Matching Items (2)

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Finite size effect on the structural and magnetic properties of MnAs/GaAs(001) patterned microstructures thin films

Description

MnAs epitaxial thin films on GaAs(001) single crystalline substrates crystallize at room temperature (RT) in a mixture of two crystalline phases with distinct magnetic properties, organized as stripes along the

MnAs epitaxial thin films on GaAs(001) single crystalline substrates crystallize at room temperature (RT) in a mixture of two crystalline phases with distinct magnetic properties, organized as stripes along the MnAs [0001] direction. This particular morphology is driven by anisotropic epitaxial strain. We elucidate here the physical mechanisms at the origin of size reduction effect on the MnAs crystalline phase transition. We investigated the structural and magnetic changes in MnAs patterned microstructures (confined geometry) when the lateral dimension is reduced to values close to the periodicity and width of the stripes observed in continuous films. The effects of the microstructure’s lateral size, shape and orientation (with respect to the MnAs [1120] direction) were characterized by local probe synchrotron X-ray diffraction (μ-XRD) using a focused X-ray beam, X-ray Magnetic Circular Dichroïsm - Photo Emission Electron Microscopy (XMCD-PEEM) and Low Energy Electron Microscopy (LEEM). Changes in the transition temperature and the crystalline phase distribution inside the microstructures are evidenced and quantitatively measured. The effect of finite size and strain relaxation on the magnetic domain structure is also discussed. Counter-intuitively, we demonstrate here that below a critical microstructure size, bulk MnAs structural and magnetic properties are restored. To support our observations we developed, tested and validated a model based on the size-dependence of the elastic energy and strain relaxation to explain this phase re-distribution in laterally confined geometry.

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Created

Date Created
  • 2017-12-05

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Growth, reaction and nanowire formation of Fe on the ZnS(100) surface

Description

X-ray photoelectron emission microscopy (XPEEM) was used in combination with other microscopic and spectroscopic techniques to follow the surface development of an aluminum brazing sheet during heating. The studied aluminum

X-ray photoelectron emission microscopy (XPEEM) was used in combination with other microscopic and spectroscopic techniques to follow the surface development of an aluminum brazing sheet during heating. The studied aluminum alloy sheet is a composite material designed for vacuum brazing. Its surface is covered with a native aluminum oxide film. Changes in the chemical state of the alloying elements and the composition of the surface layer were detected during heating to the melting temperature. It was found that Mg segregates to the surface upon heating, and the measurements indicate the formation of magnesium aluminate. During the heating the aluminum oxide as well as the silicon is observed to disappear from the surface. Our measurements is in agreement with previous studies observing a break-up of the oxide and the outflow of the braze cladding onto the surface, a process assisted by the Mg segregation and reaction with surface oxygen. This study also demonstrates how XPEEM can be utilized to study complex industrial materials.

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Created

Date Created
  • 2014-08-06