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Soft errors are considered as a key reliability challenge for sub-nano scale transistors. An ideal solution for such a challenge should ultimately eliminate the effect of soft errors from the

Soft errors are considered as a key reliability challenge for sub-nano scale transistors. An ideal solution for such a challenge should ultimately eliminate the effect of soft errors from the microprocessor. While forward recovery techniques achieve fast recovery from errors by simply voting out the wrong values, they incur the overhead of three copies execution. Backward recovery techniques only need two copies of execution, but suffer from check-pointing overhead.

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    Date Created
    • 2016
    Resource Type
  • Text
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    Note
    • Partial requirement for: M.S., Arizona State University, 2016
      Note type
      thesis
    • Includes bibliographical references (pages 27-19)
      Note type
      bibliography
    • Field of study: Computer science

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    by Sai Ram Dheeraj Lokam

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