Matching Items (4)
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- All Subjects: Audio amplifiers--Design and construction.
- All Subjects: Integrated circuits--Fault tolerance.
- Genre: Masters Thesis
- Creators: Ozev, Sule
- Creators: Peterson, Cory
Description
Efficiency of components is an ever increasing area of importance to portable applications, where a finite battery means finite operating time. Higher efficiency devices need to be designed that don't compromise on the performance that the consumer has come to expect. Class D amplifiers deliver on the goal of increased efficiency, but at the cost of distortion. Class AB amplifiers have low efficiency, but high linearity. By modulating the supply voltage of a Class AB amplifier to make a Class H amplifier, the efficiency can increase while still maintaining the Class AB level of linearity. A 92dB Power Supply Rejection Ratio (PSRR) Class AB amplifier and a Class H amplifier were designed in a 0.24um process for portable audio applications. Using a multiphase buck converter increased the efficiency of the Class H amplifier while still maintaining a fast response time to respond to audio frequencies. The Class H amplifier had an efficiency above the Class AB amplifier by 5-7% from 5-30mW of output power without affecting the total harmonic distortion (THD) at the design specifications. The Class H amplifier design met all design specifications and showed performance comparable to the designed Class AB amplifier across 1kHz-20kHz and 0.01mW-30mW. The Class H design was able to output 30mW into 16Ohms without any increase in THD. This design shows that Class H amplifiers merit more research into their potential for increasing efficiency of audio amplifiers and that even simple designs can give significant increases in efficiency without compromising linearity.
ContributorsPeterson, Cory (Author) / Bakkaloglu, Bertan (Thesis advisor) / Barnaby, Hugh (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2013
Description
The research objective is fully differential op-amp with common mode feedback, which are applied in filter, band gap, Analog Digital Converter (ADC) and so on as a fundamental component in analog circuit. Having modeled various defect and analyzed corresponding probability, defect library could be built after reduced defect simulation.Based on the resolution of microscope scan tool, all these defects are categorized into four groups of defects by both function and location, bias circuit defect, first stage amplifier defect, output stage defect and common mode feedback defect, separately. Each fault result is attributed to one of these four region defects.Therefore, analog testing algorithm and automotive tool could be generated to assist testing engineers to meet the demand of large numbers of chips.
ContributorsLu, Zhijian (Author) / Ozev, Sule (Thesis advisor) / Kiaei, Sayfe (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2014
Description
Class D Amplifiers are widely used in portable systems such as mobile phones to achieve high efficiency. The demands of portable electronics for low power consumption to extend battery life and reduce heat dissipation mandate efficient, high-performance audio amplifiers. The high efficiency of Class D amplifiers (CDAs) makes them particularly attractive for portable applications. The Digital class D amplifier is an interesting solution to increase the efficiency of embedded systems. However, this solution is not good enough in terms of PWM stage linearity and power supply rejection. An efficient control is needed to correct the error sources in order to get a high fidelity sound quality in the whole audio range of frequencies. A fundamental analysis on various error sources due to non idealities in the power stage have been discussed here with key focus on Power supply perturbations driving the Power stage of a Class D Audio Amplifier. Two types of closed loop Digital Class D architecture for PSRR improvement have been proposed and modeled. Double sided uniform sampling modulation has been used. One of the architecture uses feedback around the power stage and the second architecture uses feedback into digital domain. Simulation & experimental results confirm that the closed loop PSRR & PS-IMD improve by around 30-40 dB and 25 dB respectively.
ContributorsChakraborty, Bijeta (Author) / Bakkaloglu, Bertan (Thesis advisor) / Garrity, Douglas (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2012
Description
In this thesis two methodologies have been proposed for evaluating the fault response of analog/RF circuits. These proposed approaches are used to evaluate the response of the faulty circuit in terms of specifications/measurements. Faulty response can be used to evaluate important test metrics like fail probability, fault coverage and yield coverage of given measurements under process variations. Once the models for faulty and fault free circuit are generated, one needs to perform Monte Carlo sampling (as opposed to Monte Carlo simulations) to compute these statistical parameters with high accuracy. The first method is based on adaptively determining the order of the model based on the error budget in terms of computing the statistical metrics and position of the threshold(s) to decide how precisely necessary models need to be extracted. In the second method, using hierarchy in process variations a hybrid of heuristics and localized linear models have been proposed. Experiments on LNA and Mixer using the adaptive model order selection procedure can reduce the number of necessary simulations by 7.54x and 7.03x respectively in the computation of fail probability for an error budget of 2%. Experiments on LNA using the hybrid approach can reduce the number of necessary simulations by 21.9x and 17x for four and six output parameters cases for improved accuracy in test statistics estimation.
ContributorsSubrahmaniyan Radhakrishnan, Gurusubrahmaniyan (Author) / Ozev, Sule (Thesis advisor) / Blain Christen, Jennifer (Committee member) / Cao, Yu (Committee member) / Arizona State University (Publisher)
Created2010