Matching Items (19)
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- All Subjects: Photovoltaic Cells
- Creators: Tamizhmani, Govindasamy
- Member of: ASU Electronic Theses and Dissertations
Description
Potential induced degradation (PID) due to high system voltages is one of the major degradation mechanisms in photovoltaic (PV) modules, adversely affecting their performance due to the combined effects of the following factors: system voltage, superstrate/glass surface conductivity, encapsulant conductivity, silicon nitride anti-reflection coating property and interface property (glass/encapsulant; encapsulant/cell; encapsulant/backsheet). Previous studies carried out at ASU's Photovoltaic Reliability Laboratory (ASU-PRL) showed that only negative voltage bias (positive grounded systems) adversely affects the performance of commonly available crystalline silicon modules. In previous studies, the surface conductivity of the glass surface was obtained using either conductive carbon layer extending from the glass surface to the frame or humidity inside an environmental chamber. This thesis investigates the influence of glass surface conductivity disruption on PV modules. In this study, conductive carbon was applied only on the module's glass surface without extending to the frame and the surface conductivity was disrupted (no carbon layer) at 2cm distance from the periphery of frame inner edges. This study was carried out under dry heat at two different temperatures (60 °C and 85 °C) and three different negative bias voltages (-300V, -400V, and -600V). To replicate closeness to the field conditions, half of the selected modules were pre-stressed under damp heat for 1000 hours (DH 1000) and the remaining half under 200 hours of thermal cycling (TC 200). When the surface continuity was disrupted by maintaining a 2 cm gap from the frame to the edge of the conductive layer, as demonstrated in this study, the degradation was found to be absent or negligibly small even after 35 hours of negative bias at elevated temperatures. This preliminary study appears to indicate that the modules could become immune to PID losses if the continuity of the glass surface conductivity is disrupted at the inside boundary of the frame. The surface conductivity of the glass, due to water layer formation in a humid condition, close to the frame could be disrupted just by applying a water repelling (hydrophobic) but high transmittance surface coating (such as Teflon) or modifying the frame/glass edges with water repellent properties.
ContributorsTatapudi, Sai Ravi Vasista (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2012
Description
This is a two-part thesis: Part 1 of this thesis tests and validates the methodology and mathematical models of the International Electrotechnical Commission (IEC) 61853-2 standard for the measurement of angle of incidence (AOI) effects on photovoltaic modules. Flat-plate photovoltaic modules in the field operate under a wide range of environmental conditions. The purpose of IEC 61853-2 is to characterize photovoltaic modules' performance under specific environmental conditions. Part 1 of this report focuses specifically on AOI. To accurately test and validate IEC 61853-2 standard for measuring AOI, meticulous experimental setup and test procedures were followed. Modules of five different photovoltaic technology types with glass superstrates were tested. Test results show practically identical relative light transmission plots for all five test modules. The experimental results were compared to theoretical and empirical models for relative light transmission of air-glass interface. IEC 61853-2 states "for the flat glass superstrate modules, the AOI test does not need to be performed; rather, the data of a flat glass air interface can be used." The results obtained in this thesis validate this statement. This work was performed in collaboration with another Master of Science student (Surynarayana Janakeeraman) and the test results are presented in two masters theses. Part 2 of this thesis is to develop non-intrusive techniques to accurately measure the quantum efficiency (QE) of a single-junction crystalline silicon cell within a commercial module. This thesis will describe in detail all the equipment and conditions necessary to measure QE and discuss the factors which may influence this measurement. The ability to utilize a non-intrusive test to measure quantum efficiency of a cell within a module is extremely beneficial for reliability testing of commercial modules. Detailed methodologies for this innovative test procedure are not widely available in industry because equipment and measurement techniques have not been explored extensively. This paper will provide a literature review describing relevant theories and measurement techniques related to measuring the QE of a cell within a module. The testing methodology and necessary equipment will be described in detail. Results and conclusions provide the overall accuracy of the measurements and discuss the parameters affecting these measurements.
