Mechanical behavior of metallic thin films at room temperature (RT) is relatively well characterized. However, measuring the high temperature mechanical properties of thin films poses several challenges. These include ensuring uniformity in sample temperature and minimizing temporal fluctuations due to ambient heat loss, in addition to difficulties involved in mechanical testing of microscale samples. To address these issues, we designed and analyzed a MEMS-based high temperature tensile testing stage made from single crystal silicon.
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- Partial requirement for: M.S., Arizona State University, 2016Note typethesis
- Includes bibliographical references (pages 45-47)Note typebibliography
- Field of study: Materials Science and Engineering