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MESFETs are used in high frequency applications and are typically made from GaAs. Dr. Trevor Thornton designed a silicon-on-insulator MESFET \u2014 a cheaper alternative with competitive capabilities. This paper concerns the characterization and modeling of this device to exhibit its marketability as a CMOS integrated transistor. Overviews of the MESFET's

MESFETs are used in high frequency applications and are typically made from GaAs. Dr. Trevor Thornton designed a silicon-on-insulator MESFET \u2014 a cheaper alternative with competitive capabilities. This paper concerns the characterization and modeling of this device to exhibit its marketability as a CMOS integrated transistor. Overviews of the MESFET's history and DLTS (deep level transient spectroscopy) are offered.
ContributorsTerrell, Catherine Elaine (Author) / Thornton, Trevor (Thesis director) / Young, Alexander (Committee member) / Barrett, The Honors College (Contributor) / Electrical Engineering Program (Contributor)
Created2014-05
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An in depth look at the rhetoric behind the campus carry debate at the University of Texas at Austin. This thesis researched and examined primary sources from The Daily Texan and The Austin-American Statesman attempting to analyze what was at stake for both sides of the argument and what the

An in depth look at the rhetoric behind the campus carry debate at the University of Texas at Austin. This thesis researched and examined primary sources from The Daily Texan and The Austin-American Statesman attempting to analyze what was at stake for both sides of the argument and what the most effective rhetorical tool was.

ContributorsBlumstein, Cory Joshua (Author) / Young, Alexander (Thesis director) / O'Flaherty, Katherine (Committee member) / School of Criminology and Criminal Justice (Contributor) / School of Public Affairs (Contributor, Contributor) / Barrett, The Honors College (Contributor)
Created2021-05
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Recent years have seen fin field effect transistors (finFETs) dominate modern complementary metal oxide semiconductor (CMOS) processes, [1][2], e.g., at the sub 20 nm technology nodes, as they alleviate short channel effects, provide lower leakage, and enable some continued VDD scaling. However, a realistic finFET based predictive process design kit

Recent years have seen fin field effect transistors (finFETs) dominate modern complementary metal oxide semiconductor (CMOS) processes, [1][2], e.g., at the sub 20 nm technology nodes, as they alleviate short channel effects, provide lower leakage, and enable some continued VDD scaling. However, a realistic finFET based predictive process design kit (PDK) that supports investigation into both circuit and physical design, encompassing all aspects of digital design, for academic use has been unavailable. While the finFET based FreePDK15 was supplemented with a standard cell library, it lacked full physical verification (LVS) and parasitic extraction at the time [3][4]. Consequently, the only available sub 45 nm educational PDKs are the planar CMOS based Synopsys 32/28 nm and FreePDK45 (45 nm PDK) [5][6]. The cell libraries available for those processes are not realistic since they use large cell heights, in contrast to recent industry trends. Additionally, the SRAM rules and cells provided by these PDKs are not realistic. Because finFETs have a 3D structure, which affects transistor density, using planar libraries scaled to sub 22 nm dimensions for research is likely to give poor accuracy.

Commercial libraries and PDKs, especially for advanced nodes, are often difficult to obtain for academic use, and access to the actual physical layouts is even more restricted. Furthermore, the necessary non disclosure agreements (NDAs) are un manageable for large university classes and the plethora of design rules can distract from the key points. NDAs also make it difficult for the publication of physical design as these may disclose proprietary design rules and structures.

This work focuses on the development of realistic PDKs for academic use that overcome these limitations. These PDKs, developed for the N7 and N5 nodes, even before 7 nm and 5 nm processes were available in industry, are thus predictive. The predictions have been based on publications of the continually improving lithography, as well as estimates of what would be available at N7 and N5. For the most part, these assumptions have been accurate with regards to N7, except for the expectation that extreme ultraviolet (EUV) lithography would be widely available, which has turned out to be optimistic.
ContributorsVashishtha, Vinay (Author) / Clark, Lawrence T. (Thesis advisor) / Allee, David R. (Committee member) / Ogras, Umit Y. (Committee member) / Seo, Jae sun (Committee member) / Arizona State University (Publisher)
Created2019
Description
The "no compromise" gun rights movement, which advocates against any form of gun control and the absolute right to keep and bear arms, and white Christian nationalism, a cultural framework built on the belief that Christianity should serve as the foundation of the American government, have both recently come to

The "no compromise" gun rights movement, which advocates against any form of gun control and the absolute right to keep and bear arms, and white Christian nationalism, a cultural framework built on the belief that Christianity should serve as the foundation of the American government, have both recently come to the national political forefront. The connection between these two movements runs deep: white Christian nationalism informs the religious rhetoric of the "no compromise" movement. To understand why this is, the existing scholarship argues that white Christian nationalists advocate against gun control because they believe the Second Amendment is divinely inspired and that gun control does not address what they perceive to be a moral decline in the United States. However, these explanations are insufficient to fully grasp the inherent importance of guns and gun rights to white Christian nationalists. Therefore, I examine the specific roles that guns play in their worldview.
ContributorsMyers, Patrick (Author) / Young, Alexander (Thesis director) / Livingston, Lindsay (Committee member) / Barrett, The Honors College (Contributor) / School of Accountancy (Contributor)
Created2023-12