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- All Subjects: Guitar music
ContributorsDaval, Charles (Performer) / ASU Library. Music Library (Publisher)
Created2018-03-26
DescriptionThe purpose of this project is to explore the influence of folk music in guitar compositions by Manuel Ponce from 1923 to 1932. It focuses on his Tres canciones populares mexicanas and Tropico and Rumba.
ContributorsGarcia Santos, Arnoldo (Author) / Koonce, Frank (Thesis advisor) / Rogers, Rodney (Committee member) / Rotaru, Catalin (Committee member) / Arizona State University (Publisher)
Created2014
Description
High speed current-steering DACs with high linearity are needed in today's applications such as wired and wireless communications, instrumentation, radar, and other direct digital synthesis (DDS) applications. However, a trade-off exists between the speed and resolution of Nyquist rate current-steering DACs. As the resolution increases, more transistor area is required to meet matching requirements for optimal linearity and thus, the overall speed of the DAC is limited.
In this thesis work, a 12-bit current-steering DAC was designed with current sources scaled below the required matching size to decrease the area and increase the overall speed of the DAC. By scaling the current sources, however, errors due to random mismatch between current sources will arise and additional calibration hardware is necessary to ensure 12-bit linearity. This work presents how to implement a self-calibration DAC that works to fix amplitude errors while maintaining a lower overall area. Additionally, the DAC designed in this thesis investigates the implementation feasibility of a data-interleaved architecture. Data interleaving can increase the total bandwidth of the DACs by 2 with an increase in SQNR by an additional 3 dB.
The final results show that the calibration method can effectively improve the linearity of the DAC. The DAC is able to run up to 400 MSPS frequencies with a 75 dB SFDR performance and above 87 dB SFDR performance at update rates of 200 MSPS.
In this thesis work, a 12-bit current-steering DAC was designed with current sources scaled below the required matching size to decrease the area and increase the overall speed of the DAC. By scaling the current sources, however, errors due to random mismatch between current sources will arise and additional calibration hardware is necessary to ensure 12-bit linearity. This work presents how to implement a self-calibration DAC that works to fix amplitude errors while maintaining a lower overall area. Additionally, the DAC designed in this thesis investigates the implementation feasibility of a data-interleaved architecture. Data interleaving can increase the total bandwidth of the DACs by 2 with an increase in SQNR by an additional 3 dB.
The final results show that the calibration method can effectively improve the linearity of the DAC. The DAC is able to run up to 400 MSPS frequencies with a 75 dB SFDR performance and above 87 dB SFDR performance at update rates of 200 MSPS.
ContributorsJankunas, Benjamin (Author) / Bakkaloglu, Bertan (Thesis advisor) / Kitchen, Jennifer (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2014
Description
Fisheye cameras are special cameras that have a much larger field of view compared to
conventional cameras. The large field of view comes at a price of non-linear distortions
introduced near the boundaries of the images captured by such cameras. Despite this
drawback, they are being used increasingly in many applications of computer vision,
robotics, reconnaissance, astrophotography, surveillance and automotive applications.
The images captured from such cameras can be corrected for their distortion if the
cameras are calibrated and the distortion function is determined. Calibration also allows
fisheye cameras to be used in tasks involving metric scene measurement, metric
scene reconstruction and other simultaneous localization and mapping (SLAM) algorithms.
This thesis presents a calibration toolbox (FisheyeCDC Toolbox) that implements a collection of some of the most widely used techniques for calibration of fisheye cameras under one package. This enables an inexperienced user to calibrate his/her own camera without the need for a theoretical understanding about computer vision and camera calibration. This thesis also explores some of the applications of calibration such as distortion correction and 3D reconstruction.
conventional cameras. The large field of view comes at a price of non-linear distortions
introduced near the boundaries of the images captured by such cameras. Despite this
drawback, they are being used increasingly in many applications of computer vision,
robotics, reconnaissance, astrophotography, surveillance and automotive applications.
The images captured from such cameras can be corrected for their distortion if the
cameras are calibrated and the distortion function is determined. Calibration also allows
fisheye cameras to be used in tasks involving metric scene measurement, metric
scene reconstruction and other simultaneous localization and mapping (SLAM) algorithms.
This thesis presents a calibration toolbox (FisheyeCDC Toolbox) that implements a collection of some of the most widely used techniques for calibration of fisheye cameras under one package. This enables an inexperienced user to calibrate his/her own camera without the need for a theoretical understanding about computer vision and camera calibration. This thesis also explores some of the applications of calibration such as distortion correction and 3D reconstruction.