ContributorsKnisely, Brett (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Macia, Narciso (Committee member) / Arizona State University (Publisher)
Created2013
Description
Infant mortality rate of field deployed photovoltaic (PV) modules may be expected to be higher than that estimated by standard qualification tests. The reason for increased failure rates may be attributed to the high system voltages. High voltages (HV) in grid connected modules induce additional stress factors that cause new degradation mechanisms. These new degradation mechanisms are not recognized by qualification stress tests. To study and model the effect of high system voltages, recently, potential induced degradation (PID) test method has been introduced. Using PID studies, it has been reported that high voltage failure rates are essentially due to increased leakage currents from active semiconducting layer to the grounded module frame, through encapsulant and/or glass. This project involved designing and commissioning of a new PID test bed at Photovoltaic Reliability Laboratory (PRL) of Arizona State University (ASU) to study the mechanisms of HV induced degradation. In this study, PID stress tests have been performed on accelerated stress modules, in addition to fresh modules of crystalline silicon technology. Accelerated stressing includes thermal cycling (TC200 cycles) and damp heat (1000 hours) tests as per IEC 61215. Failure rates in field deployed modules that are exposed to long term weather conditions are better simulated by conducting HV tests on prior accelerated stress tested modules. The PID testing was performed in 3 phases on a set of 5 mono crystalline silicon modules. In Phase-I of PID test, a positive bias of +600 V was applied, between shorted leads and frame of each module, on 3 modules with conducting carbon coating on glass superstrate. The 3 module set was comprised of: 1 fresh control, TC200 and DH1000. The PID test was conducted in an environmental chamber by stressing the modules at 85°C, for 35 hours with an intermittent evaluation for Arrhenius effects. In the Phase-II, a negative bias of -600 V was applied on a set of 3 modules in the chamber as defined above. The 3 module set in phase-II was comprised of: control module from phase-I, TC200 and DH1000. In the Phase-III, the same set of 3 modules which were used in the phase-II again subjected to +600 V bias to observe the recovery of lost power during the Phase-II. Electrical performance, infrared (IR) and electroluminescence (EL) were done prior and post PID testing. It was observed that high voltage positive bias in the first phase resulted in little
o power loss, high voltage negative bias in the second phase caused significant power loss and the high voltage positive bias in the third phase resulted in major recovery of lost power.
o power loss, high voltage negative bias in the second phase caused significant power loss and the high voltage positive bias in the third phase resulted in major recovery of lost power.
ContributorsGoranti, Sandhya (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Macia, Narciso (Committee member) / Arizona State University (Publisher)
Created2011
Description
Photovoltaic (PV) systems are one of the next generation's renewable energy sources for our world energy demand. PV modules are highly reliable. However, in polluted environments, over time, they will collect grime and dust. There are also limited field data studies about soiling losses on PV modules. The study showed how important it is to investigate the effect of tilt angle on soiling. The study includes two sets of mini-modules. Each set has 9 PV modules tilted at 0, 5, 10, 15, 20, 23, 30, 33 and 40°. The first set called "Cleaned" was cleaned every other day. The second set called "Soiled" was never cleaned after the first day. The short circuit current, a measure of irradiance, and module temperature was monitored and recorded every two minutes over three months (January-March 2011). The data were analyzed to investigate the effect of tilt angle on daily and monthly soiling, and hence transmitted solar insolation and energy production by PV modules. The study shows that during the period of January through March 2011 there was an average loss due to soiling of approximately 2.02% for 0° tilt angle. Modules at tilt anlges 23° and 33° also have some insolation losses but do not come close to the module at 0° tilt angle. Tilt anlge 23° has approximately 1.05% monthly insolation loss, and 33° tilt angle has an insolation loss of approximately 0.96%. The soiling effect is present at any tilt angle, but the magnitude is evident: the flatter the solar module is placed the more energy it will lose.
