Matching Items (5)
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Description
In this era of fast computational machines and new optimization algorithms, there have been great advances in Experimental Designs. We focus our research on design issues in generalized linear models (GLMs) and functional magnetic resonance imaging(fMRI). The first part of our research is on tackling the challenging problem of constructing

exact

In this era of fast computational machines and new optimization algorithms, there have been great advances in Experimental Designs. We focus our research on design issues in generalized linear models (GLMs) and functional magnetic resonance imaging(fMRI). The first part of our research is on tackling the challenging problem of constructing

exact designs for GLMs, that are robust against parameter, link and model

uncertainties by improving an existing algorithm and providing a new one, based on using a continuous particle swarm optimization (PSO) and spectral clustering. The proposed algorithm is sufficiently versatile to accomodate most popular design selection criteria, and we concentrate on providing robust designs for GLMs, using the D and A optimality criterion. The second part of our research is on providing an algorithm

that is a faster alternative to a recently proposed genetic algorithm (GA) to construct optimal designs for fMRI studies. Our algorithm is built upon a discrete version of the PSO.
ContributorsTemkit, M'Hamed (Author) / Kao, Jason (Thesis advisor) / Reiser, Mark R. (Committee member) / Barber, Jarrett (Committee member) / Montgomery, Douglas C. (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2014
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Description
Generalized Linear Models (GLMs) are widely used for modeling responses with non-normal error distributions. When the values of the covariates in such models are controllable, finding an optimal (or at least efficient) design could greatly facilitate the work of collecting and analyzing data. In fact, many theoretical results are obtained

Generalized Linear Models (GLMs) are widely used for modeling responses with non-normal error distributions. When the values of the covariates in such models are controllable, finding an optimal (or at least efficient) design could greatly facilitate the work of collecting and analyzing data. In fact, many theoretical results are obtained on a case-by-case basis, while in other situations, researchers also rely heavily on computational tools for design selection.

Three topics are investigated in this dissertation with each one focusing on one type of GLMs. Topic I considers GLMs with factorial effects and one continuous covariate. Factors can have interactions among each other and there is no restriction on the possible values of the continuous covariate. The locally D-optimal design structures for such models are identified and results for obtaining smaller optimal designs using orthogonal arrays (OAs) are presented. Topic II considers GLMs with multiple covariates under the assumptions that all but one covariate are bounded within specified intervals and interaction effects among those bounded covariates may also exist. An explicit formula for D-optimal designs is derived and OA-based smaller D-optimal designs for models with one or two two-factor interactions are also constructed. Topic III considers multiple-covariate logistic models. All covariates are nonnegative and there is no interaction among them. Two types of D-optimal design structures are identified and their global D-optimality is proved using the celebrated equivalence theorem.
ContributorsWang, Zhongsheng (Author) / Stufken, John (Thesis advisor) / Kamarianakis, Ioannis (Committee member) / Kao, Ming-Hung (Committee member) / Reiser, Mark R. (Committee member) / Zheng, Yi (Committee member) / Arizona State University (Publisher)
Created2018
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Description
Yield is a key process performance characteristic in the capital-intensive semiconductor fabrication process. In an industry where machines cost millions of dollars and cycle times are a number of months, predicting and optimizing yield are critical to process improvement, customer satisfaction, and financial success. Semiconductor yield modeling is

