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Description
Potential induced degradation (PID) due to high system voltages is one of the major degradation mechanisms in photovoltaic (PV) modules, adversely affecting their performance due to the combined effects of the following factors: system voltage, superstrate/glass surface conductivity, encapsulant conductivity, silicon nitride anti-reflection coating property and interface property (glass/encapsulant; encapsulant/cell;

Potential induced degradation (PID) due to high system voltages is one of the major degradation mechanisms in photovoltaic (PV) modules, adversely affecting their performance due to the combined effects of the following factors: system voltage, superstrate/glass surface conductivity, encapsulant conductivity, silicon nitride anti-reflection coating property and interface property (glass/encapsulant; encapsulant/cell; encapsulant/backsheet). Previous studies carried out at ASU's Photovoltaic Reliability Laboratory (ASU-PRL) showed that only negative voltage bias (positive grounded systems) adversely affects the performance of commonly available crystalline silicon modules. In previous studies, the surface conductivity of the glass surface was obtained using either conductive carbon layer extending from the glass surface to the frame or humidity inside an environmental chamber. This thesis investigates the influence of glass surface conductivity disruption on PV modules. In this study, conductive carbon was applied only on the module's glass surface without extending to the frame and the surface conductivity was disrupted (no carbon layer) at 2cm distance from the periphery of frame inner edges. This study was carried out under dry heat at two different temperatures (60 °C and 85 °C) and three different negative bias voltages (-300V, -400V, and -600V). To replicate closeness to the field conditions, half of the selected modules were pre-stressed under damp heat for 1000 hours (DH 1000) and the remaining half under 200 hours of thermal cycling (TC 200). When the surface continuity was disrupted by maintaining a 2 cm gap from the frame to the edge of the conductive layer, as demonstrated in this study, the degradation was found to be absent or negligibly small even after 35 hours of negative bias at elevated temperatures. This preliminary study appears to indicate that the modules could become immune to PID losses if the continuity of the glass surface conductivity is disrupted at the inside boundary of the frame. The surface conductivity of the glass, due to water layer formation in a humid condition, close to the frame could be disrupted just by applying a water repelling (hydrophobic) but high transmittance surface coating (such as Teflon) or modifying the frame/glass edges with water repellent properties.
ContributorsTatapudi, Sai Ravi Vasista (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2012
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Description
This is a two-part thesis: Part 1 of this thesis tests and validates the methodology and mathematical models of the International Electrotechnical Commission (IEC) 61853-2 standard for the measurement of angle of incidence (AOI) effects on photovoltaic modules. Flat-plate photovoltaic modules in the field operate under a wide range of

This is a two-part thesis: Part 1 of this thesis tests and validates the methodology and mathematical models of the International Electrotechnical Commission (IEC) 61853-2 standard for the measurement of angle of incidence (AOI) effects on photovoltaic modules. Flat-plate photovoltaic modules in the field operate under a wide range of environmental conditions. The purpose of IEC 61853-2 is to characterize photovoltaic modules' performance under specific environmental conditions. Part 1 of this report focuses specifically on AOI. To accurately test and validate IEC 61853-2 standard for measuring AOI, meticulous experimental setup and test procedures were followed. Modules of five different photovoltaic technology types with glass superstrates were tested. Test results show practically identical relative light transmission plots for all five test modules. The experimental results were compared to theoretical and empirical models for relative light transmission of air-glass interface. IEC 61853-2 states "for the flat glass superstrate modules, the AOI test does not need to be performed; rather, the data of a flat glass air interface can be used." The results obtained in this thesis validate this statement. This work was performed in collaboration with another Master of Science student (Surynarayana Janakeeraman) and the test results are presented in two masters theses. Part 2 of this thesis is to develop non-intrusive techniques to accurately measure the quantum efficiency (QE) of a single-junction crystalline silicon cell within a commercial module. This thesis will describe in detail all the equipment and conditions necessary to measure QE and discuss the factors which may influence this measurement. The ability to utilize a non-intrusive test to measure quantum efficiency of a cell within a module is extremely beneficial for reliability testing of commercial modules. Detailed methodologies for this innovative test procedure are not widely available in industry because equipment and measurement techniques have not been explored extensively. This paper will provide a literature review describing relevant theories and measurement techniques related to measuring the QE of a cell within a module. The testing methodology and necessary equipment will be described in detail. Results and conclusions provide the overall accuracy of the measurements and discuss the parameters affecting these measurements.
ContributorsKnisely, Brett (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Macia, Narciso (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Infant mortality rate of field deployed photovoltaic (PV) modules may be expected to be higher than that estimated by standard qualification tests. The reason for increased failure rates may be attributed to the high system voltages. High voltages (HV) in grid connected modules induce additional stress factors that cause new

