In this dissertation research, conventional and aberration-corrected (AC) transmission electron microscopy (TEM) techniques were used to evaluate the structural and compositional properties of thin-film semiconductor compounds/alloys grown by molecular beam epitaxy for infrared photo-detection. Imaging, diffraction and spectroscopy techniques were applied to TEM specimens in cross-section geometry to extract information about extended structural defects, chemical homogeneity and interface abruptness.
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- Partial requirement for: Ph.D., Arizona State University, 2017Note typethesis
- Includes bibliographical referencesNote typebibliography
- Field of study: Materials science and engineering