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Nowadays product reliability becomes the top concern of the manufacturers and customers always prefer the products with good performances under long period. In order to estimate the lifetime of the product, accelerated life testing (ALT) is introduced because most of the products can last years even decades. Much research has

Nowadays product reliability becomes the top concern of the manufacturers and customers always prefer the products with good performances under long period. In order to estimate the lifetime of the product, accelerated life testing (ALT) is introduced because most of the products can last years even decades. Much research has been done in the ALT area and optimal design for ALT is a major topic. This dissertation consists of three main studies. First, a methodology of finding optimal design for ALT with right censoring and interval censoring have been developed and it employs the proportional hazard (PH) model and generalized linear model (GLM) to simplify the computational process. A sensitivity study is also given to show the effects brought by parameters to the designs. Second, an extended version of I-optimal design for ALT is discussed and then a dual-objective design criterion is defined and showed with several examples. Also in order to evaluate different candidate designs, several graphical tools are developed. Finally, when there are more than one models available, different model checking designs are discussed.
ContributorsYang, Tao (Author) / Pan, Rong (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Borror, Connie (Committee member) / Rigdon, Steve (Committee member) / Arizona State University (Publisher)
Created2013
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Description
Nonregular screening designs can be an economical alternative to traditional resolution IV 2^(k-p) fractional factorials. Recently 16-run nonregular designs, referred to as no-confounding designs, were introduced in the literature. These designs have the property that no pair of main effect (ME) and two-factor interaction (2FI) estimates are completely confounded. In

Nonregular screening designs can be an economical alternative to traditional resolution IV 2^(k-p) fractional factorials. Recently 16-run nonregular designs, referred to as no-confounding designs, were introduced in the literature. These designs have the property that no pair of main effect (ME) and two-factor interaction (2FI) estimates are completely confounded. In this dissertation, orthogonal arrays were evaluated with many popular design-ranking criteria in order to identify optimal 20-run and 24-run no-confounding designs. Monte Carlo simulation was used to empirically assess the model fitting effectiveness of the recommended no-confounding designs. The results of the simulation demonstrated that these new designs, particularly the 24-run designs, are successful at detecting active effects over 95% of the time given sufficient model effect sparsity. The final chapter presents a screening design selection methodology, based on decision trees, to aid in the selection of a screening design from a list of published options. The methodology determines which of a candidate set of screening designs has the lowest expected experimental cost.
ContributorsStone, Brian (Author) / Montgomery, Douglas C. (Thesis advisor) / Silvestrini, Rachel T. (Committee member) / Fowler, John W (Committee member) / Borror, Connie M. (Committee member) / Arizona State University (Publisher)
Created2013
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Description
This thesis presents a meta-analysis of lead-free solder reliability. The qualitative analyses of the failure modes of lead- free solder under different stress tests including drop test, bend test, thermal test and vibration test are discussed. The main cause of failure of lead- free solder is fatigue crack, and the

This thesis presents a meta-analysis of lead-free solder reliability. The qualitative analyses of the failure modes of lead- free solder under different stress tests including drop test, bend test, thermal test and vibration test are discussed. The main cause of failure of lead- free solder is fatigue crack, and the speed of propagation of the initial crack could differ from different test conditions and different solder materials. A quantitative analysis about the fatigue behavior of SAC lead-free solder under thermal preconditioning process is conducted. This thesis presents a method of making prediction of failure life of solder alloy by building a Weibull regression model. The failure life of solder on circuit board is assumed Weibull distributed. Different materials and test conditions could affect the distribution by changing the shape and scale parameters of Weibull distribution. The method is to model the regression of parameters with different test conditions as predictors based on Bayesian inference concepts. In the process of building regression models, prior distributions are generated according to the previous studies, and Markov Chain Monte Carlo (MCMC) is used under WinBUGS environment.
ContributorsXu, Xinyue (Author) / Pan, Rong (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Wu, Teresa (Committee member) / Arizona State University (Publisher)
Created2014
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Description
The main objective of this research is to develop an approach to PV module lifetime prediction. In doing so, the aim is to move from empirical generalizations to a formal predictive science based on data-driven case studies of the crystalline silicon PV systems. The evaluation of PV systems aged 5