ContributorsCano Valero, José (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Madakannan, Arunachalanadar (Committee member) / Macia, Narciso (Committee member) / Arizona State University (Publisher)
Created2011
Description
Photovoltaic (PV) modules undergo performance degradation depending on climatic conditions, applications, and system configurations. The performance degradation prediction of PV modules is primarily based on Accelerated Life Testing (ALT) procedures. In order to further strengthen the ALT process, additional investigation of the power degradation of field aged PV modules in various configurations is required. A detailed investigation of 1,900 field aged (12-18 years) PV modules deployed in a power plant application was conducted for this study. Analysis was based on the current-voltage (I-V) measurement of all the 1,900 modules individually. I-V curve data of individual modules formed the basis for calculating the performance degradation of the modules. The percentage performance degradation and rates of degradation were compared to an earlier study done at the same plant. The current research was primarily focused on identifying the extent of potential induced degradation (PID) of individual modules with reference to the negative ground potential. To investigate this, the arrangement and connection of the individual modules/strings was examined in detail. The study also examined the extent of underperformance of every series string due to performance mismatch of individual modules in that string. The power loss due to individual module degradation and module mismatch at string level was then compared to the rated value.
ContributorsJaspreet Singh (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2011
Characterization and analysis of long term field aged photovoltaic modules and encapsulant materials
Description
Photovoltaic (PV) module degradation is a well-known issue, however understanding the mechanistic pathways in which modules degrade is still a major task for the PV industry. In order to study the mechanisms responsible for PV module degradation, the effects of these degradation mechanisms must be quantitatively measured to determine the severity of each degradation mode. In this thesis multiple modules from three climate zones (Arizona, California and Colorado) were investigated for a single module glass/polymer construction (Siemens M55) to determine the degree to which they had degraded, and the main factors that contributed to that degradation. To explain the loss in power, various nondestructive and destructive techniques were used to indicate possible causes of loss in performance. This is a two-part thesis. Part 1 presents non-destructive test results and analysis and Part 2 presents destructive test results and analysis.
ContributorsChicca, Matthew (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2015
Description
The volume of end-of-life photovoltaic (PV) modules is increasing as the global PV market increases, and the global PV waste streams are expected to reach 250,000 metric tons by the end of 2020. If the recycling processes are not in place, there would be 60 million tons of end-of-life PV modules lying in the landfills by 2050, that may not become a not-so-sustainable way of sourcing energy since all PV modules could contain certain amount of toxic substances. Currently in the United States, PV modules are categorized as general waste and can be disposed in landfills. However, potential leaching of toxic chemicals and materials, if any, from broken end-of-life modules may pose health or environmental risks. There is no standard procedure to remove samples from PV modules for chemical toxicity testing in the Toxicity Characteristic Leaching Procedure (TCLP) laboratories as per EPA 1311 standard. The main objective of this thesis is to develop an unbiased sampling approach for the TCLP testing of PV modules. The TCLP testing was concentrated only for the laminate part of the modules, as they are already existing recycling technologies for the frame and junction box components of PV modules. Four different sample removal methods have been applied to the laminates of five different module manufacturers: coring approach, cell-cut approach, strip-cut approach, and hybrid approach. These removed samples were sent to two different TCLP laboratories, and TCLP results were tested for repeatability within a lab and reproducibility between the labs. The pros and cons of each sample removal method have been explored and the influence of sample removal methods on the variability of TCLP results has been discussed. To reduce the variability of TCLP results to an acceptable level, additional improvements in the coring approach, the best of the four tested options, are still needed.
