Matching Items (4)
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- All Subjects: Built-In Self-Test
- Creators: Ozev, Sule
- Creators: Chakraborty, Bijeta
- Creators: Peterson, Cory
- Member of: ASU Electronic Theses and Dissertations
Description
Efficiency of components is an ever increasing area of importance to portable applications, where a finite battery means finite operating time. Higher efficiency devices need to be designed that don't compromise on the performance that the consumer has come to expect. Class D amplifiers deliver on the goal of increased efficiency, but at the cost of distortion. Class AB amplifiers have low efficiency, but high linearity. By modulating the supply voltage of a Class AB amplifier to make a Class H amplifier, the efficiency can increase while still maintaining the Class AB level of linearity. A 92dB Power Supply Rejection Ratio (PSRR) Class AB amplifier and a Class H amplifier were designed in a 0.24um process for portable audio applications. Using a multiphase buck converter increased the efficiency of the Class H amplifier while still maintaining a fast response time to respond to audio frequencies. The Class H amplifier had an efficiency above the Class AB amplifier by 5-7% from 5-30mW of output power without affecting the total harmonic distortion (THD) at the design specifications. The Class H amplifier design met all design specifications and showed performance comparable to the designed Class AB amplifier across 1kHz-20kHz and 0.01mW-30mW. The Class H design was able to output 30mW into 16Ohms without any increase in THD. This design shows that Class H amplifiers merit more research into their potential for increasing efficiency of audio amplifiers and that even simple designs can give significant increases in efficiency without compromising linearity.
ContributorsPeterson, Cory (Author) / Bakkaloglu, Bertan (Thesis advisor) / Barnaby, Hugh (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2013
Description
Class D Amplifiers are widely used in portable systems such as mobile phones to achieve high efficiency. The demands of portable electronics for low power consumption to extend battery life and reduce heat dissipation mandate efficient, high-performance audio amplifiers. The high efficiency of Class D amplifiers (CDAs) makes them particularly attractive for portable applications. The Digital class D amplifier is an interesting solution to increase the efficiency of embedded systems. However, this solution is not good enough in terms of PWM stage linearity and power supply rejection. An efficient control is needed to correct the error sources in order to get a high fidelity sound quality in the whole audio range of frequencies. A fundamental analysis on various error sources due to non idealities in the power stage have been discussed here with key focus on Power supply perturbations driving the Power stage of a Class D Audio Amplifier. Two types of closed loop Digital Class D architecture for PSRR improvement have been proposed and modeled. Double sided uniform sampling modulation has been used. One of the architecture uses feedback around the power stage and the second architecture uses feedback into digital domain. Simulation & experimental results confirm that the closed loop PSRR & PS-IMD improve by around 30-40 dB and 25 dB respectively.
ContributorsChakraborty, Bijeta (Author) / Bakkaloglu, Bertan (Thesis advisor) / Garrity, Douglas (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2012
Description
Due to high level of integration in RF System on Chip (SOC), the test access points are limited to the baseband and RF inputs/outputs of the system. This limited access poses a big challenge particularly for advanced RF architectures where calibration of internal parameters is necessary and ensure proper operation. Therefore low-overhead built-in Self-Test (BIST) solution for advanced RF transceiver is proposed. In this dissertation. Firstly, comprehensive BIST solution for RF polar transceivers using on-chip resources is presented. In the receiver, phase and gain mismatches degrade sensitivity and error vector magnitude (EVM). In the transmitter, delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to violation of spectral mask requirements. Characterization and calibration of these parameters with analytical model would reduce the test time and cost considerably. Hence, a technique to measure and calibrate impairments of the polar transceiver in the loop-back mode is proposed.
Secondly, robust amplitude measurement technique for RF BIST application and BIST circuits for loop-back connection are discussed. Test techniques using analytical model are explained and BIST circuits are introduced.
Next, a self-compensating built-in self-test solution for RF Phased Array Mismatch is proposed. In the proposed method, a sinusoidal test signal with unknown amplitude is applied to the inputs of two adjacent phased array elements and measure the baseband output signal after down-conversion. Mathematical modeling of the circuit impairments and phased array behavior indicates that by using two distinct input amplitudes, both of which can remain unknown, it is possible to measure the important parameters of the phased array, such as gain and phase mismatch. In addition, proposed BIST system is designed and fabricated using IBM 180nm process and a prototype four-element phased-array PCB is also designed and fabricated for verifying the proposed method.
Finally, process independent gain measurement via BIST/DUT co-design is explained. Design methodology how to reduce performance impact significantly is discussed.
Simulation and hardware measurements results for the proposed techniques show that the proposed technique can characterize the targeted impairments accurately.
Secondly, robust amplitude measurement technique for RF BIST application and BIST circuits for loop-back connection are discussed. Test techniques using analytical model are explained and BIST circuits are introduced.
Next, a self-compensating built-in self-test solution for RF Phased Array Mismatch is proposed. In the proposed method, a sinusoidal test signal with unknown amplitude is applied to the inputs of two adjacent phased array elements and measure the baseband output signal after down-conversion. Mathematical modeling of the circuit impairments and phased array behavior indicates that by using two distinct input amplitudes, both of which can remain unknown, it is possible to measure the important parameters of the phased array, such as gain and phase mismatch. In addition, proposed BIST system is designed and fabricated using IBM 180nm process and a prototype four-element phased-array PCB is also designed and fabricated for verifying the proposed method.
Finally, process independent gain measurement via BIST/DUT co-design is explained. Design methodology how to reduce performance impact significantly is discussed.
