Matching Items (5)
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- All Subjects: Reliability
- Creators: Shrivastava, Aviral
Description
In recent years we have witnessed a shift towards multi-processor system-on-chips (MPSoCs) to address the demands of embedded devices (such as cell phones, GPS devices, luxury car features, etc.). Highly optimized MPSoCs are well-suited to tackle the complex application demands desired by the end user customer. These MPSoCs incorporate a constellation of heterogeneous processing elements (PEs) (general purpose PEs and application-specific integrated circuits (ASICS)). A typical MPSoC will be composed of a application processor, such as an ARM Coretex-A9 with cache coherent memory hierarchy, and several application sub-systems. Each of these sub-systems are composed of highly optimized instruction processors, graphics/DSP processors, and custom hardware accelerators. Typically, these sub-systems utilize scratchpad memories (SPM) rather than support cache coherency. The overall architecture is an integration of the various sub-systems through a high bandwidth system-level interconnect (such as a Network-on-Chip (NoC)). The shift to MPSoCs has been fueled by three major factors: demand for high performance, the use of component libraries, and short design turn around time. As customers continue to desire more and more complex applications on their embedded devices the performance demand for these devices continues to increase. Designers have turned to using MPSoCs to address this demand. By using pre-made IP libraries designers can quickly piece together a MPSoC that will meet the application demands of the end user with minimal time spent designing new hardware. Additionally, the use of MPSoCs allows designers to generate new devices very quickly and thus reducing the time to market. In this work, a complete MPSoC synthesis design flow is presented. We first present a technique \cite{leary1_intro} to address the synthesis of the interconnect architecture (particularly Network-on-Chip (NoC)). We then address the synthesis of the memory architecture of a MPSoC sub-system \cite{leary2_intro}. Lastly, we present a co-synthesis technique to generate the functional and memory architectures simultaneously. The validity and quality of each synthesis technique is demonstrated through extensive experimentation.
ContributorsLeary, Glenn (Author) / Chatha, Karamvir S (Thesis advisor) / Vrudhula, Sarma (Committee member) / Shrivastava, Aviral (Committee member) / Beraha, Rudy (Committee member) / Arizona State University (Publisher)
Created2013
Description
Thanks to continuous technology scaling, intelligent, fast and smaller digital systems are now available at affordable costs. As a result, digital systems have found use in a wide range of application areas that were not even imagined before, including medical (e.g., MRI, remote or post-operative monitoring devices, etc.), automotive (e.g., adaptive cruise control, anti-lock brakes, etc.), security systems (e.g., residential security gateways, surveillance devices, etc.), and in- and out-of-body sensing (e.g., capsule swallowed by patients measuring digestive system pH, heart monitors, etc.). Such computing systems, which are completely embedded within the application, are called embedded systems, as opposed to general purpose computing systems. In the design of such embedded systems, power consumption and reliability are indispensable system requirements. In battery operated portable devices, the battery is the single largest factor contributing to device cost, weight, recharging time, frequency and ultimately its usability. For example, in the Apple iPhone 4 smart-phone, the battery is $40\%$ of the device weight, occupies $36\%$ of its volume and allows only $7$ hours (over 3G) of talk time. As embedded systems find use in a range of sensitive applications, from bio-medical applications to safety and security systems, the reliability of the computations performed becomes a crucial factor. At our current technology-node, portable embedded systems are prone to expect failures due to soft errors at the rate of once-per-year; but with aggressive technology scaling, the rate is predicted to increase exponentially to once-per-hour. Over the years, researchers have been successful in developing techniques, implemented at different layers of the design-spectrum, to improve system power efficiency and reliability. Among the layers of design abstraction, I observe that the interface between the compiler and processor micro-architecture possesses a unique potential for efficient design optimizations. A compiler designer is able to observe and analyze the application software at a finer granularity; while the processor architect analyzes the system output (power, performance, etc.) for each executed instruction. At the compiler micro-architecture interface, if the system knowledge at the two design layers can be integrated, design optimizations at the two layers can be modified to efficiently utilize available resources and thereby achieve appreciable system-level benefits. To this effect, the thesis statement is that, ``by merging system design information at the compiler and micro-architecture design layers, smart compilers can be developed, that achieve reliable and power-efficient embedded computing through: i) Pure compiler techniques, ii) Hybrid compiler micro-architecture techniques, and iii) Compiler-aware architectures''. In this dissertation demonstrates, through contributions in each of the three compiler-based techniques, the effectiveness of smart compilers in achieving power-efficiency and reliability in embedded systems.