ContributorsLeslie, Joswin (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Kuitche, Joseph (Committee member) / Arizona State University (Publisher)
Created2018
Description
In the past, the photovoltaic (PV) modules were typically constructed with glass superstrate containing cerium oxide and EVA (ethylene vinyl acetate) encapsulant containing UV absorbing additives. However, in the current industry, the PV modules are generally constructed without cerium oxide in the glass and UV absorbing additives in EVA to increase quantum efficiency of crystalline silicon solar cells in the UV regions. This new approach is expected to boost the initial power output of the modules and reduce the long-term encapsulant browning issues. However, this new approach could lead to other durability and reliability issues such as delamination of encapsulant by damaging interfacial bonds, destruction of antireflection coating on solar cells and even breakage of polymeric backbone of EVA. This work compares the durability and reliability issues of PV modules having glass without cerium oxide and EVA with (aka, UVcut or UVC) and without (aka, UVpass or UVP) UV absorbing additives. In addition, modules with UVP front and UVC back EVA have also been investigated (aka, UVhybrid or UVH). The mini-modules with nine split cells used in this work were fabricated at ASU’s Photovoltaic Reliability Laboratory. The durability and reliability caused by three stress variables have been investigated and the three variables are temperature, humidity/oxygen and UV dosage. The influence of up to 800 kWh/m2 UV dosage has been investigated at various dosage levels. Many material and device characterizations have been performed to ascertain the degradation modes and effects. The UVC modules showed encapsulant discoloration at the cell centers as expected but the UVH modules showed a ring-shaped encapsulant discoloration close to the cell edges as evidenced in the UV fluorescence (UVF) imaging study. The PV modules containing UVP on both sides of cells with limited access to humidity or oxygen through backsheet (covered backsheet with adhesive aluminum tape) seem to experience encapsulant delamination as evidenced in the UVF images. Plausible explanations for these observations have been presented.
ContributorsArularasu, Pooja (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Mu, Bin (Thesis advisor) / Varman, Arul M (Committee member) / Arizona State University (Publisher)
Created2019
Description
Global photovoltaic (PV) module installation in 2018 is estimated to exceed 100 GW, and crystalline Si (c-Si) solar cell-based modules have a share more than 90% of the global PV market. To reduce the social cost of PV electricity, further developments in reliability of solar panels are expected. These will lead to realize longer module lifetime and reduced levelized cost of energy. As many as 86 failure modes are observed in PV modules [1] and series resistance increase is one of the major durability issues of all. Series resistance constitutes emitter sheet resistance, metal-semiconductor contact resistance, and resistance across the metal-solder ribbon. Solder bond degradation at the cell interconnect is one of the primary causes for increase in series resistance, which is also considered to be an invisible defect [1]. Combination of intermetallic compounds (IMC) formation during soldering and their growth due to solid state diffusion over its lifetime result in formation of weak interfaces between the solar cell and the interconnect. Thermal cycling under regular operating conditions induce thermo-mechanical fatigue over these weak interfaces resulting in contact reduction or loss. Contact reduction or loss leads to increase in series resistance which further manifests into power and fill factor loss. The degree of intermixing of metallic interfaces and contact loss depends on climatic conditions as temperature and humidity (moisture ingression into the PV module laminate) play a vital role in reaction kinetics of these layers. Modules from Arizona and Florida served as a good sample set to analyze the effects of hot and humid climatic conditions respectively. The results obtained in the current thesis quantifies the thickness of IMC formation from SEM-EDS profiles, where similar modules obtained from different climatic conditions were compared. The results indicate the thickness of the IMC and detachment degree to be growing with age and operating temperatures of the module. This can be seen in CuxSny IMC which is thicker in the case of Arizona module. The results obtained from FL
ii
aged modules also show that humidity accelerates the formation of IMC as they showed thicker AgxSny layer and weak interconnect-contact interfaces as compared to Arizona modules. It is also shown that climatic conditions have different effects on rate at which CuxSny and AgxSny intermetallic compounds are formed.
ii
aged modules also show that humidity accelerates the formation of IMC as they showed thicker AgxSny layer and weak interconnect-contact interfaces as compared to Arizona modules. It is also shown that climatic conditions have different effects on rate at which CuxSny and AgxSny intermetallic compounds are formed.
