Development of Frequency Selective Surfaces for RF Interrogator Design
The honors thesis presented in this document describes an extension to an electrical engineering capstone project whose scope is to develop the receiver electronics for an RF interrogator. The RF interrogator functions by detecting the change in resonant frequency of (i.e, frequency of maximum backscatter from) a target resulting from an environmental input. The general idea of this honors project was to design three frequency selective surfaces that would act as surrogate backscattering or reflecting targets that each contains a distinct frequency response. Using 3-D electromagnetic simulation software, three surrogate targets exhibiting bandpass frequency responses at distinct frequencies were designed and presented in this thesis.
- Sisk, Ryan Derek (Author)
- Aberle, James (Thesis director)
- Chakraborty, Partha (Committee member)
- Electrical Engineering Program (Contributor, Contributor)
- Barrett, The Honors College (Contributor)