The main objective of this research is to develop an approach to PV module lifetime prediction. In doing so, the aim is to move from empirical generalizations to a formal predictive science based on data-driven case studies of the crystalline silicon PV systems. The evaluation of PV systems aged 5 to 30 years old that results in systematic predictive capability that is absent today. The warranty period provided by the manufacturers typically range from 20 to 25 years for crystalline silicon modules. The end of lifetime (for example, the time-to-degrade by 20% from rated power) of PV modules is usually calculated using a simple linear extrapolation based on the annual field degradation rate (say, 0.8% drop in power output per year). It has been 26 years since systematic studies on solar PV module lifetime prediction were undertaken as part of the 11-year flat-plate solar array (FSA) project of the Jet Propulsion Laboratory (JPL) funded by DOE. Since then, PV modules have gone through significant changes in construction materials and design; making most of the field data obsolete, though the effect field stressors on the old designs/materials is valuable to be understood. Efforts have been made to adapt some of the techniques developed to the current technologies, but they are too often limited in scope and too reliant on empirical generalizations of previous results. Some systematic approaches have been proposed based on accelerated testing, but no or little experimental studies have followed. Consequently, the industry does not exactly know today how to test modules for a 20 - 30 years lifetime.

This research study focuses on the behavior of crystalline silicon PV module technology in the dry and hot climatic condition of Tempe/Phoenix, Arizona. A three-phase approach was developed: (1) A quantitative failure modes, effects, and criticality analysis (FMECA) was developed for prioritizing failure modes or mechanisms in a given environment; (2) A time-series approach was used to model environmental stress variables involved and prioritize their effect on the power output drop; and (3) A procedure for developing a prediction model was proposed for the climatic specific condition based on accelerated degradation testing
ContributorsKuitche, Joseph Mathurin (Author) / Pan, Rong (Thesis advisor) / Tamizhmani, Govindasamy (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Wu, Teresa (Committee member) / Arizona State University (Publisher)
Created2014
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Description
No-confounding designs (NC) in 16 runs for 6, 7, and 8 factors are non-regular fractional factorial designs that have been suggested as attractive alternatives to the regular minimum aberration resolution IV designs because they do not completely confound any two-factor interactions with each other. These designs allow for potential estimation

No-confounding designs (NC) in 16 runs for 6, 7, and 8 factors are non-regular fractional factorial designs that have been suggested as attractive alternatives to the regular minimum aberration resolution IV designs because they do not completely confound any two-factor interactions with each other. These designs allow for potential estimation of main effects and a few two-factor interactions without the need for follow-up experimentation. Analysis methods for non-regular designs is an area of ongoing research, because standard variable selection techniques such as stepwise regression may not always be the best approach. The current work investigates the use of the Dantzig selector for analyzing no-confounding designs. Through a series of examples it shows that this technique is very effective for identifying the set of active factors in no-confounding designs when there are three of four active main effects and up to two active two-factor interactions.

To evaluate the performance of Dantzig selector, a simulation study was conducted and the results based on the percentage of type II errors are analyzed. Also, another alternative for 6 factor NC design, called the Alternate No-confounding design in six factors is introduced in this study. The performance of this Alternate NC design in 6 factors is then evaluated by using Dantzig selector as an analysis method. Lastly, a section is dedicated to comparing the performance of NC-6 and Alternate NC-6 designs.
ContributorsKrishnamoorthy, Archana (Author) / Montgomery, Douglas C. (Thesis advisor) / Borror, Connie (Thesis advisor) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2014
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Description
In this era of fast computational machines and new optimization algorithms, there have been great advances in Experimental Designs. We focus our research on design issues in generalized linear models (GLMs) and functional magnetic resonance imaging(fMRI). The first part of our research is on tackling the challenging problem of constructing

exact

In this era of fast computational machines and new optimization algorithms, there have been great advances in Experimental Designs. We focus our research on design issues in generalized linear models (GLMs) and functional magnetic resonance imaging(fMRI). The first part of our research is on tackling the challenging problem of constructing