ContributorsKashyap Takmul Purushothama Raju, Vinay (Author) / Karam, Lina (Thesis advisor) / Turaga, Pavan (Committee member) / Tepedelenlioğlu, Cihan (Committee member) / Arizona State University (Publisher)
Created2014
Description
Camera calibration has applications in the fields of robotic motion, geographic mapping, semiconductor defect characterization, and many more. This thesis considers camera calibration for the purpose of high accuracy three-dimensional reconstruction when characterizing ball grid arrays within the semiconductor industry. Bouguet's calibration method is used following a set of criteria with the purpose of studying the method's performance according to newly proposed standards. The performance of the camera calibration method is currently measured using standards such as pixel error and computational time. This thesis proposes the use of standard deviation of the intrinsic parameter estimation within a Monte Carlo simulation as a new standard of performance measure. It specifically shows that the standard deviation decreases based on the increased number of images input into the calibration routine. It is also shown that the default thresholds of the non-linear maximum likelihood estimation problem of the calibration method require change in order to improve computational time performance; however, the accuracy lost is negligable even for high accuracy requirements such as ball grid array characterization.
ContributorsStenger, Nickolas Arthur (Author) / Papandreou-Suppappola, Antonia (Thesis advisor) / Kovvali, Narayan (Committee member) / Tepedelenlioğlu, Cihan (Committee member) / Arizona State University (Publisher)
Created2012
Description
RF transmitter manufacturers go to great extremes and expense to ensure that their product meets the RF output power requirements for which they are designed. Therefore, there is an urgent need for in-field monitoring of output power and gain to bring down the costs of RF transceiver testing and ensure product reliability. Built-in self-test (BIST) techniques can perform such monitoring without the requirement for expensive RF test equipment. In most BIST techniques, on-chip resources, such as peak detectors, power detectors, or envelope detectors are used along with frequency down conversion to analyze the output of the design under test (DUT). However, this conversion circuitry is subject to similar process, voltage, and temperature (PVT) variations as the DUT and affects the measurement accuracy. So, it is important to monitor BIST performance over time, voltage and temperature, such that accurate in-field measurements can be performed.
In this research, a multistep BIST solution using only baseband signals for test analysis is presented. An on-chip signal generation circuit, which is robust with respect to time, supply voltage, and temperature variations is used for self-calibration of the BIST system before the DUT measurement. Using mathematical modelling, an analytical expression for the output signal is derived first and then test signals are devised to extract the output power of the DUT. By utilizing a standard 180nm IBM7RF CMOS process, a 2.4GHz low power RF IC incorporated with the proposed BIST circuitry and on-chip test signal source is designed and fabricated. Experimental results are presented, which show this BIST method can monitor the DUT’s output power with +/- 0.35dB accuracy over a 20dB power dynamic range.
In this research, a multistep BIST solution using only baseband signals for test analysis is presented. An on-chip signal generation circuit, which is robust with respect to time, supply voltage, and temperature variations is used for self-calibration of the BIST system before the DUT measurement. Using mathematical modelling, an analytical expression for the output signal is derived first and then test signals are devised to extract the output power of the DUT. By utilizing a standard 180nm IBM7RF CMOS process, a 2.4GHz low power RF IC incorporated with the proposed BIST circuitry and on-chip test signal source is designed and fabricated. Experimental results are presented, which show this BIST method can monitor the DUT’s output power with +/- 0.35dB accuracy over a 20dB power dynamic range.
ContributorsGangula, Sudheer Kumar Reddy (Author) / Kitchen, Jennifer (Thesis advisor) / Ozev, Sule (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
ContributorsKotronakis, Dimitris (Performer) / ASU Library. Music Library (Publisher)
Created2018-03-01
Description
As integrated technologies are scaling down, there is an increasing trend in the
process,voltage and temperature (PVT) variations of highly integrated RF systems.
Accounting for these variations during the design phase requires tremendous amount
of time for prediction of RF performance and optimizing it accordingly. Thus, there
is an increasing gap between the need to relax the RF performance requirements at
the design phase for rapid development and the need to provide high performance
and low cost RF circuits that function with PVT variations. No matter how care-
fully designed, RF integrated circuits (ICs) manufactured with advanced technology
nodes necessitate lengthy post-production calibration and test cycles with expensive
RF test instruments. Hence design-for-test (DFT) is proposed for low-cost and fast
measurement of performance parameters during both post-production and in-eld op-
eration. For example, built-in self-test (BIST) is a DFT solution for low-cost on-chip
measurement of RF performance parameters. In this dissertation, three aspects of
automated test and calibration, including DFT mathematical model, BIST hardware
and built-in calibration are covered for RF front-end blocks.
First, the theoretical foundation of a post-production test of RF integrated phased
array antennas is proposed by developing the mathematical model to measure gain
and phase mismatches between antenna elements without any electrical contact. The
proposed technique is fast, cost-efficient and uses near-field measurement of radiated
power from antennas hence, it requires single test setup, it has easy implementation
and it is short in time which makes it viable for industrialized high volume integrated
IC production test.
Second, a BIST model intended for the characterization of I/Q offset, gain and
phase mismatch of IQ transmitters without relying on external equipment is intro-
duced. The proposed BIST method is based on on-chip amplitude measurement as
in prior works however,here the variations in the BIST circuit do not affect the target
parameter estimation accuracy since measurements are designed to be relative. The
BIST circuit is implemented in 130nm technology and can be used for post-production
and in-field calibration.
