MD DFT IP that is transpose-free and produces outputs in natural order is proposed. It is based on a novel decomposition algorithm that takes into account the output order, FPGA resources, and the characteristics of off-chip memory access. An IP generator is designed and integrated into an in-house FPGA development platform, AlgoFLEX, for easy verification and fast integration. The corresponding 2-D and 3-D DFT architectures are ported onto the BEE3 board and their performance measured and analyzed. The results shows that the architecture can maintain the maximum memory bandwidth throughout the whole procedure while avoiding matrix transpose operations used in most other MD DFT implementations. The proposed architecture has also been ported onto the Xilinx ML605 board. When clocked at 100 MHz, 2048x2048 images with complex single-precision can be processed in less than 27 ms. Finally, transpose-free imaging flows for range-Doppler algorithm (RDA) and chirp-scaling algorithm (CSA) in SAR imaging are proposed. The corresponding implementations take advantage of the memory access patterns designed for the MD DFT IP and have superior timing performance. The RDA and CSA flows are mapped onto a unified architecture which is implemented on an FPGA platform. When clocked at 100MHz, the RDA and CSA computations with data size 4096x4096 can be completed in 323ms and 162ms, respectively. This implementation outperforms existing SAR image accelerators based on FPGA and GPU.
ContributorsYu, Chi-Li (Author) / Chakrabarti, Chaitali (Thesis advisor) / Papandreou-Suppappola, Antonia (Committee member) / Karam, Lina (Committee member) / Cao, Yu (Committee member) / Arizona State University (Publisher)
Created2012
Description
To extend the lifetime of complementary metal-oxide-semiconductors (CMOS), emerging process techniques are being proposed to conquer the manufacturing difficulties. New structures and materials are proposed with superior electrical properties to traditional CMOS, such as strain technology and feedback field-effect transistor (FB-FET). To continue the design success and make an impact on leading products, advanced circuit design exploration must begin concurrently with early silicon development. Therefore, an accurate and scalable model is desired to correctly capture those effects and flexible to extend to alternative process choices. For example, strain technology has been successfully integrated into CMOS fabrication to improve transistor performance but the stress is non-uniformly distributed in the channel, leading to systematic performance variations. In this dissertation, a new layout-dependent stress model is proposed as a function of layout, temperature, and other device parameters. Furthermore, a method of layout decomposition is developed to partition the layout into a set of simple patterns for model extraction. These solutions significantly reduce the complexity in stress modeling and simulation. On the other hand, semiconductor devices with self-feedback mechanisms are emerging as promising alternatives to CMOS. Fe-FET was proposed to improve the switching by integrating a ferroelectric material as gate insulator in a MOSFET structure. Under particular circumstances, ferroelectric capacitance is effectively negative, due to the negative slope of its polarization-electrical field curve. This property makes the ferroelectric layer a voltage amplifier to boost surface potential, achieving fast transition. A new threshold voltage model for Fe-FET is developed, and is further revealed that the impact of random dopant fluctuation (RDF) can be suppressed. Furthermore, through silicon via (TSV), a key technology that enables the 3D integration of chips, is studied. TSV structure is usually a cylindrical metal-oxide-semiconductors (MOS) capacitor. A piecewise capacitance model is proposed for 3D interconnect simulation. Due to the mismatch in coefficients of thermal expansion (CTE) among materials, thermal stress is observed in TSV process and impacts neighboring devices. The stress impact is investigated to support the interaction between silicon process and IC design at the early stage.
