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- Genre: Academic theses
- Creators: Montgomery, Douglas C.
- Creators: Levy, Roy
- Creators: Zhou, Shuang
Description
Nowadays product reliability becomes the top concern of the manufacturers and customers always prefer the products with good performances under long period. In order to estimate the lifetime of the product, accelerated life testing (ALT) is introduced because most of the products can last years even decades. Much research has been done in the ALT area and optimal design for ALT is a major topic. This dissertation consists of three main studies. First, a methodology of finding optimal design for ALT with right censoring and interval censoring have been developed and it employs the proportional hazard (PH) model and generalized linear model (GLM) to simplify the computational process. A sensitivity study is also given to show the effects brought by parameters to the designs. Second, an extended version of I-optimal design for ALT is discussed and then a dual-objective design criterion is defined and showed with several examples. Also in order to evaluate different candidate designs, several graphical tools are developed. Finally, when there are more than one models available, different model checking designs are discussed.
ContributorsYang, Tao (Author) / Pan, Rong (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Borror, Connie (Committee member) / Rigdon, Steve (Committee member) / Arizona State University (Publisher)
Created2013
Description
Dimensionality assessment is an important component of evaluating item response data. Existing approaches to evaluating common assumptions of unidimensionality, such as DIMTEST (Nandakumar & Stout, 1993; Stout, 1987; Stout, Froelich, & Gao, 2001), have been shown to work well under large-scale assessment conditions (e.g., large sample sizes and item pools; see e.g., Froelich & Habing, 2007). It remains to be seen how such procedures perform in the context of small-scale assessments characterized by relatively small sample sizes and/or short tests. The fact that some procedures come with minimum allowable values for characteristics of the data, such as the number of items, may even render them unusable for some small-scale assessments. Other measures designed to assess dimensionality do not come with such limitations and, as such, may perform better under conditions that do not lend themselves to evaluation via statistics that rely on asymptotic theory. The current work aimed to evaluate the performance of one such metric, the standardized generalized dimensionality discrepancy measure (SGDDM; Levy & Svetina, 2011; Levy, Xu, Yel, & Svetina, 2012), under both large- and small-scale testing conditions. A Monte Carlo study was conducted to compare the performance of DIMTEST and the SGDDM statistic in terms of evaluating assumptions of unidimensionality in item response data under a variety of conditions, with an emphasis on the examination of these procedures in small-scale assessments. Similar to previous research, increases in either test length or sample size resulted in increased power. The DIMTEST procedure appeared to be a conservative test of the null hypothesis of unidimensionality. The SGDDM statistic exhibited rejection rates near the nominal rate of .05 under unidimensional conditions, though the reliability of these results may have been less than optimal due to high sampling variability resulting from a relatively limited number of replications. Power values were at or near 1.0 for many of the multidimensional conditions. It was only when the sample size was reduced to N = 100 that the two approaches diverged in performance. Results suggested that both procedures may be appropriate for sample sizes as low as N = 250 and tests as short as J = 12 (SGDDM) or J = 19 (DIMTEST). When used as a diagnostic tool, SGDDM may be appropriate with as few as N = 100 cases combined with J = 12 items. The study was somewhat limited in that it did not include any complex factorial designs, nor were the strength of item discrimination parameters or correlation between factors manipulated. It is recommended that further research be conducted with the inclusion of these factors, as well as an increase in the number of replications when using the SGDDM procedure.
ContributorsReichenberg, Ray E (Author) / Levy, Roy (Thesis advisor) / Thompson, Marilyn S. (Thesis advisor) / Green, Samuel B. (Committee member) / Arizona State University (Publisher)
Created2013
Description
This simulation study compared the utility of various discrepancy measures within a posterior predictive model checking (PPMC) framework for detecting different types of data-model misfit in multidimensional Bayesian network (BN) models. The investigated conditions were motivated by an applied research program utilizing an operational complex performance assessment within a digital-simulation educational context grounded in theories of cognition and learning. BN models were manipulated along two factors: latent variable dependency structure and number of latent classes. Distributions of posterior predicted p-values (PPP-values) served as the primary outcome measure and were summarized in graphical presentations, by median values across replications, and by proportions of replications in which the PPP-values were extreme. An effect size measure for PPMC was introduced as a supplemental numerical summary to the PPP-value. Consistent with previous PPMC research, all investigated fit functions tended to perform conservatively, but Standardized Generalized Dimensionality Discrepancy Measure (SGDDM), Yen's Q3, and Hierarchy Consistency Index (HCI) only mildly so. Adequate power to detect at least some types of misfit was demonstrated by SGDDM, Q3, HCI, Item Consistency Index (ICI), and to a lesser extent Deviance, while proportion correct (PC), a chi-square-type item-fit measure, Ranked Probability Score (RPS), and Good's Logarithmic Scale (GLS) were powerless across all investigated factors. Bivariate SGDDM and Q3 were found to provide powerful and detailed feedback for all investigated types of misfit.
