Accessibility to the internal nodes of an analog/mixed-signal circuit while testing is extremely difficult. Furthermore, with technology scaling, the effect of process variations becomes more pronounced which in turn effects the test time, test cost, and die yield. As devices become more unreliable, the probability of failure of a die increases, yield decreases affecting the quality of test and cost.Therefore, test time minimization and test cost reduction are important. Moreover, process variations can affect the performance of analog/mixed circuits.
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- Masters Thesis Electrical Engineering 2017