Third, a programmable low noise amplifier (LNA) is proposed which is adaptable
to different application scenarios depending on the specification requirements. Its
performance is optimized with regards to required specifications e.g. distance, power
consumption, BER, data rate, etc.The statistical modeling is used to capture the
correlations among measured performance parameters and calibration modes for fast
adaptation. Machine learning technique is used to capture these non-linear correlations and build the probability distribution of a target parameter based on measurement results of the correlated parameters. The proposed concept is demonstrated by
embedding built-in tuning knobs in LNA design in 130nm technology. The tuning
knobs are carefully designed to provide independent combinations of important per-
formance parameters such as gain and linearity. Minimum number of switches are
used to provide the desired tuning range without a need for an external analog input.
process,voltage and temperature (PVT) variations of highly integrated RF systems.
Accounting for these variations during the design phase requires tremendous amount
of time for prediction of RF performance and optimizing it accordingly. Thus, there
is an increasing gap between the need to relax the RF performance requirements at
the design phase for rapid development and the need to provide high performance
and low cost RF circuits that function with PVT variations. No matter how care-
fully designed, RF integrated circuits (ICs) manufactured with advanced technology
nodes necessitate lengthy post-production calibration and test cycles with expensive
RF test instruments. Hence design-for-test (DFT) is proposed for low-cost and fast
measurement of performance parameters during both post-production and in-eld op-
eration. For example, built-in self-test (BIST) is a DFT solution for low-cost on-chip
measurement of RF performance parameters. In this dissertation, three aspects of
automated test and calibration, including DFT mathematical model, BIST hardware
and built-in calibration are covered for RF front-end blocks.
First, the theoretical foundation of a post-production test of RF integrated phased
array antennas is proposed by developing the mathematical model to measure gain
and phase mismatches between antenna elements without any electrical contact. The
proposed technique is fast, cost-efficient and uses near-field measurement of radiated
power from antennas hence, it requires single test setup, it has easy implementation
and it is short in time which makes it viable for industrialized high volume integrated
IC production test.
Second, a BIST model intended for the characterization of I/Q offset, gain and
phase mismatch of IQ transmitters without relying on external equipment is intro-
duced. The proposed BIST method is based on on-chip amplitude measurement as
in prior works however,here the variations in the BIST circuit do not affect the target
parameter estimation accuracy since measurements are designed to be relative. The
BIST circuit is implemented in 130nm technology and can be used for post-production
and in-field calibration.
Third, a programmable low noise amplifier (LNA) is proposed which is adaptable
to different application scenarios depending on the specification requirements. Its
performance is optimized with regards to required specifications e.g. distance, power
consumption, BER, data rate, etc.The statistical modeling is used to capture the
correlations among measured performance parameters and calibration modes for fast
adaptation. Machine learning technique is used to capture these non-linear correlations and build the probability distribution of a target parameter based on measurement results of the correlated parameters. The proposed concept is demonstrated by
embedding built-in tuning knobs in LNA design in 130nm technology. The tuning
knobs are carefully designed to provide independent combinations of important per-
formance parameters such as gain and linearity. Minimum number of switches are
used to provide the desired tuning range without a need for an external analog input.
ContributorsShafiee, Maryam (Author) / Ozev, Sule (Thesis advisor) / Diaz, Rodolfo (Committee member) / Ogras, Umit Y. (Committee member) / Bakkaloglu, Bertan (Committee member) / Arizona State University (Publisher)
Created2018
ContributorsDavin, Colin (Performer) / ASU Library. Music Library (Publisher)
Created2018-10-05
Description
In this work, a 12-bit ADC with three types of calibration is proposed for high speed security applications as well as a precision application. This converter performs for both applications because it satisfies all the necessary specifications such as minimal device mismatch and offset, programmability to decrease aging effects, high SNR for increased ENOB and fast conversion rate. The designed converter implements three types of calibration necessary for offset and gain error, including: a correlated double sampling integrator used in the first stage of the ADC, a power up auto zero technique implemented in the digital code to store any offset and subtract out if necessary, and an automatic startup and manual calibration to control the common mode voltages. The proposed ADC was designed in Intel’s 10nm technology. This ADC is designed to monitor DC voltages for the precision and high speed applications. The conversion rate of the analog to digital converter is programmable to 7µs or 910ns, depending on the precision or high speed application, respectively. The range of the input and reference supply is 0 to 1.25V. The ADC is designed in Intel 10nm technology using a 1.8V supply consuming an area of 0.0705mm2. This thesis explores challenges of designing a dual-purpose analog to digital converter, which include: 1.) increased offset in 10nm technology, 2.) dual application ADC that can be accurate and fast, 3.) reducing the parasitic capacitance of the ADC, and 4.) gain error that occurs in ADCs.
ContributorsSchmelter, Brooke (Author) / Bakkaloglu, Bertan (Thesis advisor) / Ogras, Umit Y. (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2017