ContributorsJeyapaul, Reiley (Author) / Shrivastava, Aviral (Thesis advisor) / Vrudhula, Sarma (Committee member) / Clark, Lawrence (Committee member) / Colbourn, Charles (Committee member) / Arizona State University (Publisher)
Created2012
Description
Advances in semiconductor technology have brought computer-based systems intovirtually all aspects of human life. This unprecedented integration of semiconductor based systems in our lives has significantly increased the domain and the number
of safety-critical applications – application with unacceptable consequences of failure. Software-level error resilience schemes are attractive because they can provide commercial-off-the-shelf microprocessors with adaptive and scalable reliability.
Among all software-level error resilience solutions, in-application instruction replication based approaches have been widely used and are deemed to be the most effective. However, existing instruction-based replication schemes only protect some part of computations i.e. arithmetic and logical instructions and leave the rest as unprotected. To improve the efficacy of instruction-level redundancy-based approaches, we developed several error detection and error correction schemes. nZDC (near Zero silent
Data Corruption) is an instruction duplication scheme which protects the execution of whole application. Rather than detecting errors on register operands of memory and control flow operations, nZDC checks the results of such operations. nZDC en
sures the correct execution of memory write instruction by reloading stored value and checking it against redundantly computed value. nZDC also introduces a novel control flow checking mechanism which replicates compare and branch instructions and
detects both wrong direction branches as well as unwanted jumps. Fault injection experiments show that nZDC can improve the error coverage of the state-of-the-art schemes by more than 10x, without incurring any more performance penalty. Further
more, we introduced two error recovery solutions. InCheck is our backward recovery solution which makes light-weighted error-free checkpoints at the basic block granularity. In the case of error, InCheck reverts the program execution to the beginning of last executed basic block and resumes the execution by the aid of preserved in formation. NEMESIS is our forward recovery scheme which runs three versions of computation and detects errors by checking the results of all memory write and branch
operations. In the case of a mismatch, NEMESIS diagnosis routine decides if the error is recoverable. If yes, NEMESIS recovery routine reverts the effect of error from the program state and resumes program normal execution from the error detection
point.
of safety-critical applications – application with unacceptable consequences of failure. Software-level error resilience schemes are attractive because they can provide commercial-off-the-shelf microprocessors with adaptive and scalable reliability.
Among all software-level error resilience solutions, in-application instruction replication based approaches have been widely used and are deemed to be the most effective. However, existing instruction-based replication schemes only protect some part of computations i.e. arithmetic and logical instructions and leave the rest as unprotected. To improve the efficacy of instruction-level redundancy-based approaches, we developed several error detection and error correction schemes. nZDC (near Zero silent
Data Corruption) is an instruction duplication scheme which protects the execution of whole application. Rather than detecting errors on register operands of memory and control flow operations, nZDC checks the results of such operations. nZDC en
sures the correct execution of memory write instruction by reloading stored value and checking it against redundantly computed value. nZDC also introduces a novel control flow checking mechanism which replicates compare and branch instructions and
detects both wrong direction branches as well as unwanted jumps. Fault injection experiments show that nZDC can improve the error coverage of the state-of-the-art schemes by more than 10x, without incurring any more performance penalty. Further
more, we introduced two error recovery solutions. InCheck is our backward recovery solution which makes light-weighted error-free checkpoints at the basic block granularity. In the case of error, InCheck reverts the program execution to the beginning of last executed basic block and resumes the execution by the aid of preserved in formation. NEMESIS is our forward recovery scheme which runs three versions of computation and detects errors by checking the results of all memory write and branch
operations. In the case of a mismatch, NEMESIS diagnosis routine decides if the error is recoverable. If yes, NEMESIS recovery routine reverts the effect of error from the program state and resumes program normal execution from the error detection
point.
