Description

Carrier lifetime is one of the few parameters which can give information about the low defect densities in today's semiconductors. In principle there is no lower limit to the defect

Carrier lifetime is one of the few parameters which can give information about the low defect densities in today's semiconductors. In principle there is no lower limit to the defect density determined by lifetime measurements. No other technique can easily detect defect densities as low as 10-9 - 10-10 cm-3 in a simple, contactless room temperature measurement.

Reuse Permissions
  • 2.91 MB application/pdf

    Download count: 0

    Details

    Contributors
    Date Created
    • 2013
    Resource Type
  • Text
  • Collections this item is in
    Note
    • Partial requirement for: M.S., Arizona State University, 2013
      Note type
      thesis
    • Includes bibliographical references (p. 89-91)
      Note type
      bibliography
    • Field of study: Materials science and engineering

    Citation and reuse

    Statement of Responsibility

    by Arash Elhami Khorasani

    Machine-readable links