Matching Items (3)
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- All Subjects: High voltages
- Creators: Holbert, Keith E.
- Creators: Goranti, Sandhya
Description
An embedded HVDC system is a dc link with at least two ends being physically connected within a single synchronous ac network. The thesis reviews previous works on embedded HVDC, proposes a dynamic embedded HVDC model by PSCAD program, and compares the transient stability performance among AC, DC and embedded HVDC. The test results indicate that by installing the embedded HVDC, AC network transient stability performance has been largely improved. Therefore the thesis designs a novel frequency control topology for embedded HVDC. According to the dynamic performance test results, when the embedded HVDC system equipped with a frequency control, the system transient stability will be improved further.
ContributorsYu, Jicheng (Author) / Karady, George G. (Thesis advisor) / Hui, Yu (Committee member) / Holbert, Keith E. (Committee member) / Arizona State University (Publisher)
Created2013
Description
Infant mortality rate of field deployed photovoltaic (PV) modules may be expected to be higher than that estimated by standard qualification tests. The reason for increased failure rates may be attributed to the high system voltages. High voltages (HV) in grid connected modules induce additional stress factors that cause new degradation mechanisms. These new degradation mechanisms are not recognized by qualification stress tests. To study and model the effect of high system voltages, recently, potential induced degradation (PID) test method has been introduced. Using PID studies, it has been reported that high voltage failure rates are essentially due to increased leakage currents from active semiconducting layer to the grounded module frame, through encapsulant and/or glass. This project involved designing and commissioning of a new PID test bed at Photovoltaic Reliability Laboratory (PRL) of Arizona State University (ASU) to study the mechanisms of HV induced degradation. In this study, PID stress tests have been performed on accelerated stress modules, in addition to fresh modules of crystalline silicon technology. Accelerated stressing includes thermal cycling (TC200 cycles) and damp heat (1000 hours) tests as per IEC 61215. Failure rates in field deployed modules that are exposed to long term weather conditions are better simulated by conducting HV tests on prior accelerated stress tested modules. The PID testing was performed in 3 phases on a set of 5 mono crystalline silicon modules. In Phase-I of PID test, a positive bias of +600 V was applied, between shorted leads and frame of each module, on 3 modules with conducting carbon coating on glass superstrate. The 3 module set was comprised of: 1 fresh control, TC200 and DH1000. The PID test was conducted in an environmental chamber by stressing the modules at 85°C, for 35 hours with an intermittent evaluation for Arrhenius effects. In the Phase-II, a negative bias of -600 V was applied on a set of 3 modules in the chamber as defined above. The 3 module set in phase-II was comprised of: control module from phase-I, TC200 and DH1000. In the Phase-III, the same set of 3 modules which were used in the phase-II again subjected to +600 V bias to observe the recovery of lost power during the Phase-II. Electrical performance, infrared (IR) and electroluminescence (EL) were done prior and post PID testing. It was observed that high voltage positive bias in the first phase resulted in little
o power loss, high voltage negative bias in the second phase caused significant power loss and the high voltage positive bias in the third phase resulted in major recovery of lost power.
o power loss, high voltage negative bias in the second phase caused significant power loss and the high voltage positive bias in the third phase resulted in major recovery of lost power.
ContributorsGoranti, Sandhya (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Macia, Narciso (Committee member) / Arizona State University (Publisher)
Created2011
Description
Transmission voltages worldwide are increasing to accommodate higher power transfer from power generators to load centers. Insulator dimensions cannot increase linearly with the voltage, as supporting structures become too tall and heavy. Therefore, it is necessary to optimize the insulator design considering all operating conditions including dry, wet and contaminated. In order to design insulators suitably, a better understanding of the insulator flashover is required, as it is a serious issue regarding the safe operation of power systems. However, it is not always feasible to conduct field and laboratory studies due to limited time and money.
The desire to accurately predict the performance of insulator flashovers requires mathematical models. Dynamic models are more appropriate than static models in terms of the instantaneous variation of arc parameters. In this dissertation, a dynamic model including conditions for arc dynamics, arc re-ignition and arc motion with AC supply is first developed.
For an AC power source, it is important to consider the equivalent shunt capacitance in addition to the short circuit current when evaluating pollution test results. By including the power source in dynamic models, the effects of source parameters on the leakage current waveform, the voltage drop and the flashover voltage were systematically investigated. It has been observed that for the same insulator under the same pollution level, there is a large difference among these flashover performances in high voltage laboratories and real power systems. Source strength is believed to be responsible for this discrepancy. Investigations of test source strength were conducted in this work in order to study its impact on different types of insulators with a variety of geometries.
Traditional deterministic models which have been developed so far can only predict whether an insulator would flashover or withstand. In practice, insulator flashover is a statistical process, given that both pollution severity and flashover voltage are probabilistic variables. A probability approach to predict the insulator flashover likelihood is presented based on the newly developed dynamic model.
The desire to accurately predict the performance of insulator flashovers requires mathematical models. Dynamic models are more appropriate than static models in terms of the instantaneous variation of arc parameters. In this dissertation, a dynamic model including conditions for arc dynamics, arc re-ignition and arc motion with AC supply is first developed.
For an AC power source, it is important to consider the equivalent shunt capacitance in addition to the short circuit current when evaluating pollution test results. By including the power source in dynamic models, the effects of source parameters on the leakage current waveform, the voltage drop and the flashover voltage were systematically investigated. It has been observed that for the same insulator under the same pollution level, there is a large difference among these flashover performances in high voltage laboratories and real power systems. Source strength is believed to be responsible for this discrepancy. Investigations of test source strength were conducted in this work in order to study its impact on different types of insulators with a variety of geometries.
Traditional deterministic models which have been developed so far can only predict whether an insulator would flashover or withstand. In practice, insulator flashover is a statistical process, given that both pollution severity and flashover voltage are probabilistic variables. A probability approach to predict the insulator flashover likelihood is presented based on the newly developed dynamic model.
ContributorsHe, Li (Author) / Gorur, Ravi S (Thesis advisor) / Karady, George K (Committee member) / Ayyanar, Raja (Committee member) / Holbert, Keith E. (Committee member) / Arizona State University (Publisher)
Created2016