ContributorsDidehban, Moslem (Author) / Shrivastava, Aviral (Thesis advisor) / Wu, Carole-Jean (Committee member) / Clark, Lawrence (Committee member) / Mahlke, Scott (Committee member) / Arizona State University (Publisher)
Created2018
Description
Several decades of transistor technology scaling has brought the threat of soft errors to modern embedded processors. Several techniques have been proposed to protect these systems from soft errors. However, their effectiveness in protecting the computation cannot be ascertained without accurate and quantitative estimation of system reliability. Vulnerability -- a metric that defines the probability of system-failure (reliability) through analytical models -- is the most effective mechanism for our current estimation and early design space exploration needs. Previous vulnerability estimation tools are based around the Sim-Alpha simulator which has been to shown to have several limitations. In this thesis, I present gemV: an accurate and comprehensive vulnerability estimation tool based on gem5. Gem5 is a popular cycle-accurate micro-architectural simulator that can model several different processor models in close to real hardware form. GemV can be used for fast and early design space exploration and also evaluate the protection afforded by commodity processors. gemV is comprehensive, since it models almost all sequential components of the processor. gemV is accurate because of fine-grain vulnerability tracking, accurate vulnerability modeling of squashed instructions, and accurate vulnerability modeling of shared data structures in gem5. gemV has been thoroughly validated against extensive fault injection experiments and achieves a 97\% accuracy with 95\% confidence. A micro-architect can use gemV to discover micro-architectural variants of a processor that minimize vulnerability for allowed performance penalty. A software developer can use gemV to explore the performance-vulnerability trade-off by choosing different algorithms and compiler optimizations, while the system designer can use gemV to explore the performance-vulnerability trade-offs of choosing different Insruction Set Architectures (ISA).
ContributorsTanikella, Srinivas Karthik (Author) / Shrivastava, Aviral (Thesis advisor) / Bazzi, Rida (Committee member) / Wu, Carole-Jean (Committee member) / Arizona State University (Publisher)
Created2016
Description
Soft errors are considered as a key reliability challenge for sub-nano scale transistors. An ideal solution for such a challenge should ultimately eliminate the effect of soft errors from the microprocessor. While forward recovery techniques achieve fast recovery from errors by simply voting out the wrong values, they incur the overhead of three copies execution. Backward recovery techniques only need two copies of execution, but suffer from check-pointing overhead.
In this work I explored the efficiency of integrating check-pointing into the application and the effectiveness of recovery that can be performed upon it. After evaluating the available fine-grained approaches to perform recovery, I am introducing InCheck, an in-application recovery scheme that can be integrated into instruction-duplication based techniques, thus providing a fast error recovery. The proposed technique makes light-weight checkpoints at the basic-block granularity, and uses them for recovery purposes.
To evaluate the effectiveness of the proposed technique, 10,000 fault injection experiments were performed on different hardware components of a modern ARM in-order simulated processor. InCheck was able to recover from all detected errors by replaying about 20 instructions, however, the state of the art recovery scheme failed more than 200 times.
In this work I explored the efficiency of integrating check-pointing into the application and the effectiveness of recovery that can be performed upon it. After evaluating the available fine-grained approaches to perform recovery, I am introducing InCheck, an in-application recovery scheme that can be integrated into instruction-duplication based techniques, thus providing a fast error recovery. The proposed technique makes light-weight checkpoints at the basic-block granularity, and uses them for recovery purposes.
To evaluate the effectiveness of the proposed technique, 10,000 fault injection experiments were performed on different hardware components of a modern ARM in-order simulated processor. InCheck was able to recover from all detected errors by replaying about 20 instructions, however, the state of the art recovery scheme failed more than 200 times.
ContributorsLokam, Sai Ram Dheeraj (Author) / Shrivastava, Aviral (Thesis advisor) / Clark, Lawrence T (Committee member) / Mubayi, Anuj (Committee member) / Arizona State University (Publisher)
Created2016