ContributorsBuddha, Viswa Sai Pavan (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Alford, Terry (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2018
Description
This is a two-part thesis.
Part 1 of this thesis investigates the influence of spatial temperature distribution on the accuracy of performance data of photovoltaic (PV) modules in outdoor conditions and provides physical approaches to improve the spatial temperature distribution of the test modules so an accurate performance data can be obtained in the field. Conventionally, during outdoor performance testing, a single thermocouple location is used on the backsheet or back glass of a test module. This study clearly indicates that there is a large spatial temperature difference between various thermocouple locations within a module. Two physical approaches or configurations were experimented to improve the spatial temperature uniformity: thermally insulating the inner and outer surface of the frame; backsheet and inner surface of the frame. All the data were compared with un-insulated conventional configuration. This study was performed in an array setup of six modules under two different preconditioning electrical configurations, Voc and MPPT over several clear sunny days. This investigation concludes that the best temperature uniformity and the most accurate I-V data can be obtained only by thermally insulating the inner and outer frame surfaces or by using the average of four thermocouple temperatures, as specified in IEC 61853-2, without any thermal insulation.
Part 2 of this thesis analyzes the field data obtained from old PV power plants using various statistical techniques to identify the most influential degradation modes on fielded PV modules in two different climates: hot-dry (Arizona); cold-dry (New York). Performance data and visual inspection data of 647 modules fielded in five different power plants were analyzed. Statistical tests including hypothesis testing were carried out to identify the I-V parameter(s) that are affected the most. The affected performance parameters (Isc, Voc, FF and Pmax) were then correlated with the defects to determine the most dominant defect affecting power degradation. Analysis indicates that the cell interconnect discoloration (or solder bond deterioration) is the dominant defect in hot-dry climate leading to series resistance increase and power loss, while encapsulant delamination is being the most dominant defect in cold-dry climate leading to cell mismatch and power loss.
Part 1 of this thesis investigates the influence of spatial temperature distribution on the accuracy of performance data of photovoltaic (PV) modules in outdoor conditions and provides physical approaches to improve the spatial temperature distribution of the test modules so an accurate performance data can be obtained in the field. Conventionally, during outdoor performance testing, a single thermocouple location is used on the backsheet or back glass of a test module. This study clearly indicates that there is a large spatial temperature difference between various thermocouple locations within a module. Two physical approaches or configurations were experimented to improve the spatial temperature uniformity: thermally insulating the inner and outer surface of the frame; backsheet and inner surface of the frame. All the data were compared with un-insulated conventional configuration. This study was performed in an array setup of six modules under two different preconditioning electrical configurations, Voc and MPPT over several clear sunny days. This investigation concludes that the best temperature uniformity and the most accurate I-V data can be obtained only by thermally insulating the inner and outer frame surfaces or by using the average of four thermocouple temperatures, as specified in IEC 61853-2, without any thermal insulation.
Part 2 of this thesis analyzes the field data obtained from old PV power plants using various statistical techniques to identify the most influential degradation modes on fielded PV modules in two different climates: hot-dry (Arizona); cold-dry (New York). Performance data and visual inspection data of 647 modules fielded in five different power plants were analyzed. Statistical tests including hypothesis testing were carried out to identify the I-V parameter(s) that are affected the most. The affected performance parameters (Isc, Voc, FF and Pmax) were then correlated with the defects to determine the most dominant defect affecting power degradation. Analysis indicates that the cell interconnect discoloration (or solder bond deterioration) is the dominant defect in hot-dry climate leading to series resistance increase and power loss, while encapsulant delamination is being the most dominant defect in cold-dry climate leading to cell mismatch and power loss.
ContributorsUmachandran, Neelesh (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Wang, Liping (Committee member) / Phelan, Patrick (Committee member) / Arizona State University (Publisher)
Created2015