Infant mortality rate of field deployed photovoltaic (PV) modules may be expected to be higher than that estimated by standard qualification tests. The reason for increased failure rates may be attributed to the high system voltages. High voltages (HV) in grid connected modules induce additional stress factors that cause new degradation mechanisms. These new degradation mechanisms are not recognized by qualification stress tests. To study and model the effect of high system voltages, recently, potential induced degradation (PID) test method has been introduced. Using PID studies, it has been reported that high voltage failure rates are essentially due to increased leakage currents from active semiconducting layer to the grounded module frame, through encapsulant and/or glass. This project involved designing and commissioning of a new PID test bed at Photovoltaic Reliability Laboratory (PRL) of Arizona State University (ASU) to study the mechanisms of HV induced degradation. In this study, PID stress tests have been performed on accelerated stress modules, in addition to fresh modules of crystalline silicon technology. Accelerated stressing includes thermal cycling (TC200 cycles) and damp heat (1000 hours) tests as per IEC 61215. Failure rates in field deployed modules that are exposed to long term weather conditions are better simulated by conducting HV tests on prior accelerated stress tested modules. The PID testing was performed in 3 phases on a set of 5 mono crystalline silicon modules. In Phase-I of PID test, a positive bias of +600 V was applied, between shorted leads and frame of each module, on 3 modules with conducting carbon coating on glass superstrate. The 3 module set was comprised of: 1 fresh control, TC200 and DH1000. The PID test was conducted in an environmental chamber by stressing the modules at 85°C, for 35 hours with an intermittent evaluation for Arrhenius effects. In the Phase-II, a negative bias of -600 V was applied on a set of 3 modules in the chamber as defined above. The 3 module set in phase-II was comprised of: control module from phase-I, TC200 and DH1000. In the Phase-III, the same set of 3 modules which were used in the phase-II again subjected to +600 V bias to observe the recovery of lost power during the Phase-II. Electrical performance, infrared (IR) and electroluminescence (EL) were done prior and post PID testing. It was observed that high voltage positive bias in the first phase resulted in little
o power loss, high voltage negative bias in the second phase caused significant power loss and the high voltage positive bias in the third phase resulted in major recovery of lost power.
ContributorsGoranti, Sandhya (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Macia, Narciso (Committee member) / Arizona State University (Publisher)
Created2011
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Description
Photovoltaic (PV) modules undergo performance degradation depending on climatic conditions, applications, and system configurations. The performance degradation prediction of PV modules is primarily based on Accelerated Life Testing (ALT) procedures. In order to further strengthen the ALT process, additional investigation of the power degradation of field aged PV modules in

