Matching Items (2)
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- All Subjects: Combinatorial designs and configurations
- Creators: Syrotiuk, Violet
Description
Exhaustive testing is generally infeasible except in the smallest of systems. Research
has shown that testing the interactions among fewer (up to 6) components is generally
sufficient while retaining the capability to detect up to 99% of defects. This leads to a
substantial decrease in the number of tests. Covering arrays are combinatorial objects
that guarantee that every interaction is tested at least once.
In the absence of direct constructions, forming small covering arrays is generally
an expensive computational task. Algorithms to generate covering arrays have been
extensively studied yet no single algorithm provides the smallest solution. More
recently research has been directed towards a new technique called post-optimization.
These algorithms take an existing covering array and attempt to reduce its size.
This thesis presents a new idea for post-optimization by representing covering
arrays as graphs. Some properties of these graphs are established and the results are
contrasted with existing post-optimization algorithms. The idea is then generalized to
close variants of covering arrays with surprising results which in some cases reduce
the size by 30%. Applications of the method to generation and test prioritization are
studied and some interesting results are reported.
has shown that testing the interactions among fewer (up to 6) components is generally
sufficient while retaining the capability to detect up to 99% of defects. This leads to a
substantial decrease in the number of tests. Covering arrays are combinatorial objects
that guarantee that every interaction is tested at least once.
In the absence of direct constructions, forming small covering arrays is generally
an expensive computational task. Algorithms to generate covering arrays have been
extensively studied yet no single algorithm provides the smallest solution. More
recently research has been directed towards a new technique called post-optimization.
These algorithms take an existing covering array and attempt to reduce its size.
This thesis presents a new idea for post-optimization by representing covering
arrays as graphs. Some properties of these graphs are established and the results are
contrasted with existing post-optimization algorithms. The idea is then generalized to
close variants of covering arrays with surprising results which in some cases reduce
the size by 30%. Applications of the method to generation and test prioritization are
studied and some interesting results are reported.
ContributorsKaria, Rushang Vinod (Author) / Colbourn, Charles J (Thesis advisor) / Syrotiuk, Violet (Committee member) / Richa, Andréa W. (Committee member) / Arizona State University (Publisher)
Created2015
Description
In software testing, components are tested individually to make sure each performs as expected. The next step is to confirm that two or more components are able to work together. This stage of testing is often difficult because there can be numerous configurations between just two components.
Covering arrays are one way to ensure a set of tests will cover every possible configuration at least once. However, on systems with many settings, it is computationally intensive to run every possible test. Test prioritization methods can identify tests of greater importance. This concept of test prioritization can help determine which tests can be removed with minimal impact to the overall testing of the system.
This thesis presents three algorithms that generate covering arrays that test the interaction of every two components at least twice. These algorithms extend the functionality of an established greedy test prioritization method to ensure important components are selected in earlier tests. The algorithms are tested on various inputs and the results reveal that on average, the resulting covering arrays are two-fifths to one-half times smaller than a covering array generated through brute force.
Covering arrays are one way to ensure a set of tests will cover every possible configuration at least once. However, on systems with many settings, it is computationally intensive to run every possible test. Test prioritization methods can identify tests of greater importance. This concept of test prioritization can help determine which tests can be removed with minimal impact to the overall testing of the system.
This thesis presents three algorithms that generate covering arrays that test the interaction of every two components at least twice. These algorithms extend the functionality of an established greedy test prioritization method to ensure important components are selected in earlier tests. The algorithms are tested on various inputs and the results reveal that on average, the resulting covering arrays are two-fifths to one-half times smaller than a covering array generated through brute force.
ContributorsAng, Nicole (Author) / Syrotiuk, Violet (Thesis advisor) / Colbourn, Charles (Committee member) / Richa, Andrea (Committee member) / Arizona State University (Publisher)
Created2015