Description

As integrated technologies are scaling down, there is an increasing trend in the

process,voltage and temperature (PVT) variations of highly integrated RF systems.

Accounting for these variations during the design phase requires

As integrated technologies are scaling down, there is an increasing trend in the

process,voltage and temperature (PVT) variations of highly integrated RF systems.

Accounting for these variations during the design phase requires tremendous amount

of time for prediction of RF performance and optimizing it accordingly. Thus, there

is an increasing gap between the need to relax the RF performance requirements at

the design phase for rapid development and the need to provide high performance

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Date Created
  • 2018
Resource Type
  • Text
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    • Doctoral Dissertation Electrical Engineering 2018

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