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Measuring the Index of Refraction of a Medium through the use of a Michelson Interferometer

Description
In this experiment, an attempt was made to measure the index of refraction of a thin glass microscope slide, with a known thickness of 1.01 mm. A monochromatic laser with wavelength of 532nm was employed to generate the interference pattern through the use of a Michelson interferometer. The slide was…

In this experiment, an attempt was made to measure the index of refraction of a thin glass microscope slide, with a known thickness of 1.01 mm. A monochromatic laser with wavelength of 532nm was employed to generate the interference pattern through the use of a Michelson interferometer. The slide was placed in the path of one of the beams. The slide could then be rotated through a series of angles, and, from the resulting changes in the interference pattern, the index of refraction of the slide could be extracted. The index of refraction was found to be 1.5±0.02.
ContributorsSwenson, Jordan (Author) / Sukharev, Maxim (Thesis director) / Bennett, Peter (Committee member) / Barrett, The Honors College (Contributor) / Department of Physics (Contributor)
Created2014-05