ContributorsWang, Chi-Chao (Author) / Cao, Yu (Thesis advisor) / Chakrabarti, Chaitali (Committee member) / Clark, Lawrence (Committee member) / Schroder, Dieter (Committee member) / Arizona State University (Publisher)
Created2011
Description
Convolutional neural networks(CNNs) achieve high accuracy on large datasets but requires significant computation and storage requirement for training/testing. While many applications demand low latency and energy-efficient processing of the images, deploying these complex algorithms on the hardware is a challenging task. This dissertation first presents a compiler-based CNN training accelerator using DDR3 and HBM2 memory. An optimized RTL library is implemented to perform training-specific tasks and an RTL compiler is developed to generate FPGA-synthesizable RTL based on user-defined constraints. High Bandwidth Memory(HBM) provides efficient off-chip communication and improves the training performance. The impact of HBM2 on CNN training workloads is analyzed and compressively compared with DDR3. For training ResNet-20/VGG-like CNNs for the CIFAR-10 dataset, the proposed CNN training accelerator on Stratix-10 GX FPGA(DDR3) demonstrates 479 GOPS performance, and on Stratix-10 MX FPGA(HBM) shows 4.5/9.7 X energy-efficiency improvement compared to Tesla V100 GPU. Next, the FPGA online learning accelerator is presented. Adopting model segmentation techniques from Progressive Segmented Training(PST), the online learning accelerator achieved a 4.2X reduction in training latency. Furthermore, this dissertation presents an 8-bit floating-point (FP8) training processor which implements (1) Highly parallel tensor cores that maintain high PE utilization, (2) Hardware-efficient channel gating for dynamic output activation sparsity (3) Dynamic weight sparsity based on group Lasso (4) Gradient skipping based on FP prediction error. The 28nm prototype chip demonstrates significant improvements in FLOPs reduction (7.3×), energy efficiency (16.4 TFLOPS/W), and overall training latency speedup (4.7×) for both supervised training and self-supervised training tasks. In addition to the training accelerators, this dissertation also presents a CNN inference accelerator on ASIC(FixyNN) and FPGA(FixyFPGA). FixyNN consists of a fixed-weight feature extractor that generates ubiquitous CNN features and a conventional programmable CNN accelerator. In the fixed-weight feature extractor, the network weights are hard-coded into hardware and used as a fixed operand for the multiplication. Experimental results demonstrate FixyNN can achieve very high energy efficiencies up to 26.6 TOPS/W, and FixyFPGA achieves $2.34\times$ higher GOPS on ImageNet classification. In summary, this dissertation comprehensively discusses novel architectures of high-performance and energy-efficient ASIC/FPGA CNN inference/training accelerators.
ContributorsKolala Venkataramaniah, Shreyas (Author) / Seo, Jae-Sun (Thesis advisor) / Cao, Yu (Committee member) / Chakrabarti, Chaitali (Committee member) / Fan, Deliang (Committee member) / Arizona State University (Publisher)
Created2022
Description
The rapid improvement in computation capability has made deep convolutional neural networks (CNNs) a great success in recent years on many computer vision tasks with significantly improved accuracy. During the inference phase, many applications demand low latency processing of one image with strict power consumption requirement, which reduces the efficiency of GPU and other general-purpose platform, bringing opportunities for specific acceleration hardware, e.g. FPGA, by customizing the digital circuit specific for the deep learning algorithm inference. However, deploying CNNs on portable and embedded systems is still challenging due to large data volume, intensive computation, varying algorithm structures, and frequent memory accesses. This dissertation proposes a complete design methodology and framework to accelerate the inference process of various CNN algorithms on FPGA hardware with high performance, efficiency and flexibility.
As convolution contributes most operations in CNNs, the convolution acceleration scheme significantly affects the efficiency and performance of a hardware CNN accelerator. Convolution involves multiply and accumulate (MAC) operations with four levels of loops. Without fully studying the convolution loop optimization before the hardware design phase, the resulting accelerator can hardly exploit the data reuse and manage data movement efficiently. This work overcomes these barriers by quantitatively analyzing and optimizing the design objectives (e.g. memory access) of the CNN accelerator based on multiple design variables. An efficient dataflow and hardware architecture of CNN acceleration are proposed to minimize the data communication while maximizing the resource utilization to achieve high performance.
Although great performance and efficiency can be achieved by customizing the FPGA hardware for each CNN model, significant efforts and expertise are required leading to long development time, which makes it difficult to catch up with the rapid development of CNN algorithms. In this work, we present an RTL-level CNN compiler that automatically generates customized FPGA hardware for the inference tasks of various CNNs, in order to enable high-level fast prototyping of CNNs from software to FPGA and still keep the benefits of low-level hardware optimization. First, a general-purpose library of RTL modules is developed to model different operations at each layer. The integration and dataflow of physical modules are predefined in the top-level system template and reconfigured during compilation for a given CNN algorithm. The runtime control of layer-by-layer sequential computation is managed by the proposed execution schedule so that even highly irregular and complex network topology, e.g. GoogLeNet and ResNet, can be compiled. The proposed methodology is demonstrated with various CNN algorithms, e.g. NiN, VGG, GoogLeNet and ResNet, on two different standalone FPGAs achieving state-of-the art performance.