ContributorsCrawford, Aaron (Author) / Levy, Roy (Thesis advisor) / Green, Samuel (Committee member) / Thompson, Marilyn (Committee member) / Arizona State University (Publisher)
Created2014
Description
This thesis presents a meta-analysis of lead-free solder reliability. The qualitative analyses of the failure modes of lead- free solder under different stress tests including drop test, bend test, thermal test and vibration test are discussed. The main cause of failure of lead- free solder is fatigue crack, and the speed of propagation of the initial crack could differ from different test conditions and different solder materials. A quantitative analysis about the fatigue behavior of SAC lead-free solder under thermal preconditioning process is conducted. This thesis presents a method of making prediction of failure life of solder alloy by building a Weibull regression model. The failure life of solder on circuit board is assumed Weibull distributed. Different materials and test conditions could affect the distribution by changing the shape and scale parameters of Weibull distribution. The method is to model the regression of parameters with different test conditions as predictors based on Bayesian inference concepts. In the process of building regression models, prior distributions are generated according to the previous studies, and Markov Chain Monte Carlo (MCMC) is used under WinBUGS environment.
ContributorsXu, Xinyue (Author) / Pan, Rong (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Wu, Teresa (Committee member) / Arizona State University (Publisher)
Created2014
Description
The main objective of this research is to develop an approach to PV module lifetime prediction. In doing so, the aim is to move from empirical generalizations to a formal predictive science based on data-driven case studies of the crystalline silicon PV systems. The evaluation of PV systems aged 5 to 30 years old that results in systematic predictive capability that is absent today. The warranty period provided by the manufacturers typically range from 20 to 25 years for crystalline silicon modules. The end of lifetime (for example, the time-to-degrade by 20% from rated power) of PV modules is usually calculated using a simple linear extrapolation based on the annual field degradation rate (say, 0.8% drop in power output per year). It has been 26 years since systematic studies on solar PV module lifetime prediction were undertaken as part of the 11-year flat-plate solar array (FSA) project of the Jet Propulsion Laboratory (JPL) funded by DOE. Since then, PV modules have gone through significant changes in construction materials and design; making most of the field data obsolete, though the effect field stressors on the old designs/materials is valuable to be understood. Efforts have been made to adapt some of the techniques developed to the current technologies, but they are too often limited in scope and too reliant on empirical generalizations of previous results. Some systematic approaches have been proposed based on accelerated testing, but no or little experimental studies have followed. Consequently, the industry does not exactly know today how to test modules for a 20 - 30 years lifetime.