Photovoltaic (PV) modules undergo performance degradation depending on climatic conditions, applications, and system configurations. The performance degradation prediction of PV modules is primarily based on Accelerated Life Testing (ALT) procedures. In order to further strengthen the ALT process, additional investigation of the power degradation of field aged PV modules in various configurations is required. A detailed investigation of 1,900 field aged (12-18 years) PV modules deployed in a power plant application was conducted for this study. Analysis was based on the current-voltage (I-V) measurement of all the 1,900 modules individually. I-V curve data of individual modules formed the basis for calculating the performance degradation of the modules. The percentage performance degradation and rates of degradation were compared to an earlier study done at the same plant. The current research was primarily focused on identifying the extent of potential induced degradation (PID) of individual modules with reference to the negative ground potential. To investigate this, the arrangement and connection of the individual modules/strings was examined in detail. The study also examined the extent of underperformance of every series string due to performance mismatch of individual modules in that string. The power loss due to individual module degradation and module mismatch at string level was then compared to the rated value.
ContributorsJaspreet Singh (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2011
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Description
Photovoltaic (PV) module degradation is a well-known issue, however understanding the mechanistic pathways in which modules degrade is still a major task for the PV industry. In order to study the mechanisms responsible for PV module degradation, the effects of these degradation mechanisms must be quantitatively measured to determine the

Photovoltaic (PV) module degradation is a well-known issue, however understanding the mechanistic pathways in which modules degrade is still a major task for the PV industry. In order to study the mechanisms responsible for PV module degradation, the effects of these degradation mechanisms must be quantitatively measured to determine the severity of each degradation mode. In this thesis multiple modules from three climate zones (Arizona, California and Colorado) were investigated for a single module glass/polymer construction (Siemens M55) to determine the degree to which they had degraded, and the main factors that contributed to that degradation. To explain the loss in power, various nondestructive and destructive techniques were used to indicate possible causes of loss in performance. This is a two-part thesis. Part 1 presents non-destructive test results and analysis and Part 2 presents destructive test results and analysis.
ContributorsChicca, Matthew (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2015
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Description
Many industries require workers in warehouse and stockroom environments to perform frequent lifting tasks. Over time these repeated tasks can lead to excess strain on the worker's body and reduced productivity. This project seeks to develop an exoskeletal wrist fixture to be used in conjunction with a powered exoskeleton arm

Many industries require workers in warehouse and stockroom environments to perform frequent lifting tasks. Over time these repeated tasks can lead to excess strain on the worker's body and reduced productivity. This project seeks to develop an exoskeletal wrist fixture to be used in conjunction with a powered exoskeleton arm to aid workers performing box lifting types of tasks. Existing products aimed at improving worker comfort and productivity typically employ either fully powered exoskeleton suits or utilize minimally powered spring arms and/or fixtures. These designs either reduce stress to the user's body through powered arms and grippers operated via handheld controls which have limited functionality, or they use a more minimal setup that reduces some load, but exposes the user's hands and wrists to injury by directing support to the forearm. The design proposed here seeks to strike a balance between size, weight, and power requirements and also proposes a novel wrist exoskeleton design which minimizes stress on the user's wrists by directly interfacing with the object to be picked up. The design of the wrist exoskeleton was approached through initially selecting degrees of freedom and a ROM (range of motion) to accommodate. Feel and functionality were improved through an iterative prototyping process which yielded two primary designs. A novel "clip-in" method was proposed to allow the user to easily attach and detach from the exoskeleton. Designs utilized a contact surface intended to be used with dry fibrillary adhesives to maximize exoskeleton grip. Two final designs, which used two pivots in opposite kinematic order, were constructed and tested to determine the best kinematic layout. The best design had two prototypes created to be worn with passive test arms that attached to the user though a specially designed belt.
ContributorsGreason, Kenneth Berend (Author) / Sugar, Thomas (Thesis director) / Holgate, Matthew (Committee member) / Mechanical and Aerospace Engineering Program (Contributor) / Barrett, The Honors College (Contributor)
Created2016-12
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Description
This is a two-part thesis.

Part 1 presents an approach for working towards the development of a standardized artificial soiling method for laminated photovoltaic (PV) cells or mini-modules. Construction of an artificial chamber to maintain controlled environmental conditions and components/chemicals used in artificial soil formulation is briefly explained. Both poly-Si mini-modules

This is a two-part thesis.

