Matching Items (35)
Filtering by

Clear all filters

152223-Thumbnail Image.png
Description
Nowadays product reliability becomes the top concern of the manufacturers and customers always prefer the products with good performances under long period. In order to estimate the lifetime of the product, accelerated life testing (ALT) is introduced because most of the products can last years even decades. Much research has

Nowadays product reliability becomes the top concern of the manufacturers and customers always prefer the products with good performances under long period. In order to estimate the lifetime of the product, accelerated life testing (ALT) is introduced because most of the products can last years even decades. Much research has been done in the ALT area and optimal design for ALT is a major topic. This dissertation consists of three main studies. First, a methodology of finding optimal design for ALT with right censoring and interval censoring have been developed and it employs the proportional hazard (PH) model and generalized linear model (GLM) to simplify the computational process. A sensitivity study is also given to show the effects brought by parameters to the designs. Second, an extended version of I-optimal design for ALT is discussed and then a dual-objective design criterion is defined and showed with several examples. Also in order to evaluate different candidate designs, several graphical tools are developed. Finally, when there are more than one models available, different model checking designs are discussed.
ContributorsYang, Tao (Author) / Pan, Rong (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Borror, Connie (Committee member) / Rigdon, Steve (Committee member) / Arizona State University (Publisher)
Created2013
153109-Thumbnail Image.png
Description
This thesis presents a meta-analysis of lead-free solder reliability. The qualitative analyses of the failure modes of lead- free solder under different stress tests including drop test, bend test, thermal test and vibration test are discussed. The main cause of failure of lead- free solder is fatigue crack, and the

This thesis presents a meta-analysis of lead-free solder reliability. The qualitative analyses of the failure modes of lead- free solder under different stress tests including drop test, bend test, thermal test and vibration test are discussed. The main cause of failure of lead- free solder is fatigue crack, and the speed of propagation of the initial crack could differ from different test conditions and different solder materials. A quantitative analysis about the fatigue behavior of SAC lead-free solder under thermal preconditioning process is conducted. This thesis presents a method of making prediction of failure life of solder alloy by building a Weibull regression model. The failure life of solder on circuit board is assumed Weibull distributed. Different materials and test conditions could affect the distribution by changing the shape and scale parameters of Weibull distribution. The method is to model the regression of parameters with different test conditions as predictors based on Bayesian inference concepts. In the process of building regression models, prior distributions are generated according to the previous studies, and Markov Chain Monte Carlo (MCMC) is used under WinBUGS environment.
ContributorsXu, Xinyue (Author) / Pan, Rong (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Wu, Teresa (Committee member) / Arizona State University (Publisher)
Created2014
153145-Thumbnail Image.png
Description
The main objective of this research is to develop an approach to PV module lifetime prediction. In doing so, the aim is to move from empirical generalizations to a formal predictive science based on data-driven case studies of the crystalline silicon PV systems. The evaluation of PV systems aged 5

The main objective of this research is to develop an approach to PV module lifetime prediction. In doing so, the aim is to move from empirical generalizations to a formal predictive science based on data-driven case studies of the crystalline silicon PV systems. The evaluation of PV systems aged 5 to 30 years old that results in systematic predictive capability that is absent today. The warranty period provided by the manufacturers typically range from 20 to 25 years for crystalline silicon modules. The end of lifetime (for example, the time-to-degrade by 20% from rated power) of PV modules is usually calculated using a simple linear extrapolation based on the annual field degradation rate (say, 0.8% drop in power output per year). It has been 26 years since systematic studies on solar PV module lifetime prediction were undertaken as part of the 11-year flat-plate solar array (FSA) project of the Jet Propulsion Laboratory (JPL) funded by DOE. Since then, PV modules have gone through significant changes in construction materials and design; making most of the field data obsolete, though the effect field stressors on the old designs/materials is valuable to be understood. Efforts have been made to adapt some of the techniques developed to the current technologies, but they are too often limited in scope and too reliant on empirical generalizations of previous results. Some systematic approaches have been proposed based on accelerated testing, but no or little experimental studies have followed. Consequently, the industry does not exactly know today how to test modules for a 20 - 30 years lifetime.

