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Radiation hardening of electronic devices is generally necessary when designing for the space environment. Non-volatile memory technologies are of particular concern when designing for the mitigation of radiation effects. Among

Radiation hardening of electronic devices is generally necessary when designing for the space environment. Non-volatile memory technologies are of particular concern when designing for the mitigation of radiation effects. Among other radiation effects, single-event upsets can create bit flips in non-volatile memories, leading to data corruption. In this paper, a Verilog implementation of a Reed-Solomon error-correcting code is considered for its ability to mitigate the effects of single-event upsets on non-volatile memories.

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Date Created
  • 2021-05
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  • Text
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