Matching Items (3)
Filtering by

Clear all filters

152383-Thumbnail Image.png

Design of a low power and delay multi-protocol switching system for I/O and network virtualization

Description
Data centers connect a larger number of servers requiring IO and switches with low power and delay. Virtualization of IO and network is crucial for these servers, which run virtual processes for computing, storage, and apps. We propose using the PCI Express (PCIe) protocol and a new PCIe switch fabric…

Data centers connect a larger number of servers requiring IO and switches with low power and delay. Virtualization of IO and network is crucial for these servers, which run virtual processes for computing, storage, and apps. We propose using the PCI Express (PCIe) protocol and a new PCIe switch fabric for IO and switch virtualization. The switch fabric has little data buffering, allowing up to 512 physical 10 Gb/s PCIe2.0 lanes to be connected via a switch fabric. The switch is scalable with adapters running multiple adaptation protocols, such as Ethernet over PCIe, PCIe over Internet, or FibreChannel over Ethernet. Such adaptation protocols allow integration of IO often required for disjoint datacenter applications such as storage and networking. The novel switch fabric based on space-time carrier sensing facilitates high bandwidth, low power, and low delay multi-protocol switching. To achieve Terabit switching, both time (high transmission speed) and space (multi-stage interconnection network) technologies are required. In this paper, we present the design of an up to 256 lanes Clos-network of multistage crossbar switch fabric for PCIe system. The switch core consists of 48 16x16 crossbar sub-switches. We also propose a new output contention resolution algorithm utilizing an out-of-band protocol of Request-To-Send (RTS), Clear-To-Send (CTS) before sending PCIe packets through the switch fabric. Preliminary power and delay estimates are provided.
ContributorsLuo, Haojun (Author) / Hui, Joseph (Thesis advisor) / Song, Hongjiang (Committee member) / Reisslein, Martin (Committee member) / Zhang, Yanchao (Committee member) / Arizona State University (Publisher)
Created2013
149956-Thumbnail Image.png

Modeling and simulation of variations in nano-CMOS design

Description
CMOS technology is expected to enter the 10nm regime for future integrated circuits (IC). Such aggressive scaling leads to vastly increased variability, posing a grand challenge to robust IC design. Variations in CMOS are often divided into two types: intrinsic variations and process-induced variations. Intrinsic variations are limited by fundamental…

CMOS technology is expected to enter the 10nm regime for future integrated circuits (IC). Such aggressive scaling leads to vastly increased variability, posing a grand challenge to robust IC design. Variations in CMOS are often divided into two types: intrinsic variations and process-induced variations. Intrinsic variations are limited by fundamental physics. They are inherent to CMOS structure, considered as one of the ultimate barriers to the continual scaling of CMOS devices. In this work the three primary intrinsic variations sources are studied, including random dopant fluctuation (RDF), line-edge roughness (LER) and oxide thickness fluctuation (OTF). The research is focused on the modeling and simulation of those variations and their scaling trends. Besides the three variations, a time dependent variation source, Random Telegraph Noise (RTN) is also studied. Different from the other three variations, RTN does not contribute much to the total variation amount, but aggregate the worst case of Vth variations in CMOS. In this work a TCAD based simulation study on RTN is presented, and a new SPICE based simulation method for RTN is proposed for time domain circuit analysis. Process-induced variations arise from the imperfection in silicon fabrication, and vary from foundries to foundries. In this work the layout dependent Vth shift due to Rapid-Thermal Annealing (RTA) are investigated. In this work, we develop joint thermal/TCAD simulation and compact modeling tools to analyze performance variability under various layout pattern densities and RTA conditions. Moreover, we propose a suite of compact models that bridge the underlying RTA process with device parameter change for efficient design optimization.
ContributorsYe, Yun, Ph.D (Author) / Cao, Yu (Thesis advisor) / Yu, Hongbin (Committee member) / Song, Hongjiang (Committee member) / Clark, Lawrence (Committee member) / Arizona State University (Publisher)
Created2011
154931-Thumbnail Image.png

Integrated CMOS-based low power electrochemical impedance spectroscopy for biomedical applications

Description
This thesis dissertation presents design of portable low power Electrochemical Impedance Spectroscopy (EIS) system which can be used for biomedical applications such as tear diagnosis, blood diagnosis, or any other body-fluid diagnosis. Two design methodologies are explained in this dissertation (a) a discrete component-based portable low-power EIS system and (b)…

This thesis dissertation presents design of portable low power Electrochemical Impedance Spectroscopy (EIS) system which can be used for biomedical applications such as tear diagnosis, blood diagnosis, or any other body-fluid diagnosis. Two design methodologies are explained in this dissertation (a) a discrete component-based portable low-power EIS system and (b) an integrated CMOS-based portable low-power EIS system. Both EIS systems were tested in a laboratory environment and the characterization results are compared. The advantages and disadvantages of the integrated EIS system relative to the discrete component-based EIS system are presented including experimental data. The specifications of both EIS systems are compared with commercially available non-portable EIS workstations. These designed EIS systems are handheld and very low-cost relative to the currently available commercial EIS workstations.
ContributorsGhorband, Vishal (Author) / Blain Christen, Jennifer (Thesis advisor) / Song, Hongjiang (Committee member) / LaBelle, Jeffrey (Committee member) / Arizona State University (Publisher)
Created2016