Soft errors are considered as a key reliability challenge for sub-nano scale transistors. An ideal solution for such a challenge should ultimately eliminate the effect of soft errors from the microprocessor. While forward recovery techniques achieve fast recovery from errors by simply voting out the wrong values, they incur the overhead of three copies execution. Backward recovery techniques only need two copies of execution, but suffer from check-pointing overhead.
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- Partial requirement for: M.S., Arizona State University, 2016Note typethesis
- Includes bibliographical references (pages 27-19)Note typebibliography
- Field of study: Computer science