Based on the optimized acceleration strategy, there are still a lot of design options, e.g. the degree and dimension of computation parallelism, the size of on-chip buffers, and the external memory bandwidth, which impact the utilization of computation resources and data communication efficiency, and finally affect the performance and energy consumption of the accelerator. The large design space of the accelerator makes it impractical to explore the optimal design choice during the real implementation phase. Therefore, a performance model is proposed in this work to quantitatively estimate the accelerator performance and resource utilization. By this means, the performance bottleneck and design bound can be identified and the optimal design option can be explored early in the design phase.
As convolution contributes most operations in CNNs, the convolution acceleration scheme significantly affects the efficiency and performance of a hardware CNN accelerator. Convolution involves multiply and accumulate (MAC) operations with four levels of loops. Without fully studying the convolution loop optimization before the hardware design phase, the resulting accelerator can hardly exploit the data reuse and manage data movement efficiently. This work overcomes these barriers by quantitatively analyzing and optimizing the design objectives (e.g. memory access) of the CNN accelerator based on multiple design variables. An efficient dataflow and hardware architecture of CNN acceleration are proposed to minimize the data communication while maximizing the resource utilization to achieve high performance.
Although great performance and efficiency can be achieved by customizing the FPGA hardware for each CNN model, significant efforts and expertise are required leading to long development time, which makes it difficult to catch up with the rapid development of CNN algorithms. In this work, we present an RTL-level CNN compiler that automatically generates customized FPGA hardware for the inference tasks of various CNNs, in order to enable high-level fast prototyping of CNNs from software to FPGA and still keep the benefits of low-level hardware optimization. First, a general-purpose library of RTL modules is developed to model different operations at each layer. The integration and dataflow of physical modules are predefined in the top-level system template and reconfigured during compilation for a given CNN algorithm. The runtime control of layer-by-layer sequential computation is managed by the proposed execution schedule so that even highly irregular and complex network topology, e.g. GoogLeNet and ResNet, can be compiled. The proposed methodology is demonstrated with various CNN algorithms, e.g. NiN, VGG, GoogLeNet and ResNet, on two different standalone FPGAs achieving state-of-the art performance.
Based on the optimized acceleration strategy, there are still a lot of design options, e.g. the degree and dimension of computation parallelism, the size of on-chip buffers, and the external memory bandwidth, which impact the utilization of computation resources and data communication efficiency, and finally affect the performance and energy consumption of the accelerator. The large design space of the accelerator makes it impractical to explore the optimal design choice during the real implementation phase. Therefore, a performance model is proposed in this work to quantitatively estimate the accelerator performance and resource utilization. By this means, the performance bottleneck and design bound can be identified and the optimal design option can be explored early in the design phase.
ContributorsMa, Yufei (Author) / Vrudhula, Sarma (Thesis advisor) / Seo, Jae-Sun (Thesis advisor) / Cao, Yu (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2018
Description
Over decades, scientists have been scaling devices to increasingly smaller feature sizes for ever better performance of complementary metal-oxide semiconductor (CMOS) technology to meet requirements on speed, complexity, circuit density, power consumption and ultimately cost required by many advanced applications. However, going to these ultra-scaled CMOS devices also brings some drawbacks. Aging due to bias-temperature-instability (BTI) and Hot carrier injection (HCI) is the dominant cause of functional failure in large scale logic circuits. The aging phenomena, on top of process variations, translate into complexity and reduced design margin for circuits. Such issues call for “Design for Reliability”. In order to increase the overall design efficiency, it is important to (i) study the impact of aging on circuit level along with the transistor level understanding (ii) calibrate the theoretical findings with measurement data (iii) implementing tools that analyze the impact of BTI and HCI reliability on circuit timing into VLSI design process at each stage. In this work, post silicon measurements of a 28nm HK-MG technology are done to study the effect of aging on Frequency Degradation of digital circuits. A novel voltage controlled ring oscillator (VCO) structure, developed by NIMO research group is used to determine the effect of aging mechanisms like NBTI, PBTI and SILC on circuit parameters. Accelerated aging mechanism is proposed to avoid the time consuming measurement process and extrapolation of data to the end of life thus instead of predicting the circuit behavior, one can measure it, within a short period of time. Finally, to bridge the gap between device level models and circuit level aging analysis, a System Level Reliability Analysis Flow (SyRA) developed by NIMO group, is implemented for a TSMC 65nm industrial level design to achieve one-step reliability prediction for digital design.