Yield is a key process performance characteristic in the capital-intensive semiconductor fabrication process. In an industry where machines cost millions of dollars and cycle times are a number of months, predicting and optimizing yield are critical to process improvement, customer satisfaction, and financial success. Semiconductor yield modeling is essential to identifying processing issues, improving quality, and meeting customer demand in the industry. However, the complicated fabrication process, the massive amount of data collected, and the number of models available make yield modeling a complex and challenging task. This work presents modeling strategies to forecast yield using generalized linear models (GLMs) based on defect metrology data. The research is divided into three main parts. First, the data integration and aggregation necessary for model building are described, and GLMs are constructed for yield forecasting. This technique yields results at both the die and the wafer levels, outperforms existing models found in the literature based on prediction errors, and identifies significant factors that can drive process improvement. This method also allows the nested structure of the process to be considered in the model, improving predictive capabilities and violating fewer assumptions. To account for the random sampling typically used in fabrication, the work is extended by using generalized linear mixed models (GLMMs) and a larger dataset to show the differences between batch-specific and population-averaged models in this application and how they compare to GLMs. These results show some additional improvements in forecasting abilities under certain conditions and show the differences between the significant effects identified in the GLM and GLMM models. The effects of link functions and sample size are also examined at the die and wafer levels. The third part of this research describes a methodology for integrating classification and regression trees (CART) with GLMs. This technique uses the terminal nodes identified in the classification tree to add predictors to a GLM. This method enables the model to consider important interaction terms in a simpler way than with the GLM alone, and provides valuable insight into the fabrication process through the combination of the tree structure and the statistical analysis of the GLM.
ContributorsKrueger, Dana Cheree (Author) / Montgomery, Douglas C. (Thesis advisor) / Fowler, John (Committee member) / Pan, Rong (Committee member) / Pfund, Michele (Committee member) / Arizona State University (Publisher)
Created2011
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Description
I focus on algorithms that generate good sampling points for function approximation. In 1D, it is well known that polynomial interpolation using equispaced points is unstable. On the other hand, using Chebyshev nodes provides both stable and highly accurate points for polynomial interpolation. In higher dimensional complex regions, optimal sampling

I focus on algorithms that generate good sampling points for function approximation. In 1D, it is well known that polynomial interpolation using equispaced points is unstable. On the other hand, using Chebyshev nodes provides both stable and highly accurate points for polynomial interpolation. In higher dimensional complex regions, optimal sampling points are not known explicitly. This work presents robust algorithms that find good sampling points in complex regions for polynomial interpolation, least-squares, and radial basis function (RBF) methods. The quality of these nodes is measured using the Lebesgue constant. I will also consider optimal sampling for constrained optimization, used to solve PDEs, where boundary conditions must be imposed. Furthermore, I extend the scope of the problem to include finding near-optimal sampling points for high-order finite difference methods. These high-order finite difference methods can be implemented using either piecewise polynomials or RBFs.
ContributorsLiu, Tony (Author) / Platte, Rodrigo B (Thesis advisor) / Renaut, Rosemary (Committee member) / Kaspar, David (Committee member) / Moustaoui, Mohamed (Committee member) / Motsch, Sebastien (Committee member) / Arizona State University (Publisher)
Created2019
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Description
This dissertation develops a second order accurate approximation to the magnetic resonance (MR) signal model used in the PARSE (Parameter Assessment by Retrieval from Single Encoding) method to recover information about the reciprocal of the spin-spin relaxation time function (R2*) and frequency offset function (w) in addition to the typical

This dissertation develops a second order accurate approximation to the magnetic resonance (MR) signal model used in the PARSE (Parameter Assessment by Retrieval from Single Encoding) method to recover information about the reciprocal of the spin-spin relaxation time function (R2*) and frequency offset function (w) in addition to the typical steady-state transverse magnetization (M) from single-shot magnetic resonance imaging (MRI) scans. Sparse regularization on an approximation to the edge map is used to solve the associated inverse problem. Several studies are carried out for both one- and two-dimensional test problems, including comparisons to the first order approximation method, as well as the first order approximation method with joint sparsity across multiple time windows enforced. The second order accurate model provides increased accuracy while reducing the amount of data required to reconstruct an image when compared to piecewise constant in time models. A key component of the proposed technique is the use of fast transforms for the forward evaluation. It is determined that the second order model is capable of providing accurate single-shot MRI reconstructions, but requires an adequate coverage of k-space to do so. Alternative data sampling schemes are investigated in an attempt to improve reconstruction with single-shot data, as current trajectories do not provide ideal k-space coverage for the proposed method.
ContributorsJesse, Aaron Mitchel (Author) / Platte, Rodrigo (Thesis advisor) / Gelb, Anne (Committee member) / Kostelich, Eric (Committee member) / Mittelmann, Hans (Committee member) / Moustaoui, Mohamed (Committee member) / Arizona State University (Publisher)
Created2019