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Description
Potential induced degradation (PID) due to high system voltages is one of the major degradation mechanisms in photovoltaic (PV) modules, adversely affecting their performance due to the combined effects of the following factors: system voltage, superstrate/glass surface conductivity, encapsulant conductivity, silicon nitride anti-reflection coating property and interface property (glass/encapsulant; encapsulant/cell;

Potential induced degradation (PID) due to high system voltages is one of the major degradation mechanisms in photovoltaic (PV) modules, adversely affecting their performance due to the combined effects of the following factors: system voltage, superstrate/glass surface conductivity, encapsulant conductivity, silicon nitride anti-reflection coating property and interface property (glass/encapsulant; encapsulant/cell; encapsulant/backsheet). Previous studies carried out at ASU's Photovoltaic Reliability Laboratory (ASU-PRL) showed that only negative voltage bias (positive grounded systems) adversely affects the performance of commonly available crystalline silicon modules. In previous studies, the surface conductivity of the glass surface was obtained using either conductive carbon layer extending from the glass surface to the frame or humidity inside an environmental chamber. This thesis investigates the influence of glass surface conductivity disruption on PV modules. In this study, conductive carbon was applied only on the module's glass surface without extending to the frame and the surface conductivity was disrupted (no carbon layer) at 2cm distance from the periphery of frame inner edges. This study was carried out under dry heat at two different temperatures (60 °C and 85 °C) and three different negative bias voltages (-300V, -400V, and -600V). To replicate closeness to the field conditions, half of the selected modules were pre-stressed under damp heat for 1000 hours (DH 1000) and the remaining half under 200 hours of thermal cycling (TC 200). When the surface continuity was disrupted by maintaining a 2 cm gap from the frame to the edge of the conductive layer, as demonstrated in this study, the degradation was found to be absent or negligibly small even after 35 hours of negative bias at elevated temperatures. This preliminary study appears to indicate that the modules could become immune to PID losses if the continuity of the glass surface conductivity is disrupted at the inside boundary of the frame. The surface conductivity of the glass, due to water layer formation in a humid condition, close to the frame could be disrupted just by applying a water repelling (hydrophobic) but high transmittance surface coating (such as Teflon) or modifying the frame/glass edges with water repellent properties.
ContributorsTatapudi, Sai Ravi Vasista (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Srinivasan, Devarajan (Committee member) / Rogers, Bradley (Committee member) / Arizona State University (Publisher)
Created2012
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Description
Bifacial photovoltaic modules are a relatively new development in the photovoltaic industry which allows for the collection and conversion of light on both sides of photovoltaic modules to usable electricity. Additional energy yield from bifacial photovoltaic modules, despite a slight increase in cost due to manufacturing processes of the bifacial

Bifacial photovoltaic modules are a relatively new development in the photovoltaic industry which allows for the collection and conversion of light on both sides of photovoltaic modules to usable electricity. Additional energy yield from bifacial photovoltaic modules, despite a slight increase in cost due to manufacturing processes of the bifacial cells, has the potential to significantly decrease the LCOE of photovoltaic installation. The performance of bifacial modules is dependent on three major factors: incident irradiation on the front side of the module, reflected irradiation on the back side of the module, and the module's bifaciality. Bifaciality is an inherent property of the photovoltaic cells and is determined by the performance of the front and rear side of the module when tested at STC. The reflected light on the back side of the module, however, is determined by several different factors including the incident ground irradiance, shading from the modules and racking system, height of the module installation, and ground albedo. Typical ground surfaces have a low albedo, which means that the magnitude of reflected light is a low percentage of the incident irradiance. Non-uniformity of back-side irradiance can also reduce the power generation due to cell-to-cell mismatch losses. This study investigates the use of controlled back-side reflectors to improve the irradiance on the back side of loosely packed 48-cell bifacial modules and compares this performance to the performance of 48 and 60-cell bifacial modules which rely on the uncontrolled reflection off nearby ground surfaces. Different construction geometries and reflective coating materials were tested to determine optimal construction to improve the reflectivity and uniformity of reflection. Results of this study show a significant improvement of 10-14% total energy production from modules with reflectors when compared to the 48-cell module with an uncontrolled ground reflection.
ContributorsBowersox, David Andrew (Author) / Tamizhmani, Govindasamy (Thesis director) / Srinivasan, Devarajan (Committee member) / School for Engineering of Matter, Transport and Energy (Contributor) / Engineering Programs (Contributor) / Barrett, The Honors College (Contributor)
Created2018-05
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Description
As the photovoltaic (PV) power plants age in the field, the PV modules degrade and generate visible and invisible defects. A defect and statistical degradation rate analysis of photovoltaic (PV) power plants is presented in two-part thesis. The first part of the thesis deals with the defect analysis and the

As the photovoltaic (PV) power plants age in the field, the PV modules degrade and generate visible and invisible defects. A defect and statistical degradation rate analysis of photovoltaic (PV) power plants is presented in two-part thesis. The first part of the thesis deals with the defect analysis and the second part of the thesis deals with the statistical degradation rate analysis. In the first part, a detailed analysis on the performance or financial risk related to each defect found in multiple PV power plants across various climatic regions of the USA is presented by assigning a risk priority number (RPN). The RPN for all the defects in each PV plant is determined based on two databases: degradation rate database; defect rate database. In this analysis it is determined that the RPN for each plant is dictated by the technology type (crystalline silicon or thin-film), climate and age. The PV modules aging between 3 and 19 years in four different climates of hot-dry, hot-humid, cold-dry and temperate are investigated in this study.

In the second part, a statistical degradation analysis is performed to determine if the degradation rates are linear or not in the power plants exposed in a hot-dry climate for the crystalline silicon technologies. This linearity degradation analysis is performed using the data obtained through two methods: current-voltage method; metered kWh method. For the current-voltage method, the annual power degradation data of hundreds of individual modules in six crystalline silicon power plants of different ages is used. For the metered kWh method, a residual plot analysis using Winters’ statistical method is performed for two crystalline silicon plants of different ages. The metered kWh data typically consists of the signal and noise components. Smoothers remove the noise component from the data by taking the average of the current and the previous observations. Once this is done, a residual plot analysis of the error component is performed to determine the noise was successfully separated from the data by proving the noise is random.
ContributorsSundarajan, Prasanna (Author) / Tamizhmani, Govindasamy (Thesis advisor) / Rogers, Bradley (Committee member) / Srinivasan, Devarajan (Committee member) / Arizona State University (Publisher)
Created2016