This research study focuses on the behavior of crystalline silicon PV module technology in the dry and hot climatic condition of Tempe/Phoenix, Arizona. A three-phase approach was developed: (1) A quantitative failure modes, effects, and criticality analysis (FMECA) was developed for prioritizing failure modes or mechanisms in a given environment; (2) A time-series approach was used to model environmental stress variables involved and prioritize their effect on the power output drop; and (3) A procedure for developing a prediction model was proposed for the climatic specific condition based on accelerated degradation testing
This research study focuses on the behavior of crystalline silicon PV module technology in the dry and hot climatic condition of Tempe/Phoenix, Arizona. A three-phase approach was developed: (1) A quantitative failure modes, effects, and criticality analysis (FMECA) was developed for prioritizing failure modes or mechanisms in a given environment; (2) A time-series approach was used to model environmental stress variables involved and prioritize their effect on the power output drop; and (3) A procedure for developing a prediction model was proposed for the climatic specific condition based on accelerated degradation testing
ContributorsKuitche, Joseph Mathurin (Author) / Pan, Rong (Thesis advisor) / Tamizhmani, Govindasamy (Thesis advisor) / Montgomery, Douglas C. (Committee member) / Wu, Teresa (Committee member) / Arizona State University (Publisher)
Created2014
Description
Missing data are common in psychology research and can lead to bias and reduced power if not properly handled. Multiple imputation is a state-of-the-art missing data method recommended by methodologists. Multiple imputation methods can generally be divided into two broad categories: joint model (JM) imputation and fully conditional specification (FCS) imputation. JM draws missing values simultaneously for all incomplete variables using a multivariate distribution (e.g., multivariate normal). FCS, on the other hand, imputes variables one at a time, drawing missing values from a series of univariate distributions. In the single-level context, these two approaches have been shown to be equivalent with multivariate normal data. However, less is known about the similarities and differences of these two approaches with multilevel data, and the methodological literature provides no insight into the situations under which the approaches would produce identical results. This document examined five multilevel multiple imputation approaches (three JM methods and two FCS methods) that have been proposed in the literature. An analytic section shows that only two of the methods (one JM method and one FCS method) used imputation models equivalent to a two-level joint population model that contained random intercepts and different associations across levels. The other three methods employed imputation models that differed from the population model primarily in their ability to preserve distinct level-1 and level-2 covariances. I verified the analytic work with computer simulations, and the simulation results also showed that imputation models that failed to preserve level-specific covariances produced biased estimates. The studies also highlighted conditions that exacerbated the amount of bias produced (e.g., bias was greater for conditions with small cluster sizes). The analytic work and simulations lead to a number of practical recommendations for researchers.
ContributorsMistler, Stephen (Author) / Enders, Craig K. (Thesis advisor) / Aiken, Leona (Committee member) / Levy, Roy (Committee member) / West, Stephen G. (Committee member) / Arizona State University (Publisher)
Created2015
Description
In this era of fast computational machines and new optimization algorithms, there have been great advances in Experimental Designs. We focus our research on design issues in generalized linear models (GLMs) and functional magnetic resonance imaging(fMRI). The first part of our research is on tackling the challenging problem of constructing
exact designs for GLMs, that are robust against parameter, link and model
uncertainties by improving an existing algorithm and providing a new one, based on using a continuous particle swarm optimization (PSO) and spectral clustering. The proposed algorithm is sufficiently versatile to accomodate most popular design selection criteria, and we concentrate on providing robust designs for GLMs, using the D and A optimality criterion. The second part of our research is on providing an algorithm
that is a faster alternative to a recently proposed genetic algorithm (GA) to construct optimal designs for fMRI studies. Our algorithm is built upon a discrete version of the PSO.
exact designs for GLMs, that are robust against parameter, link and model
uncertainties by improving an existing algorithm and providing a new one, based on using a continuous particle swarm optimization (PSO) and spectral clustering. The proposed algorithm is sufficiently versatile to accomodate most popular design selection criteria, and we concentrate on providing robust designs for GLMs, using the D and A optimality criterion. The second part of our research is on providing an algorithm
that is a faster alternative to a recently proposed genetic algorithm (GA) to construct optimal designs for fMRI studies. Our algorithm is built upon a discrete version of the PSO.
ContributorsTemkit, M'Hamed (Author) / Kao, Jason (Thesis advisor) / Reiser, Mark R. (Committee member) / Barber, Jarrett (Committee member) / Montgomery, Douglas C. (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2014
Description
Many methodological approaches have been utilized to predict student retention and persistence over the years, yet few have utilized a Bayesian framework. It is believed this is due in part to the absence of an established process for guiding educational researchers reared in a frequentist perspective into the realms of Bayesian analysis and educational data mining. The current study aimed to address this by providing a model-building process for developing a Bayesian network (BN) that leveraged educational data mining, Bayesian analysis, and traditional iterative model-building techniques in order to predict whether community college students will stop out at the completion of each of their first six terms. The study utilized exploratory and confirmatory techniques to reduce an initial pool of more than 50 potential predictor variables to a parsimonious final BN with only four predictor variables. The average in-sample classification accuracy rate for the model was 80% (Cohen's κ = 53%). The model was shown to be generalizable across samples with an average out-of-sample classification accuracy rate of 78% (Cohen's κ = 49%). The classification rates for the BN were also found to be superior to the classification rates produced by an analog frequentist discrete-time survival analysis model.