Part 1 presents an approach for working towards the development of a standardized artificial soiling method for laminated photovoltaic (PV) cells or mini-modules. Construction of an artificial chamber to maintain controlled environmental conditions and components/chemicals used in artificial soil formulation is briefly explained. Both poly-Si mini-modules and a single cell mono-Si coupons were soiled and characterization tests such as I-V, reflectance and quantum efficiency (QE) were carried out on both soiled, and cleaned coupons. From the results obtained, poly-Si mini-modules proved to be a good measure of soil uniformity, as any non-uniformity present would not result in a smooth curve during I-V measurements. The challenges faced while executing reflectance and QE characterization tests on poly-Si due to smaller size cells was eliminated on the mono-Si coupons with large cells to obtain highly repeatable measurements. This study indicates that the reflectance measurements between 600-700 nm wavelengths can be used as a direct measure of soil density on the modules.

Part 2 determines the most dominant failure modes of field aged PV modules using experimental data obtained in the field and statistical analysis, FMECA (Failure Mode, Effect, and Criticality Analysis). The failure and degradation modes of about 744 poly-Si glass/polymer frameless modules fielded for 18 years under the cold-dry climate of New York was evaluated. Defect chart, degradation rates (both string and module levels) and safety map were generated using the field measured data. A statistical reliability tool, FMECA that uses Risk Priority Number (RPN) is used to determine the dominant failure or degradation modes in the strings and modules by means of ranking and prioritizing the modes. This study on PV power plants considers all the failure and degradation modes from both safety and performance perspectives.

The indoor and outdoor soiling studies were jointly performed by two Masters Students, Sravanthi Boppana and Vidyashree Rajasekar. This thesis presents the indoor soiling study, whereas the other thesis presents the outdoor soiling study. Similarly, the statistical risk analyses of two power plants (model J and model JVA) were jointly performed by these two Masters students. Both power plants are located at the same cold-dry climate, but one power plant carries framed modules and the other carries frameless modules. This thesis presents the results obtained on the frameless modules.
ContributorsRajasekar, Vidyashree (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2015
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Description
The primary goal of this thesis work is to determine the activation energy for encapsulant browning reaction of photovoltaic (PV) modules using outdoor field degradation data and indoor accelerated degradation data. For the outdoor field data, six PV modules fielded in Arizona (hot climate) over 21 years and four PV

The primary goal of this thesis work is to determine the activation energy for encapsulant browning reaction of photovoltaic (PV) modules using outdoor field degradation data and indoor accelerated degradation data. For the outdoor field data, six PV modules fielded in Arizona (hot climate) over 21 years and four PV modules fielded in New York (cold climate) over 18 years have been analyzed. All the ten modules were manufactured by the same manufacturer with glass/EVA/cell/EVA/back sheet construction. The activation energy for the encapsulant browning is calculated using the degradation rates of short-circuit current (Isc, the response parameter), weather data (temperature, humidity, and UV, the stress parameters) and different empirical rate models such as Arrhenius, Peck, Klinger and modified Peck models. For the indoor accelerated data, three sets of mini-modules with the same construction/manufacturer as that of the outdoor fielded modules were subjected indoor accelerated weathering stress and the test data were analyzed. The indoor accelerated test was carried out in a weathering chamber at the chamber temperature of 20°C, chamber relative humidity of 65%, and irradiance of 1 W/m2 at 340nm using a xenon arc lamp. Typically, to obtain activation energy, the test samples are stressed at two (or more) temperatures in two (or more) chambers. However, in this work, it has been attempted to do the acceleration testing of eight mini-modules at multiple temperatures using a single chamber. Multiple temperatures in a single chamber were obtained using thermal insulators on the back of the mini-modules. Depending on the thickness of the thermal insulators with constant solar gain from the xenon lamp, different temperatures on the test samples were achieved using a single weathering chamber. The Isc loss and temperature of the mini-modules were continuously monitored using a data logger. Also, the mini-modules were taken out every two weeks and various characterization tests such as IV, QE, UV fluorescence and reflectance were carried out. Activation energy from the indoor accelerated tests was calculated using the short circuit current degradation rate and operating temperatures of the mini-modules. The activation energy for the encapsulant browning obtained from the outdoor field data and the indoor accelerated data are compared and analyzed in this work.
ContributorsVeerendra Kumar, Deepak Jain (Author) / Tamizhmani, Govindasamy (Committee member) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2016
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Description
The microstructure development of Inconel alloy 718 (IN718) during conventional processing has been extensively studied and much has been discovered as to the mechanisms behind the exceptional creep resistance that the alloy exhibits. More recently with the development of large scale 3D printing of alloys such as IN718 a new