This research study focuses on the behavior of crystalline silicon PV module technology in the dry and hot climatic condition of Tempe/Phoenix, Arizona. A three-phase approach was developed: (1) A quantitative failure modes, effects, and criticality analysis (FMECA) was developed for prioritizing failure modes or mechanisms in a given environment; (2) A time-series approach was used to model environmental stress variables involved and prioritize their effect on the power output drop; and (3) A procedure for developing a prediction model was proposed for the climatic specific condition based on accelerated degradation testing
ContributorsKuitche, Joseph Mathurin (Author) / Pan, Rong (Thesis advisor) / Tamizhmani, Govindasamy (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Wu, Teresa (Committee member) / Arizona State University (Publisher)
Created2014
153391-Thumbnail Image.png
Description
Missing data are common in psychology research and can lead to bias and reduced power if not properly handled. Multiple imputation is a state-of-the-art missing data method recommended by methodologists. Multiple imputation methods can generally be divided into two broad categories: joint model (JM) imputation and fully conditional specification (FCS)

Missing data are common in psychology research and can lead to bias and reduced power if not properly handled. Multiple imputation is a state-of-the-art missing data method recommended by methodologists. Multiple imputation methods can generally be divided into two broad categories: joint model (JM) imputation and fully conditional specification (FCS) imputation. JM draws missing values simultaneously for all incomplete variables using a multivariate distribution (e.g., multivariate normal). FCS, on the other hand, imputes variables one at a time, drawing missing values from a series of univariate distributions. In the single-level context, these two approaches have been shown to be equivalent with multivariate normal data. However, less is known about the similarities and differences of these two approaches with multilevel data, and the methodological literature provides no insight into the situations under which the approaches would produce identical results. This document examined five multilevel multiple imputation approaches (three JM methods and two FCS methods) that have been proposed in the literature. An analytic section shows that only two of the methods (one JM method and one FCS method) used imputation models equivalent to a two-level joint population model that contained random intercepts and different associations across levels. The other three methods employed imputation models that differed from the population model primarily in their ability to preserve distinct level-1 and level-2 covariances. I verified the analytic work with computer simulations, and the simulation results also showed that imputation models that failed to preserve level-specific covariances produced biased estimates. The studies also highlighted conditions that exacerbated the amount of bias produced (e.g., bias was greater for conditions with small cluster sizes). The analytic work and simulations lead to a number of practical recommendations for researchers.
ContributorsMistler, Stephen (Author) / Enders, Craig K. (Thesis advisor) / Aiken, Leona (Committee member) / Levy, Roy (Committee member) / West, Stephen G. (Committee member) / Arizona State University (Publisher)
Created2015
153224-Thumbnail Image.png
Description
In this era of fast computational machines and new optimization algorithms, there have been great advances in Experimental Designs. We focus our research on design issues in generalized linear models (GLMs) and functional magnetic resonance imaging(fMRI). The first part of our research is on tackling the challenging problem of constructing

exact

In this era of fast computational machines and new optimization algorithms, there have been great advances in Experimental Designs. We focus our research on design issues in generalized linear models (GLMs) and functional magnetic resonance imaging(fMRI). The first part of our research is on tackling the challenging problem of constructing

exact designs for GLMs, that are robust against parameter, link and model

uncertainties by improving an existing algorithm and providing a new one, based on using a continuous particle swarm optimization (PSO) and spectral clustering. The proposed algorithm is sufficiently versatile to accomodate most popular design selection criteria, and we concentrate on providing robust designs for GLMs, using the D and A optimality criterion. The second part of our research is on providing an algorithm

that is a faster alternative to a recently proposed genetic algorithm (GA) to construct optimal designs for fMRI studies. Our algorithm is built upon a discrete version of the PSO.
ContributorsTemkit, M'Hamed (Author) / Kao, Jason (Thesis advisor) / Reiser, Mark R. (Committee member) / Barber, Jarrett (Committee member) / Montgomery, Douglas C. (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2014
150618-Thumbnail Image.png
Description
Coarsely grouped counts or frequencies are commonly used in the behavioral sciences. Grouped count and grouped frequency (GCGF) that are used as outcome variables often violate the assumptions of linear regression as well as models designed for categorical outcomes; there is no analytic model that is designed specifically to accommodate