ContributorsArcuria, Philip (Author) / Levy, Roy (Thesis advisor) / Green, Samuel B (Committee member) / Thompson, Marilyn S (Committee member) / Arizona State University (Publisher)
Created2015
Description
Value-added models (VAMs) are used by many states to assess contributions of individual teachers and schools to students' academic growth. The generalized persistence VAM, one of the most flexible in the literature, estimates the ``value added'' by individual teachers to their students' current and future test scores by employing a mixed model with a longitudinal database of test scores. There is concern, however, that missing values that are common in the longitudinal student scores can bias value-added assessments, especially when the models serve as a basis for personnel decisions -- such as promoting or dismissing teachers -- as they are being used in some states. Certain types of missing data require that the VAM be modeled jointly with the missingness process in order to obtain unbiased parameter estimates. This dissertation studies two problems. First, the flexibility and multimembership random effects structure of the generalized persistence model lead to computational challenges that have limited the model's availability. To this point, no methods have been developed for scalable maximum likelihood estimation of the model. An EM algorithm to compute maximum likelihood estimates efficiently is developed, making use of the sparse structure of the random effects and error covariance matrices. The algorithm is implemented in the package GPvam in R statistical software. Illustrations of the gains in computational efficiency achieved by the estimation procedure are given. Furthermore, to address the presence of potentially nonignorable missing data, a flexible correlated random effects model is developed that extends the generalized persistence model to jointly model the test scores and the missingness process, allowing the process to depend on both students and teachers. The joint model gives the ability to test the sensitivity of the VAM to the presence of nonignorable missing data. Estimation of the model is challenging due to the non-hierarchical dependence structure and the resulting intractable high-dimensional integrals. Maximum likelihood estimation of the model is performed using an EM algorithm with fully exponential Laplace approximations for the E step. The methods are illustrated with data from university calculus classes and with data from standardized test scores from an urban school district.
ContributorsKarl, Andrew (Author) / Lohr, Sharon L (Thesis advisor) / Yang, Yan (Thesis advisor) / Kao, Ming-Hung (Committee member) / Montgomery, Douglas C. (Committee member) / Wilson, Jeffrey R (Committee member) / Arizona State University (Publisher)
Created2012
Description
This dissertation presents methods for addressing research problems that currently can only adequately be solved using Quality Reliability Engineering (QRE) approaches especially accelerated life testing (ALT) of electronic printed wiring boards with applications to avionics circuit boards. The methods presented in this research are generally applicable to circuit boards, but the data generated and their analysis is for high performance avionics. Avionics equipment typically requires 20 years expected life by aircraft equipment manufacturers and therefore ALT is the only practical way of performing life test estimates. Both thermal and vibration ALT induced failure are performed and analyzed to resolve industry questions relating to the introduction of lead-free solder product and processes into high reliability avionics. In chapter 2, thermal ALT using an industry standard failure machine implementing Interconnect Stress Test (IST) that simulates circuit board life data is compared to real production failure data by likelihood ratio tests to arrive at a mechanical theory. This mechanical theory results in a statistically equivalent energy bound such that failure distributions below a specific energy level are considered to be from the same distribution thus allowing testers to quantify parameter setting in IST prior to life testing. In chapter 3, vibration ALT comparing tin-lead and lead-free circuit board solder designs involves the use of the likelihood ratio (LR) test to assess both complete failure data and S-N curves to present methods for analyzing data. Failure data is analyzed using Regression and two-way analysis of variance (ANOVA) and reconciled with the LR test results that indicating that a costly aging pre-process may be eliminated in certain cases. In chapter 4, vibration ALT for side-by-side tin-lead and lead-free solder black box designs are life tested. Commercial models from strain data do not exist at the low levels associated with life testing and need to be developed because testing performed and presented here indicate that both tin-lead and lead-free solders are similar. In addition, earlier failures due to vibration like connector failure modes will occur before solder interconnect failures.
ContributorsJuarez, Joseph Moses (Author) / Montgomery, Douglas C. (Thesis advisor) / Borror, Connie M. (Thesis advisor) / Gel, Esma (Committee member) / Mignolet, Marc (Committee member) / Pan, Rong (Committee member) / Arizona State University (Publisher)
Created2012