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Description
Nonregular screening designs can be an economical alternative to traditional resolution IV 2^(k-p) fractional factorials. Recently 16-run nonregular designs, referred to as no-confounding designs, were introduced in the literature. These designs have the property that no pair of main effect (ME) and two-factor interaction (2FI) estimates are completely confounded. In

Nonregular screening designs can be an economical alternative to traditional resolution IV 2^(k-p) fractional factorials. Recently 16-run nonregular designs, referred to as no-confounding designs, were introduced in the literature. These designs have the property that no pair of main effect (ME) and two-factor interaction (2FI) estimates are completely confounded. In this dissertation, orthogonal arrays were evaluated with many popular design-ranking criteria in order to identify optimal 20-run and 24-run no-confounding designs. Monte Carlo simulation was used to empirically assess the model fitting effectiveness of the recommended no-confounding designs. The results of the simulation demonstrated that these new designs, particularly the 24-run designs, are successful at detecting active effects over 95% of the time given sufficient model effect sparsity. The final chapter presents a screening design selection methodology, based on decision trees, to aid in the selection of a screening design from a list of published options. The methodology determines which of a candidate set of screening designs has the lowest expected experimental cost.
ContributorsStone, Brian (Author) / Montgomery, Douglas C. (Thesis advisor) / Silvestrini, Rachel T. (Committee member) / Fowler, John W (Committee member) / Borror, Connie M. (Committee member) / Arizona State University (Publisher)
Created2013
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Description
No-confounding designs (NC) in 16 runs for 6, 7, and 8 factors are non-regular fractional factorial designs that have been suggested as attractive alternatives to the regular minimum aberration resolution IV designs because they do not completely confound any two-factor interactions with each other. These designs allow for potential estimation

No-confounding designs (NC) in 16 runs for 6, 7, and 8 factors are non-regular fractional factorial designs that have been suggested as attractive alternatives to the regular minimum aberration resolution IV designs because they do not completely confound any two-factor interactions with each other. These designs allow for potential estimation of main effects and a few two-factor interactions without the need for follow-up experimentation. Analysis methods for non-regular designs is an area of ongoing research, because standard variable selection techniques such as stepwise regression may not always be the best approach. The current work investigates the use of the Dantzig selector for analyzing no-confounding designs. Through a series of examples it shows that this technique is very effective for identifying the set of active factors in no-confounding designs when there are three of four active main effects and up to two active two-factor interactions.

To evaluate the performance of Dantzig selector, a simulation study was conducted and the results based on the percentage of type II errors are analyzed. Also, another alternative for 6 factor NC design, called the Alternate No-confounding design in six factors is introduced in this study. The performance of this Alternate NC design in 6 factors is then evaluated by using Dantzig selector as an analysis method. Lastly, a section is dedicated to comparing the performance of NC-6 and Alternate NC-6 designs.
ContributorsKrishnamoorthy, Archana (Author) / Montgomery, Douglas C. (Thesis advisor) / Borror, Connie (Thesis advisor) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2014
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Description
Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research,

Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research, a new three dimensional model for tolerance transfer in manufacturing process planning is presented that is user friendly in the sense that it is built upon the Coordinate Measuring Machine (CMM) readings that are readily available in any decent manufacturing facility. This model can take care of datum reference change between non orthogonal datums (squeezed datums), non-linearly oriented datums (twisted datums) etc. Graph theoretic approach based upon ACIS, C++ and MFC is laid out to facilitate its implementation for automation of the model. A totally new approach to determining dimensions and tolerances for the manufacturing process plan is also presented. Secondly, a new statistical model for the statistical tolerance analysis based upon joint probability distribution of the trivariate normal distributed variables is presented. 4-D probability Maps have been developed in which the probability value of a point in space is represented by the size of the marker and the associated color. Points inside the part map represent the pass percentage for parts manufactured. The effect of refinement with form and orientation tolerance is highlighted by calculating the change in pass percentage with the pass percentage for size tolerance only. Delaunay triangulation and ray tracing algorithms have been used to automate the process of identifying the points inside and outside the part map. Proof of concept software has been implemented to demonstrate this model and to determine pass percentages for various cases. The model is further extended to assemblies by employing convolution algorithms on two trivariate statistical distributions to arrive at the statistical distribution of the assembly. Map generated by using Minkowski Sum techniques on the individual part maps is superimposed on the probability point cloud resulting from convolution. Delaunay triangulation and ray tracing algorithms are employed to determine the assembleability percentages for the assembly.
ContributorsKhan, M Nadeem Shafi (Author) / Phelan, Patrick E (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Farin, Gerald (Committee member) / Roberts, Chell (Committee member) / Henderson, Mark (Committee member) / Arizona State University (Publisher)
Created2011