ContributorsBansal, Ankita (Author) / Cao, Yu (Thesis advisor) / Seo, Jae sun (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2016
Description
Rail clamp circuits are widely used for electrostatic discharge (ESD) protection in semiconductor products today. A step-by-step design procedure for the traditional RC and single-inverter-based rail clamp circuit and the design, simulation, implementation, and operation of two novel rail clamp circuits are described for use in the ESD protection of complementary metal-oxide-semiconductor (CMOS) circuits. The step-by-step design procedure for the traditional circuit is technology-node independent, can be fully automated, and aims to achieve a minimal area design that meets specified leakage and ESD specifications under all valid process, voltage, and temperature (PVT) conditions. The first novel rail clamp circuit presented employs a comparator inside the traditional circuit to reduce the value of the time constant needed. The second circuit uses a dynamic time constant approach in which the value of the time constant is dynamically adjusted after the clamp is triggered. Important metrics for the two new circuits such as ESD performance, latch-on immunity, clamp recovery time, supply noise immunity, fastest power-on time supported, and area are evaluated over an industry-standard PVT space using SPICE simulations and measurements on a fabricated 40 nm test chip.
ContributorsVenkatasubramanian, Ramachandran (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Cao, Yu (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2016
Description
The aging process due to Bias Temperature Instability (both NBTI and PBTI) and Channel Hot Carrier (CHC) is a key limiting factor of circuit lifetime in CMOS design. Threshold voltage shift due to BTI is a strong function of stress voltage and temperature complicating stress and recovery prediction. This poses a unique challenge for long-term aging prediction for wide range of stress patterns. Traditional approaches usually resort to an average stress waveform to simplify the lifetime prediction. They are efficient, but fail to capture circuit operation, especially under dynamic voltage scaling (DVS) or in analog/mixed signal designs where the stress waveform is much more random. This work presents a suite of modelling solutions for BTI that enable aging simulation under all possible stress conditions. Key features of this work are compact models to predict BTI aging based on Reaction-Diffusion theory when the stress voltage is varying. The results to both reaction-diffusion (RD) and trapping-detrapping (TD) mechanisms are presented to cover underlying physics. Silicon validation of these models is performed at 28nm, 45nm and 65nm technology nodes, at both device and circuit levels. Efficient simulation leveraging the BTI models under DVS and random input waveform is applied to both digital and analog representative circuits such as ring oscillators and LNA. Both physical mechanisms are combined into a unified model which improves prediction accuracy at 45nm and 65nm nodes. Critical failure condition is also illustrated based on NBTI and PBTI at 28nm. A comprehensive picture for duty cycle shift is shown. DC stress under clock gating schemes results in monotonic shift in duty cycle which an AC stress causes duty cycle to converge close to 50% value. Proposed work provides a general and comprehensive solution to aging analysis under random stress patterns under BTI.
Channel hot carrier (CHC) is another dominant degradation mechanism which affects analog and mixed signal circuits (AMS) as transistor operates continuously in saturation condition. New model is proposed to account for e-e scattering in advanced technology nodes due to high gate electric field. The model is validated with 28nm and 65nm thick oxide data for different stress voltages. It demonstrates shift in worst case CHC condition to Vgs=Vds from Vgs=0.5Vds. A novel iteration based aging simulation framework for AMS designs is proposed which eliminates limitation for conventional reliability tools. This approach helps us identify a unique positive feedback mechanism termed as Bias Runaway. Bias runaway, is rapid increase of the bias voltage in AMS circuits which occurs when the feedback between the bias current and the effect of channel hot carrier turns into positive. The degradation of CHC is a gradual process but under specific circumstances, the degradation rate can be dramatically accelerated. Such a catastrophic phenomenon is highly sensitive to the initial operation condition, as well as transistor gate length. Based on 65nm silicon data, our work investigates the critical condition that triggers bias runaway, and the impact of gate length tuning. We develop new compact models as well as the simulation methodology for circuit diagnosis, and propose design solutions and the trade-offs to avoid bias runaway, which is vitally important to reliable AMS designs.
