Off-axis electron holography (EH) has been used to characterize electrostatic potential, active dopant concentrations and charge distribution in semiconductor nanostructures, including ZnO nanowires (NWs) and thin films, ZnTe thin films, Si NWs with axial p-n junctions, Si-Ge axial heterojunction NWs, and Ge/LixGe core/shell NW.
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- Partial requirement for: Ph.D., Arizona State University, 2015Note typethesis
- Includes bibliographical referencesNote typebibliography
- Field of study: Physics