Full metadata
Title
Insights into Crack Dynamics Governing Surface Quality during Spalling of Semiconductors
Description
The rationale of this thesis is to provide a thorough understanding of spalling for semiconductor materials and develop a low temperature spalling technology that reduces the surface roughness of the spalled wafers for Photovoltaics applications.
Date Created
2020
Contributors
- Guimera Coll, Pablo (Author)
- Bertoni, Mariana I (Thesis advisor)
- Meier, Rico (Committee member)
- Holman, Zachary (Committee member)
- Wang, Qing Hua (Committee member)
- Arizona State University (Publisher)
Topical Subject
Resource Type
Extent
168 pages
Language
Copyright Statement
In Copyright
Primary Member of
Peer-reviewed
No
Open Access
No
Handle
https://hdl.handle.net/2286/R.I.62897
Level of coding
minimal
Note
Doctoral Dissertation Materials Science and Engineering 2020
System Created
- 2021-01-14 09:12:14
System Modified
- 2022-06-03 11:56:51
- 1 year 11 months ago
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