Coarsely grouped counts or frequencies are commonly used in the behavioral sciences. Grouped count and grouped frequency (GCGF) that are used as outcome variables often violate the assumptions of linear regression as well as models designed for categorical outcomes; there is no analytic model that is designed specifically to accommodate GCGF outcomes. The purpose of this dissertation was to compare the statistical performance of four regression models (linear regression, Poisson regression, ordinal logistic regression, and beta regression) that can be used when the outcome is a GCGF variable. A simulation study was used to determine the power, type I error, and confidence interval (CI) coverage rates for these models under different conditions. Mean structure, variance structure, effect size, continuous or binary predictor, and sample size were included in the factorial design. Mean structures reflected either a linear relationship or an exponential relationship between the predictor and the outcome. Variance structures reflected homoscedastic (as in linear regression), heteroscedastic (monotonically increasing) or heteroscedastic (increasing then decreasing) variance. Small to medium, large, and very large effect sizes were examined. Sample sizes were 100, 200, 500, and 1000. Results of the simulation study showed that ordinal logistic regression produced type I error, statistical power, and CI coverage rates that were consistently within acceptable limits. Linear regression produced type I error and statistical power that were within acceptable limits, but CI coverage was too low for several conditions important to the analysis of counts and frequencies. Poisson regression and beta regression displayed inflated type I error, low statistical power, and low CI coverage rates for nearly all conditions. All models produced unbiased estimates of the regression coefficient. Based on the statistical performance of the four models, ordinal logistic regression seems to be the preferred method for analyzing GCGF outcomes. Linear regression also performed well, but CI coverage was too low for conditions with an exponential mean structure and/or heteroscedastic variance. Some aspects of model prediction, such as model fit, were not assessed here; more research is necessary to determine which statistical model best captures the unique properties of GCGF outcomes.
ContributorsCoxe, Stefany (Author) / Aiken, Leona S. (Thesis advisor) / West, Stephen G. (Thesis advisor) / Mackinnon, David P (Committee member) / Reiser, Mark R. (Committee member) / Arizona State University (Publisher)
Created2012
150494-Thumbnail Image.png
Description
Value-added models (VAMs) are used by many states to assess contributions of individual teachers and schools to students' academic growth. The generalized persistence VAM, one of the most flexible in the literature, estimates the ``value added'' by individual teachers to their students' current and future test scores by employing a

Value-added models (VAMs) are used by many states to assess contributions of individual teachers and schools to students' academic growth. The generalized persistence VAM, one of the most flexible in the literature, estimates the ``value added'' by individual teachers to their students' current and future test scores by employing a mixed model with a longitudinal database of test scores. There is concern, however, that missing values that are common in the longitudinal student scores can bias value-added assessments, especially when the models serve as a basis for personnel decisions -- such as promoting or dismissing teachers -- as they are being used in some states. Certain types of missing data require that the VAM be modeled jointly with the missingness process in order to obtain unbiased parameter estimates. This dissertation studies two problems. First, the flexibility and multimembership random effects structure of the generalized persistence model lead to computational challenges that have limited the model's availability. To this point, no methods have been developed for scalable maximum likelihood estimation of the model. An EM algorithm to compute maximum likelihood estimates efficiently is developed, making use of the sparse structure of the random effects and error covariance matrices. The algorithm is implemented in the package GPvam in R statistical software. Illustrations of the gains in computational efficiency achieved by the estimation procedure are given. Furthermore, to address the presence of potentially nonignorable missing data, a flexible correlated random effects model is developed that extends the generalized persistence model to jointly model the test scores and the missingness process, allowing the process to depend on both students and teachers. The joint model gives the ability to test the sensitivity of the VAM to the presence of nonignorable missing data. Estimation of the model is challenging due to the non-hierarchical dependence structure and the resulting intractable high-dimensional integrals. Maximum likelihood estimation of the model is performed using an EM algorithm with fully exponential Laplace approximations for the E step. The methods are illustrated with data from university calculus classes and with data from standardized test scores from an urban school district.
ContributorsKarl, Andrew (Author) / Lohr, Sharon L (Thesis advisor) / Yang, Yan (Thesis advisor) / Kao, Ming-Hung (Committee member) / Montgomery, Douglas C. (Committee member) / Wilson, Jeffrey R (Committee member) / Arizona State University (Publisher)
Created2012
150547-Thumbnail Image.png
Description
This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but

This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but the data generated and their analysis is for high performance avionics. Avionics equipment typically requires 20 years expected life by aircraft equipment manufacturers and therefore ALT is the only practical way of performing life test estimates. Both thermal and vibration ALT induced failure are performed and analyzed to resolve industry questions relating to the introduction of lead-free solder product and processes into high reliability avionics. In chapter 2, thermal ALT using an industry standard failure machine implementing Interconnect Stress Test (IST) that simulates circuit board life data is compared to real production failure data by likelihood ratio tests to arrive at a mechanical theory. This mechanical theory results in a statistically equivalent energy bound such that failure distributions below a specific energy level are considered to be from the same distribution thus allowing testers to quantify parameter setting in IST prior to life testing. In chapter 3, vibration ALT comparing tin-lead and lead-free circuit board solder designs involves the use of the likelihood ratio (LR) test to assess both complete failure data and S-N curves to present methods for analyzing data. Failure data is analyzed using Regression and two-way analysis of variance (ANOVA) and reconciled with the LR test results that indicating that a costly aging pre-process may be eliminated in certain cases. In chapter 4, vibration ALT for side-by-side tin-lead and lead-free solder black box designs are life tested. Commercial models from strain data do not exist at the low levels associated with life testing and need to be developed because testing performed and presented here indicate that both tin-lead and lead-free solders are similar. In addition, earlier failures due to vibration like connector failure modes will occur before solder interconnect failures.
ContributorsJuarez, Joseph Moses (Author) / Montgomery, Douglas C. (Thesis advisor) / Borror, Connie M. (Thesis advisor) / Gel, Esma (Committee member) / Mignolet, Marc (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2012
149829-Thumbnail Image.png
Description
Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research,