The microstructure development of Inconel alloy 718 (IN718) during conventional processing has been extensively studied and much has been discovered as to the mechanisms behind the exceptional creep resistance that the alloy exhibits. More recently with the development of large scale 3D printing of alloys such as IN718 a new dimension of complexity has emerged in the understanding of alloy microstructure development, hence, potential alloy development opportunity for IN718.

This study is a broad stroke at discovering possible alternate microstructures developing in Direct-Metal-Laser-Sintering (DMLS) processed IN718 compared to those in conventional wrought IN718. The main inspiration for this study came from creep test results from several DMLS IN718 samples at Honeywell that showed a significant

improvement in creep capabilities for DMLS718 compared to cast and wrought IN718 (Honeywell).

From this data the steady-state creep rates were evaluated and fitted to current creep models in order to identify active creep mechanisms in conventional and DMLS IN718 and illuminate the potential factors responsible for the improved creep behavior in DMSL processed IN718.

Because rapid heating and cooling can introduce high internal stress and impact microstructural development, such as gamma double prime formations (Oblak et al.), leading to differences in material behavior, DMLS and conventional IN718 materials are studied using SEM and TEM characterization to investigate sub-micron and/or nano-scale

microstructural differences developed in the DMLS samples as a result of their complex thermal history and internal stress.

The preliminary analysis presented in this body of work is an attempt to better understand the effect of DMLS processing in quest for development of optimization techniques for DMLS as a whole. A historical sketch of nickel alloys and the development of IN718 is given. A literature review detailing the microstructure of IN718 is presented. Creep data analysis and identification of active creep mechanisms are evaluated. High-resolution microstructural characterization of DMLS and wrought IN718 are discussed in detail throughout various chapters of this thesis. Finally, an initial effort in developing a processing model that would allow for parameter optimization is presented.
ContributorsRogers, Blake Kenton (Author) / Tasooji, Amaneh (Thesis advisor) / Petuskey, William (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2017
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Description
Electrostatic Discharge (ESD) is a unique issue in the electronics industry that can cause failures of electrical components and complete electronic systems. There is an entire industry that is focused on developing ESD compliant tooling using traditional manufacturing methods. This research work evaluates the feasibility to fabricate a

Electrostatic Discharge (ESD) is a unique issue in the electronics industry that can cause failures of electrical components and complete electronic systems. There is an entire industry that is focused on developing ESD compliant tooling using traditional manufacturing methods. This research work evaluates the feasibility to fabricate a PEEK-Carbon Nanotube composite filament for Fused Filament Fabrication (FFF) Additive Manufacturing that is ESD compliant. In addition, it demonstrates that the FFF process can be used to print tools with the required accuracy, ESD compliance and mechanical properties necessary for the electronics industry at a low rate production level. Current Additive Manufacturing technology can print high temperature polymers, such as PEEK, with the required mechanical properties but they are not ESD compliant and require post processing to create a product that is. There has been some research conducted using mixed multi-wall and single wall carbon nanotubes in a PEEK polymers, which improves mechanical properties while reducing bulk resistance to the levels required to be ESD compliant. This previous research has been used to develop a PEEK-CNT polymer matrix for the Fused Filament Fabrication additive manufacturing process
ContributorsChurchwell, Raymond L (Author) / Sugar, Thomas (Thesis advisor) / Rogers, Bradley (Committee member) / Morrell, Darryl (Committee member) / Arizona State University (Publisher)
Created2020