Stress-related failure such as cracking are an important photovoltaic (PV) reliability issue since it accounts for a high percentage of power losses in the midlife-failure and wear-out failure regimes. Cell cracking can only be correlated with module degradation when cracks are of detectable size and detrimental to the performance. Several techniques have been explored to access the deflection and stress status on solar cell, but they have disadvantages such as high surface sensitivity.
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- Partial requirement for: Ph.D., Arizona State University, 2019Note typethesis
- Includes bibliographical references (pages 157-165)Note typebibliography
- Field of study: Materials science and engineering