exact designs for GLMs, that are robust against parameter, link and model

uncertainties by improving an existing algorithm and providing a new one, based on using a continuous particle swarm optimization (PSO) and spectral clustering. The proposed algorithm is sufficiently versatile to accomodate most popular design selection criteria, and we concentrate on providing robust designs for GLMs, using the D and A optimality criterion. The second part of our research is on providing an algorithm

that is a faster alternative to a recently proposed genetic algorithm (GA) to construct optimal designs for fMRI studies. Our algorithm is built upon a discrete version of the PSO.
ContributorsTemkit, M'Hamed (Author) / Kao, Jason (Thesis advisor) / Reiser, Mark R. (Committee member) / Barber, Jarrett (Committee member) / Montgomery, Douglas C. (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2014
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Description
Value-added models (VAMs) are used by many states to assess contributions of individual teachers and schools to students' academic growth. The generalized persistence VAM, one of the most flexible in the literature, estimates the ``value added'' by individual teachers to their students' current and future test scores by employing a

Value-added models (VAMs) are used by many states to assess contributions of individual teachers and schools to students' academic growth. The generalized persistence VAM, one of the most flexible in the literature, estimates the ``value added'' by individual teachers to their students' current and future test scores by employing a mixed model with a longitudinal database of test scores. There is concern, however, that missing values that are common in the longitudinal student scores can bias value-added assessments, especially when the models serve as a basis for personnel decisions -- such as promoting or dismissing teachers -- as they are being used in some states. Certain types of missing data require that the VAM be modeled jointly with the missingness process in order to obtain unbiased parameter estimates. This dissertation studies two problems. First, the flexibility and multimembership random effects structure of the generalized persistence model lead to computational challenges that have limited the model's availability. To this point, no methods have been developed for scalable maximum likelihood estimation of the model. An EM algorithm to compute maximum likelihood estimates efficiently is developed, making use of the sparse structure of the random effects and error covariance matrices. The algorithm is implemented in the package GPvam in R statistical software. Illustrations of the gains in computational efficiency achieved by the estimation procedure are given. Furthermore, to address the presence of potentially nonignorable missing data, a flexible correlated random effects model is developed that extends the generalized persistence model to jointly model the test scores and the missingness process, allowing the process to depend on both students and teachers. The joint model gives the ability to test the sensitivity of the VAM to the presence of nonignorable missing data. Estimation of the model is challenging due to the non-hierarchical dependence structure and the resulting intractable high-dimensional integrals. Maximum likelihood estimation of the model is performed using an EM algorithm with fully exponential Laplace approximations for the E step. The methods are illustrated with data from university calculus classes and with data from standardized test scores from an urban school district.
ContributorsKarl, Andrew (Author) / Lohr, Sharon L (Thesis advisor) / Yang, Yan (Thesis advisor) / Kao, Ming-Hung (Committee member) / Montgomery, Douglas C. (Committee member) / Wilson, Jeffrey R (Committee member) / Arizona State University (Publisher)
Created2012
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Description
This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but

This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but the data generated and their analysis is for high performance avionics. Avionics equipment typically requires 20 years expected life by aircraft equipment manufacturers and therefore ALT is the only practical way of performing life test estimates. Both thermal and vibration ALT induced failure are performed and analyzed to resolve industry questions relating to the introduction of lead-free solder product and processes into high reliability avionics. In chapter 2, thermal ALT using an industry standard failure machine implementing Interconnect Stress Test (IST) that simulates circuit board life data is compared to real production failure data by likelihood ratio tests to arrive at a mechanical theory. This mechanical theory results in a statistically equivalent energy bound such that failure distributions below a specific energy level are considered to be from the same distribution thus allowing testers to quantify parameter setting in IST prior to life testing. In chapter 3, vibration ALT comparing tin-lead and lead-free circuit board solder designs involves the use of the likelihood ratio (LR) test to assess both complete failure data and S-N curves to present methods for analyzing data. Failure data is analyzed using Regression and two-way analysis of variance (ANOVA) and reconciled with the LR test results that indicating that a costly aging pre-process may be eliminated in certain cases. In chapter 4, vibration ALT for side-by-side tin-lead and lead-free solder black box designs are life tested. Commercial models from strain data do not exist at the low levels associated with life testing and need to be developed because testing performed and presented here indicate that both tin-lead and lead-free solders are similar. In addition, earlier failures due to vibration like connector failure modes will occur before solder interconnect failures.
ContributorsJuarez, Joseph Moses (Author) / Montgomery, Douglas C. (Thesis advisor) / Borror, Connie M. (Thesis advisor) / Gel, Esma (Committee member) / Mignolet, Marc (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research,

Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research, a new three dimensional model for tolerance transfer in manufacturing process planning is presented that is user friendly in the sense that it is built upon the Coordinate Measuring Machine (CMM) readings that are readily available in any decent manufacturing facility. This model can take care of datum reference change between non orthogonal datums (squeezed datums), non-linearly oriented datums (twisted datums) etc. Graph theoretic approach based upon ACIS, C++ and MFC is laid out to facilitate its implementation for automation of the model. A totally new approach to determining dimensions and tolerances for the manufacturing process plan is also presented. Secondly, a new statistical model for the statistical tolerance analysis based upon joint probability distribution of the trivariate normal distributed variables is presented. 4-D probability Maps have been developed in which the probability value of a point in space is represented by the size of the marker and the associated color. Points inside the part map represent the pass percentage for parts manufactured. The effect of refinement with form and orientation tolerance is highlighted by calculating the change in pass percentage with the pass percentage for size tolerance only. Delaunay triangulation and ray tracing algorithms have been used to automate the process of identifying the points inside and outside the part map. Proof of concept software has been implemented to demonstrate this model and to determine pass percentages for various cases. The model is further extended to assemblies by employing convolution algorithms on two trivariate statistical distributions to arrive at the statistical distribution of the assembly. Map generated by using Minkowski Sum techniques on the individual part maps is superimposed on the probability point cloud resulting from convolution. Delaunay triangulation and ray tracing algorithms are employed to determine the assembleability percentages for the assembly.
ContributorsKhan, M Nadeem Shafi (Author) / Phelan, Patrick E (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Farin, Gerald (Committee member) / Roberts, Chell (Committee member) / Henderson, Mark (Committee member) / Arizona State University (Publisher)
Created2011
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Description
Optimal experimental design for generalized linear models is often done using a pseudo-Bayesian approach that integrates the design criterion across a prior distribution on the parameter values. This approach ignores the lack of utility of certain models contained in the prior, and a case is demonstrated where the heavy

Optimal experimental design for generalized linear models is often done using a pseudo-Bayesian approach that integrates the design criterion across a prior distribution on the parameter values. This approach ignores the lack of utility of certain models contained in the prior, and a case is demonstrated where the heavy focus on such hopeless models results in a design with poor performance and with wild swings in coverage probabilities for Wald-type confidence intervals. Design construction using a utility-based approach is shown to result in much more stable coverage probabilities in the area of greatest concern.

The pseudo-Bayesian approach can be applied to the problem of optimal design construction under dependent observations. Often, correlation between observations exists due to restrictions on randomization. Several techniques for optimal design construction are proposed in the case of the conditional response distribution being a natural exponential family member but with a normally distributed block effect . The reviewed pseudo-Bayesian approach is compared to an approach based on substituting the marginal likelihood with the joint likelihood and an approach based on projections of the score function (often called quasi-likelihood). These approaches are compared for several models with normal, Poisson, and binomial conditional response distributions via the true determinant of the expected Fisher information matrix where the dispersion of the random blocks is considered a nuisance parameter. A case study using the developed methods is performed.

The joint and quasi-likelihood methods are then extended to address the case when the magnitude of random block dispersion is of concern. Again, a simulation study over several models is performed, followed by a case study when the conditional response distribution is a Poisson distribution.
ContributorsHassler, Edgar (Author) / Montgomery, Douglas C. (Thesis advisor) / Silvestrini, Rachel T. (Thesis advisor) / Borror, Connie M. (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2015