Matching Items (3)
Filtering by
- All Subjects: Chalcogenides
- Creators: Holbert, Keith E.
- Member of: ASU Electronic Theses and Dissertations
- Resource Type: Text
Description
The dissolution of metal layers such as silver into chalcogenide glass layers such as germanium selenide changes the resistivity of the metal and chalcogenide films by a great extent. It is known that the incorporation of the metal can be achieved by ultra violet light exposure or thermal processes. In this work, the use of metal dissolution by exposure to gamma radiation has been explored for radiation sensor applications. Test structures were designed and a process flow was developed for prototype sensor fabrication. The test structures were designed such that sensitivity to radiation could be studied. The focus is on the effect of gamma rays as well as ultra violet light on silver dissolution in germanium selenide (Ge30Se70) chalcogenide glass. Ultra violet radiation testing was used prior to gamma exposure to assess the basic mechanism. The test structures were electrically characterized prior to and post irradiation to assess resistance change due to metal dissolution. A change in resistance was observed post irradiation and was found to be dependent on the radiation dose. The structures were also characterized using atomic force microscopy and roughness measurements were made prior to and post irradiation. A change in roughness of the silver films on Ge30Se70 was observed following exposure. This indicated the loss of continuity of the film which causes the increase in silver film resistance following irradiation. Recovery of initial resistance in the structures was also observed after the radiation stress was removed. This recovery was explained with photo-stimulated deposition of silver from the chalcogenide at room temperature confirmed with the re-appearance of silver dendrites on the chalcogenide surface. The results demonstrate that it is possible to use the metal dissolution effect in radiation sensing applications.
ContributorsChandran, Ankitha (Author) / Kozicki, Michael N (Thesis advisor) / Holbert, Keith E. (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2012
Description
Chalcogenide glass (ChG) materials have gained wide attention because of their applications in conductive bridge random access memory (CBRAM), phase change memories (PC-RAM), optical rewritable disks (CD-RW and DVD-RW), microelectromechanical systems (MEMS), microfluidics, and optical communications. One of the significant properties of ChG materials is the change in the resistivity of the material when a metal such as Ag or Cu is added to it by diffusion. This study demonstrates the potential radiation-sensing capabilities of two metal/chalcogenide glass device configurations. Lateral and vertical device configurations sense the radiation-induced migration of Ag+ ions in germanium selenide glasses via changes in electrical resistance between electrodes on the ChG. Before irradiation, these devices exhibit a high-resistance `OFF-state' (in the order of 10E12) but following irradiation, with either 60-Co gamma-rays or UV light, their resistance drops to a low-resistance `ON-state' (around 10E3). Lateral devices have exhibited cyclical recovery with room temperature annealing of the Ag doped ChG, which suggests potential uses in reusable radiation sensor applications. The feasibility of producing inexpensive flexible radiation sensors has been demonstrated by studying the effects of mechanical strain and temperature stress on sensors formed on flexible polymer substrate. The mechanisms of radiation-induced Ag/Ag+ transport and reactions in ChG have been modeled using a finite element device simulator, ATLAS. The essential reactions captured by the simulator are radiation-induced carrier generation, combined with reduction/oxidation for Ag species in the chalcogenide film. Metal-doped ChGs are solid electrolytes that have both ionic and electronic conductivity. The ChG based Programmable Metallization Cell (PMC) is a technology platform that offers electric field dependent resistance switching mechanisms by formation and dissolution of nano sized conductive filaments in a ChG solid electrolyte between oxidizable and inert electrodes. This study identifies silver anode agglomeration in PMC devices following large radiation dose exposure and considers device failure mechanisms via electrical and material characterization. The results demonstrate that by changing device structural parameters, silver agglomeration in PMC devices can be suppressed and reliable resistance switching may be maintained for extremely high doses ranging from 4 Mrad(GeSe) to more than 10 Mrad (ChG).
ContributorsDandamudi, Pradeep (Author) / Kozicki, Michael N (Thesis advisor) / Barnaby, Hugh J (Committee member) / Holbert, Keith E. (Committee member) / Goryll, Michael (Committee member) / Arizona State University (Publisher)
Created2013
Description
As photons, electrons, and neutrons traverse a medium, they impart their energy in ways that are analytically difficult to describe. Monte Carlo methods provide valuable insight into understanding this behavior, especially when the radiation source or environment is too complex to simplify. This research investigates simulating various radiation sources using the Monte Carlo N-Particle (MCNP) transport code, characterizing their impact on various materials, and comparing the simulation results to general theory and measurements.
A total of five sources were of interest: two photon sources of different incident particle energies (3.83 eV and 1.25 MeV), two electron sources also of different energies (30 keV and 100 keV), and a californium-252 (Cf-252) spontaneous fission neutron source. Lateral and vertical programmable metallization cells (PMCs) were developed by other researchers for exposure to these photon and electron sources, so simplified PMC models were implemented in MCNP to estimate the doses and fluences. Dose rates measured around the neutron source and the predicted maximum activity of activation foils exposed to the neutrons were determined using MCNP and compared to experimental results obtained from gamma-ray spectroscopy.
The analytical fluence calculations for the photon and electron cases agreed with MCNP results, and differences are due to MCNP considering particle movements that hand calculations do not. Doses for the photon cases agreed between the analytical and simulated results, while the electron cases differed by a factor of up to 4.8. Physical dose rate measurements taken from the neutron source agreed with MCNP within the 10% tolerance of the measurement device. The activity results had a percent error of up to 50%, which suggests a need to further evaluate the spectroscopy setup.
A total of five sources were of interest: two photon sources of different incident particle energies (3.83 eV and 1.25 MeV), two electron sources also of different energies (30 keV and 100 keV), and a californium-252 (Cf-252) spontaneous fission neutron source. Lateral and vertical programmable metallization cells (PMCs) were developed by other researchers for exposure to these photon and electron sources, so simplified PMC models were implemented in MCNP to estimate the doses and fluences. Dose rates measured around the neutron source and the predicted maximum activity of activation foils exposed to the neutrons were determined using MCNP and compared to experimental results obtained from gamma-ray spectroscopy.
The analytical fluence calculations for the photon and electron cases agreed with MCNP results, and differences are due to MCNP considering particle movements that hand calculations do not. Doses for the photon cases agreed between the analytical and simulated results, while the electron cases differed by a factor of up to 4.8. Physical dose rate measurements taken from the neutron source agreed with MCNP within the 10% tolerance of the measurement device. The activity results had a percent error of up to 50%, which suggests a need to further evaluate the spectroscopy setup.
ContributorsBowler, Herbert (Author) / Holbert, Keith E. (Thesis advisor) / Barnaby, Hugh J (Committee member) / Clark, Lawrence T (Committee member) / Arizona State University (Publisher)
Created2014