The dissolution of metal layers such as silver into chalcogenide glass layers such as germanium selenide changes the resistivity of the metal and chalcogenide films by a great extent. It is known that the incorporation of the metal can be achieved by ultra violet light exposure or thermal processes. In this work, the use of metal dissolution by exposure to gamma radiation has been explored for radiation sensor applications. Test structures were designed and a process flow was developed for prototype sensor fabrication.
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- Partial requirement for: M.S., Arizona State University, 2012Note typethesis
- Includes bibliographical references (p. 62-63)Note typebibliography
- Field of study: Electrical engineering