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- Creators: Electrical Engineering Program
Description
Buck converters are a class of switched-mode power converters often used to step down DC input voltages to a lower DC output voltage. These converters naturally produce a current and voltage ripple at their output due to their switching action. Traditional methods of reducing this ripple have involved adding large discrete inductors and capacitors to filter the ripple, but large discrete components cannot be integrated onto chips. As an alternative to using passive filtering components, this project investigates the use of active ripple cancellation to reduce the peak output ripple. Hysteretic controlled buck converters were chosen for their simplicity of design and fast transient response. The proposed cancellation circuits sense the output ripple of the buck converter and inject an equal ripple exactly out of phase with the sensed ripple. Both current-mode and voltage-mode feedback loops are simulated, and the effectiveness of each cancellation circuit is examined. Results show that integrated active ripple cancellation circuits offer a promising substitute for large discrete filters.
ContributorsWang, Ziyan (Author) / Bakkaloglu, Bertan (Thesis director) / Kitchen, Jennifer (Committee member) / Electrical Engineering Program (Contributor) / Barrett, The Honors College (Contributor)
Created2017-12
Description
This thesis outlines the hand-held memory characterization testing system that is to be created into a PCB (printed circuit board). The circuit is designed to apply voltages diagonally through a RRAM cell (32x32 memory array). The purpose of this sweep across the RRAM is to measure and calculate the high and low resistance state value over a specified amount of testing cycles. With each cell having a unique output of high and low resistance states a unique characterization of each RRAM cell is able to be developed. Once the memory is characterized, the specific RRAM cell that was tested is then able to be used in a varying amount of applications for different things based on its uniqueness. Due to an inability to procure a packaged RRAM cell, a Mock-RRAM was instead designed in order to emulate the same behavior found in a RRAM cell.
The final testing circuit and Mock-RRAM are varied and complex but come together to be able to produce a measured value of the high resistance and low resistance state. This is done by the Arduino autonomously digitizing the anode voltage, cathode voltage, and output voltage. A ramp voltage that sweeps from 1V to -1V is applied to the Mock-RRAM acting as an input. This ramp voltage is then later defined as the anode voltage which is just one of the two nodes connected to the Mock-RRAM. The cathode voltage is defined as the other node at which the voltage drops across the Mock-RRAM. Using these three voltages as input to the Arduino, the Mock-RRAM path resistance is able to be calculated at any given point in time. Conducting many test cycles and calculating the high and low resistance values allows for a graph to be developed of the chaotic variation of resistance state values over time. This chaotic variation can then be analyzed further in the future in order to better predict trends and characterize the RRAM cell that was tested.
Furthermore, the interchangeability of many devices on the PCB allows for the testing system to do more in the future. Ports have been added to the final PCB in order to connect a packaged RRAM cell. This will allow for the characterization of a real RRAM memory cell later down the line rather than a Mock-RRAM as emulation. Due to the autonomous testing, very few human intervention is needed which makes this board a great baseline for others in the future looking to add to it and collect larger pools of data.
The final testing circuit and Mock-RRAM are varied and complex but come together to be able to produce a measured value of the high resistance and low resistance state. This is done by the Arduino autonomously digitizing the anode voltage, cathode voltage, and output voltage. A ramp voltage that sweeps from 1V to -1V is applied to the Mock-RRAM acting as an input. This ramp voltage is then later defined as the anode voltage which is just one of the two nodes connected to the Mock-RRAM. The cathode voltage is defined as the other node at which the voltage drops across the Mock-RRAM. Using these three voltages as input to the Arduino, the Mock-RRAM path resistance is able to be calculated at any given point in time. Conducting many test cycles and calculating the high and low resistance values allows for a graph to be developed of the chaotic variation of resistance state values over time. This chaotic variation can then be analyzed further in the future in order to better predict trends and characterize the RRAM cell that was tested.
Furthermore, the interchangeability of many devices on the PCB allows for the testing system to do more in the future. Ports have been added to the final PCB in order to connect a packaged RRAM cell. This will allow for the characterization of a real RRAM memory cell later down the line rather than a Mock-RRAM as emulation. Due to the autonomous testing, very few human intervention is needed which makes this board a great baseline for others in the future looking to add to it and collect larger pools of data.