Simulation and hardware measurements results for the proposed techniques show that the proposed technique can characterize the targeted impairments accurately.
ContributorsJeong, Jae Woong (Author) / Ozev, Sule (Thesis advisor) / Kitchen, Jennifer (Committee member) / Cao, Yu (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
Description
As integrated technologies are scaling down, there is an increasing trend in the
process,voltage and temperature (PVT) variations of highly integrated RF systems.
Accounting for these variations during the design phase requires tremendous amount
of time for prediction of RF performance and optimizing it accordingly. Thus, there
is an increasing gap between the need to relax the RF performance requirements at
the design phase for rapid development and the need to provide high performance
and low cost RF circuits that function with PVT variations. No matter how care-
fully designed, RF integrated circuits (ICs) manufactured with advanced technology
nodes necessitate lengthy post-production calibration and test cycles with expensive
RF test instruments. Hence design-for-test (DFT) is proposed for low-cost and fast
measurement of performance parameters during both post-production and in-eld op-
eration. For example, built-in self-test (BIST) is a DFT solution for low-cost on-chip
measurement of RF performance parameters. In this dissertation, three aspects of
automated test and calibration, including DFT mathematical model, BIST hardware
and built-in calibration are covered for RF front-end blocks.
First, the theoretical foundation of a post-production test of RF integrated phased
array antennas is proposed by developing the mathematical model to measure gain
and phase mismatches between antenna elements without any electrical contact. The
proposed technique is fast, cost-efficient and uses near-field measurement of radiated
power from antennas hence, it requires single test setup, it has easy implementation
and it is short in time which makes it viable for industrialized high volume integrated
IC production test.
Second, a BIST model intended for the characterization of I/Q offset, gain and
phase mismatch of IQ transmitters without relying on external equipment is intro-
duced. The proposed BIST method is based on on-chip amplitude measurement as
in prior works however,here the variations in the BIST circuit do not affect the target
parameter estimation accuracy since measurements are designed to be relative. The
BIST circuit is implemented in 130nm technology and can be used for post-production
and in-field calibration.
Third, a programmable low noise amplifier (LNA) is proposed which is adaptable
to different application scenarios depending on the specification requirements. Its
performance is optimized with regards to required specifications e.g. distance, power
consumption, BER, data rate, etc.The statistical modeling is used to capture the
correlations among measured performance parameters and calibration modes for fast
adaptation. Machine learning technique is used to capture these non-linear correlations and build the probability distribution of a target parameter based on measurement results of the correlated parameters. The proposed concept is demonstrated by
embedding built-in tuning knobs in LNA design in 130nm technology. The tuning
knobs are carefully designed to provide independent combinations of important per-
formance parameters such as gain and linearity. Minimum number of switches are
used to provide the desired tuning range without a need for an external analog input.
process,voltage and temperature (PVT) variations of highly integrated RF systems.
Accounting for these variations during the design phase requires tremendous amount
of time for prediction of RF performance and optimizing it accordingly. Thus, there
is an increasing gap between the need to relax the RF performance requirements at
the design phase for rapid development and the need to provide high performance
and low cost RF circuits that function with PVT variations. No matter how care-
fully designed, RF integrated circuits (ICs) manufactured with advanced technology
nodes necessitate lengthy post-production calibration and test cycles with expensive
RF test instruments. Hence design-for-test (DFT) is proposed for low-cost and fast
measurement of performance parameters during both post-production and in-eld op-
eration. For example, built-in self-test (BIST) is a DFT solution for low-cost on-chip
measurement of RF performance parameters. In this dissertation, three aspects of
automated test and calibration, including DFT mathematical model, BIST hardware
and built-in calibration are covered for RF front-end blocks.
First, the theoretical foundation of a post-production test of RF integrated phased
array antennas is proposed by developing the mathematical model to measure gain
and phase mismatches between antenna elements without any electrical contact. The
proposed technique is fast, cost-efficient and uses near-field measurement of radiated
power from antennas hence, it requires single test setup, it has easy implementation
and it is short in time which makes it viable for industrialized high volume integrated
IC production test.
Second, a BIST model intended for the characterization of I/Q offset, gain and
phase mismatch of IQ transmitters without relying on external equipment is intro-
duced. The proposed BIST method is based on on-chip amplitude measurement as
in prior works however,here the variations in the BIST circuit do not affect the target
parameter estimation accuracy since measurements are designed to be relative. The
BIST circuit is implemented in 130nm technology and can be used for post-production
and in-field calibration.
Third, a programmable low noise amplifier (LNA) is proposed which is adaptable
to different application scenarios depending on the specification requirements. Its
performance is optimized with regards to required specifications e.g. distance, power
consumption, BER, data rate, etc.The statistical modeling is used to capture the
correlations among measured performance parameters and calibration modes for fast
adaptation. Machine learning technique is used to capture these non-linear correlations and build the probability distribution of a target parameter based on measurement results of the correlated parameters. The proposed concept is demonstrated by
embedding built-in tuning knobs in LNA design in 130nm technology. The tuning
knobs are carefully designed to provide independent combinations of important per-
formance parameters such as gain and linearity. Minimum number of switches are
used to provide the desired tuning range without a need for an external analog input.
ContributorsShafiee, Maryam (Author) / Ozev, Sule (Thesis advisor) / Diaz, Rodolfo (Committee member) / Ogras, Umit Y. (Committee member) / Bakkaloglu, Bertan (Committee member) / Arizona State University (Publisher)
Created2018