Description

Semiconductor devices often face reliability issues due to their operational con-

ditions causing performance degradation over time. One of the root causes of such

degradation is due to point defect dynamics and

Semiconductor devices often face reliability issues due to their operational con-

ditions causing performance degradation over time. One of the root causes of such

degradation is due to point defect dynamics and time dependent changes in their

chemical nature. Previously developed Unified Solver was successful in explaining

the copper (Cu) metastability issues in cadmium telluride (CdTe) solar cells. The

point defect formalism employed there could not be extended to chlorine or arsenic

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Date Created
  • 2019
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  • Text
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    • Doctoral Dissertation Electrical Engineering 2019

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