ContributorsDobrin, Ryan Christopher (Co-author) / Halden, Matthew (Co-author) / Hall, Tanner (Co-author) / Barnaby, Hugh (Thesis director) / Kitchen, Jennifer (Committee member) / Electrical Engineering Program (Contributor, Contributor) / Barrett, The Honors College (Contributor)
Created2019-05
Description
Every engineer is responsible for completing a capstone project as a culmination of accredited university learning to demonstrate technical knowledge and enhance interpersonal skills, like teamwork, communication, time management, and problem solving. This project, with three or four engineers working together in a group, emphasizes not only the importance of technical skills acquired through laboratory procedures and coursework, but the significance of soft skills as one transitions from a university to a professional workplace; it also enhances the understanding of an engineer's obligation to ethically improve society by harnessing technical knowledge to bring about change. The CC2541 Smart SensorTag is a device manufactured by Texas Instruments that focuses on the use of wireless sensors to create low energy applications, or apps; it is equipped with Bluetooth Smart, which enables it to communicate wirelessly with similar devices like smart phones and computers, assisting greatly in app development. The device contains six built-in sensors, which can be utilized to track and log personal data in real-time; these sensors include a gyroscope, accelerometer, humidifier, thermometer, barometer, and magnetometer. By combining the data obtained through the sensors with the ability to communicate wirelessly, the SensorTag can be used to develop apps in multiple fields, including fitness, recreation, health, safety, and more. Team SensorTag chose to focus on health and safety issues to complete its capstone project, creating applications intended for use by senior citizens who live alone or in assisted care homes. Using the SensorTag's ability to track multiple local variables, the team worked to collect data that verified the accuracy and quality of the sensors through repeated experimental trials. Once the sensors were tested, the team developed applications accessible via smart phones or computers to trigger an alarm and send an alert via vibration, e-mail, or Tweet if the SensorTag detects a fall. The fall detection service utilizes the accelerometer and gyroscope sensors with the hope that such a system will prevent severe injuries among the elderly, allow them to function more independently, and improve their quality of life, which is the obligation of engineers to better through their work.
ContributorsMartin, Katherine Julia (Author) / Thornton, Trevor (Thesis director) / Goryll, Michael (Committee member) / Electrical Engineering Program (Contributor) / School of Film, Dance and Theatre (Contributor) / Barrett, The Honors College (Contributor)
Created2015-12
Description
Analog to Digital Converters (ADCs) are a critical component in modern circuit applications. ADCs are used in virtually every application in which a digital circuit is interacting with data from the real world, ranging from commercial applications to crucial military and aerospace applications, and are especially important when interacting with sensors that observe environmental factors. Due to the critical nature of these converters, as well as the vast range of environments in which they are used, it is important that they accurately sample data regardless of environmental factors. These environmental factors range from input noise and power supply variations to temperature and radiation, and it is important to know how each may affect the accuracy of the resulting data when designing circuits that depend upon the data from these ADCs. These environmental factors are considered hostile environments, as they each generally have a negative effect on the operation of an ADC. This thesis seeks to investigate the effects of several of these hostile environmental variables on the performance of analog to digital converters. Three different analog to digital converters with similar specifications were selected and analyzed under common hostile environments. Data was collected on multiple copies of an ADC and averaged together to analyze the results using multiple characteristics of converter performance. Performance metrics were obtained across a range of frequencies, input noise, input signal offsets, power supply voltages, and temperatures. The obtained results showed a clear decrease in performance farther from a room temperature environment, but the results for several other environmental variables showed either no significant correlation or resulted in inconclusive data.
ContributorsSwanson, Taylor Catherine (Co-author) / Millman, Hershel (Co-author) / Barnaby, Hugh (Thesis director) / Garrity, Douglas (Committee member) / Electrical Engineering Program (Contributor, Contributor) / Barrett, The Honors College (Contributor)
Created2019-05