Mostly, manufacturing tolerance charts are used these days for manufacturing tolerance transfer but these have the limitation of being one dimensional only. Some research has been undertaken for the three dimensional geometric tolerances but it is too theoretical and yet to be ready for operator level usage. In this research, a new three dimensional model for tolerance transfer in manufacturing process planning is presented that is user friendly in the sense that it is built upon the Coordinate Measuring Machine (CMM) readings that are readily available in any decent manufacturing facility. This model can take care of datum reference change between non orthogonal datums (squeezed datums), non-linearly oriented datums (twisted datums) etc. Graph theoretic approach based upon ACIS, C++ and MFC is laid out to facilitate its implementation for automation of the model. A totally new approach to determining dimensions and tolerances for the manufacturing process plan is also presented. Secondly, a new statistical model for the statistical tolerance analysis based upon joint probability distribution of the trivariate normal distributed variables is presented. 4-D probability Maps have been developed in which the probability value of a point in space is represented by the size of the marker and the associated color. Points inside the part map represent the pass percentage for parts manufactured. The effect of refinement with form and orientation tolerance is highlighted by calculating the change in pass percentage with the pass percentage for size tolerance only. Delaunay triangulation and ray tracing algorithms have been used to automate the process of identifying the points inside and outside the part map. Proof of concept software has been implemented to demonstrate this model and to determine pass percentages for various cases. The model is further extended to assemblies by employing convolution algorithms on two trivariate statistical distributions to arrive at the statistical distribution of the assembly. Map generated by using Minkowski Sum techniques on the individual part maps is superimposed on the probability point cloud resulting from convolution. Delaunay triangulation and ray tracing algorithms are employed to determine the assembleability percentages for the assembly.
ContributorsKhan, M Nadeem Shafi (Author) / Phelan, Patrick E (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Farin, Gerald (Committee member) / Roberts, Chell (Committee member) / Henderson, Mark (Committee member) / Arizona State University (Publisher)
Created2011
154080-Thumbnail Image.png
Description
Optimal experimental design for generalized linear models is often done using a pseudo-Bayesian approach that integrates the design criterion across a prior distribution on the parameter values. This approach ignores the lack of utility of certain models contained in the prior, and a case is demonstrated where the heavy

Optimal experimental design for generalized linear models is often done using a pseudo-Bayesian approach that integrates the design criterion across a prior distribution on the parameter values. This approach ignores the lack of utility of certain models contained in the prior, and a case is demonstrated where the heavy focus on such hopeless models results in a design with poor performance and with wild swings in coverage probabilities for Wald-type confidence intervals. Design construction using a utility-based approach is shown to result in much more stable coverage probabilities in the area of greatest concern.

The pseudo-Bayesian approach can be applied to the problem of optimal design construction under dependent observations. Often, correlation between observations exists due to restrictions on randomization. Several techniques for optimal design construction are proposed in the case of the conditional response distribution being a natural exponential family member but with a normally distributed block effect . The reviewed pseudo-Bayesian approach is compared to an approach based on substituting the marginal likelihood with the joint likelihood and an approach based on projections of the score function (often called quasi-likelihood). These approaches are compared for several models with normal, Poisson, and binomial conditional response distributions via the true determinant of the expected Fisher information matrix where the dispersion of the random blocks is considered a nuisance parameter. A case study using the developed methods is performed.

The joint and quasi-likelihood methods are then extended to address the case when the magnitude of random block dispersion is of concern. Again, a simulation study over several models is performed, followed by a case study when the conditional response distribution is a Poisson distribution.
ContributorsHassler, Edgar (Author) / Montgomery, Douglas C. (Thesis advisor) / Silvestrini, Rachel T. (Thesis advisor) / Borror, Connie M. (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2015