Channel hot carrier (CHC) is another dominant degradation mechanism which affects analog and mixed signal circuits (AMS) as transistor operates continuously in saturation condition. New model is proposed to account for e-e scattering in advanced technology nodes due to high gate electric field. The model is validated with 28nm and 65nm thick oxide data for different stress voltages. It demonstrates shift in worst case CHC condition to Vgs=Vds from Vgs=0.5Vds. A novel iteration based aging simulation framework for AMS designs is proposed which eliminates limitation for conventional reliability tools. This approach helps us identify a unique positive feedback mechanism termed as Bias Runaway. Bias runaway, is rapid increase of the bias voltage in AMS circuits which occurs when the feedback between the bias current and the effect of channel hot carrier turns into positive. The degradation of CHC is a gradual process but under specific circumstances, the degradation rate can be dramatically accelerated. Such a catastrophic phenomenon is highly sensitive to the initial operation condition, as well as transistor gate length. Based on 65nm silicon data, our work investigates the critical condition that triggers bias runaway, and the impact of gate length tuning. We develop new compact models as well as the simulation methodology for circuit diagnosis, and propose design solutions and the trade-offs to avoid bias runaway, which is vitally important to reliable AMS designs.
ContributorsSutaria, Ketul (Author) / Cao, Yu (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Chakrabarti, Chaitali (Committee member) / Yu, Shimeng (Committee member) / Arizona State University (Publisher)
Created2014
Description
Speech recognition and keyword detection are becoming increasingly popular applications for mobile systems. While deep neural network (DNN) implementation of these systems have very good performance,
they have large memory and compute resource requirements, making their implementation on a mobile device quite challenging. In this thesis, techniques to reduce the memory and computation cost
of keyword detection and speech recognition networks (or DNNs) are presented.
The first technique is based on representing all weights and biases by a small number of bits and mapping all nodal computations into fixed-point ones with minimal degradation in the
accuracy. Experiments conducted on the Resource Management (RM) database show that for the keyword detection neural network, representing the weights by 5 bits results in a 6 fold reduction in memory compared to a floating point implementation with very little loss in performance. Similarly, for the speech recognition neural network, representing the weights by 6 bits results in a 5 fold reduction in memory while maintaining an error rate similar to a floating point implementation. Additional reduction in memory is achieved by a technique called weight pruning,
where the weights are classified as sensitive and insensitive and the sensitive weights are represented with higher precision. A combination of these two techniques helps reduce the memory
footprint by 81 - 84% for speech recognition and keyword detection networks respectively.
Further reduction in memory size is achieved by judiciously dropping connections for large blocks of weights. The corresponding technique, termed coarse-grain sparsification, introduces
hardware-aware sparsity during DNN training, which leads to efficient weight memory compression and significant reduction in the number of computations during classification without
loss of accuracy. Keyword detection and speech recognition DNNs trained with 75% of the weights dropped and classified with 5-6 bit weight precision effectively reduced the weight memory
requirement by ~95% compared to a fully-connected network with double precision, while showing similar performance in keyword detection accuracy and word error rate.
they have large memory and compute resource requirements, making their implementation on a mobile device quite challenging. In this thesis, techniques to reduce the memory and computation cost
of keyword detection and speech recognition networks (or DNNs) are presented.
The first technique is based on representing all weights and biases by a small number of bits and mapping all nodal computations into fixed-point ones with minimal degradation in the
accuracy. Experiments conducted on the Resource Management (RM) database show that for the keyword detection neural network, representing the weights by 5 bits results in a 6 fold reduction in memory compared to a floating point implementation with very little loss in performance. Similarly, for the speech recognition neural network, representing the weights by 6 bits results in a 5 fold reduction in memory while maintaining an error rate similar to a floating point implementation. Additional reduction in memory is achieved by a technique called weight pruning,
where the weights are classified as sensitive and insensitive and the sensitive weights are represented with higher precision. A combination of these two techniques helps reduce the memory
footprint by 81 - 84% for speech recognition and keyword detection networks respectively.
Further reduction in memory size is achieved by judiciously dropping connections for large blocks of weights. The corresponding technique, termed coarse-grain sparsification, introduces
hardware-aware sparsity during DNN training, which leads to efficient weight memory compression and significant reduction in the number of computations during classification without
loss of accuracy. Keyword detection and speech recognition DNNs trained with 75% of the weights dropped and classified with 5-6 bit weight precision effectively reduced the weight memory
requirement by ~95% compared to a fully-connected network with double precision, while showing similar performance in keyword detection accuracy and word error rate.
ContributorsArunachalam, Sairam (Author) / Chakrabarti, Chaitali (Thesis advisor) / Seo, Jae-Sun (Thesis advisor) / Cao, Yu (Committee member) / Arizona State University (Publisher)
Created2016