Matching Items (5)
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- All Subjects: Memory
- Creators: Benkert, Volker
- Creators: Electrical Engineering Program
- Member of: Barrett, The Honors College Thesis/Creative Project Collection
- Resource Type: Text
Description
The Soviet Union suffered immensely as a result of World War II. When the dust settled and Soviet citizens began to rebuild their lives, the memory of the social, economic, and human costs of the war still remained. The Soviet state sought to frame the conflict in a way that provided meaning to the chaos that so drastically shaped the lives of its citizens. Film was one such way. Film, heavily censored until the Gorbachev period, provided the state with an easily malleable and distributable means of sharing official history and official memory. However, as time went on, film began to blur the lines between official memory and real history, providing opportunities for directors to create stories that challenged the regime's official war mythology. This project examines seven Soviet war films (The Fall of Berlin (1949), The Cranes are Flying (1957), Ballad of a Soldier (1959), Ivan's Childhood (1962), Liberation (1970-1971), The Ascent (1977), and Come and See (1985)) in the context of the regimes under which they were released. I examine the themes present within these films, comparing and contrasting them across multiple generations of Soviet post-war memory.
ContributorsScribner, Quinton Donald (Author) / Benkert, Volker (Thesis director) / Von Hagen, Mark (Committee member) / Manchester, Laurie (Committee member) / Barrett, The Honors College (Contributor) / School of International Letters and Cultures (Contributor) / School of Politics and Global Studies (Contributor) / School of Historical, Philosophical and Religious Studies (Contributor)
Created2014-05
Description
The Soviet Union suffered immensely as a result of World War II. When the dust settled and Soviet citizens began to rebuild their lives, the memory of the social, economic, and human costs of the war still remained. The Soviet state sought to frame the conflict in a way that provided meaning to the chaos that so drastically shaped the lives of its citizens. Film was one such way. Film, heavily censored until the Gorbachev period, provided the state with an easily malleable and distributable means of sharing official history and official memory. However, as time went on, film began to blur the lines between official memory and real history, providing opportunities for directors to create stories that challenged the regime's official war mythology. This project examines seven Soviet war films (The Fall of Berlin (1949), The Cranes are Flying (1957), Ballad of a Soldier (1959), Ivan's Childhood (1962), Liberation (1970-1971), The Ascent (1977), and Come and See (1985)) in the context of the regimes under which they were released. I examine the themes present within these films, comparing and contrasting them across multiple generations of Soviet post-war memory.
ContributorsScribner, Quinton Donald (Author) / Benkert, Volker (Thesis director) / Von Hagen, Mark (Committee member) / Manchester, Laurie (Committee member) / Barrett, The Honors College (Contributor) / School of International Letters and Cultures (Contributor) / School of Politics and Global Studies (Contributor) / School of Historical, Philosophical and Religious Studies (Contributor)
Created2014-05
Description
Resistive Random Access Memory (RRAM) is an emerging type of non-volatile memory technology that seeks to replace FLASH memory. The RRAM crossbar array is advantageous in its relatively small cell area and faster read latency in comparison to NAND and NOR FLASH memory; however, the crossbar array faces design challenges of its own in sneak-path currents that prevent proper reading of memory stored in the RRAM cell. The Current Sensing Amplifier is one method of reading RRAM crossbar arrays. HSpice simulations are used to find the associated reading delays of the Current Sensing Amplifier with respect to various sizes of RRAM crossbar arrays, as well as the largest array size compatible for accurate reading. It is found that up to 1024x1024 arrays are achievable with a worst-case read delay of 815ps, and it is further likely 2048x2048 arrays are able to be read using the Current Sensing Amplifier. In comparing the Current Sensing Amplifier latency results with previously obtained latency results from the Voltage Sensing Amplifier, it is shown that the Voltage Sensing Amplifier reads arrays in sizes up to 256x256 faster while the Current Sensing Amplifier reads larger arrays faster.
ContributorsMoore, Jenna Barber (Author) / Yu, Shimeng (Thesis director) / Liu, Rui (Committee member) / Electrical Engineering Program (Contributor) / Barrett, The Honors College (Contributor)
Created2016-12
Description
This thesis outlines the hand-held memory characterization testing system that is to be created into a PCB (printed circuit board). The circuit is designed to apply voltages diagonally through a RRAM cell (32x32 memory array). The purpose of this sweep across the RRAM is to measure and calculate the high and low resistance state value over a specified amount of testing cycles. With each cell having a unique output of high and low resistance states a unique characterization of each RRAM cell is able to be developed. Once the memory is characterized, the specific RRAM cell that was tested is then able to be used in a varying amount of applications for different things based on its uniqueness. Due to an inability to procure a packaged RRAM cell, a Mock-RRAM was instead designed in order to emulate the same behavior found in a RRAM cell.
The final testing circuit and Mock-RRAM are varied and complex but come together to be able to produce a measured value of the high resistance and low resistance state. This is done by the Arduino autonomously digitizing the anode voltage, cathode voltage, and output voltage. A ramp voltage that sweeps from 1V to -1V is applied to the Mock-RRAM acting as an input. This ramp voltage is then later defined as the anode voltage which is just one of the two nodes connected to the Mock-RRAM. The cathode voltage is defined as the other node at which the voltage drops across the Mock-RRAM. Using these three voltages as input to the Arduino, the Mock-RRAM path resistance is able to be calculated at any given point in time. Conducting many test cycles and calculating the high and low resistance values allows for a graph to be developed of the chaotic variation of resistance state values over time. This chaotic variation can then be analyzed further in the future in order to better predict trends and characterize the RRAM cell that was tested.
Furthermore, the interchangeability of many devices on the PCB allows for the testing system to do more in the future. Ports have been added to the final PCB in order to connect a packaged RRAM cell. This will allow for the characterization of a real RRAM memory cell later down the line rather than a Mock-RRAM as emulation. Due to the autonomous testing, very few human intervention is needed which makes this board a great baseline for others in the future looking to add to it and collect larger pools of data.
The final testing circuit and Mock-RRAM are varied and complex but come together to be able to produce a measured value of the high resistance and low resistance state. This is done by the Arduino autonomously digitizing the anode voltage, cathode voltage, and output voltage. A ramp voltage that sweeps from 1V to -1V is applied to the Mock-RRAM acting as an input. This ramp voltage is then later defined as the anode voltage which is just one of the two nodes connected to the Mock-RRAM. The cathode voltage is defined as the other node at which the voltage drops across the Mock-RRAM. Using these three voltages as input to the Arduino, the Mock-RRAM path resistance is able to be calculated at any given point in time. Conducting many test cycles and calculating the high and low resistance values allows for a graph to be developed of the chaotic variation of resistance state values over time. This chaotic variation can then be analyzed further in the future in order to better predict trends and characterize the RRAM cell that was tested.
Furthermore, the interchangeability of many devices on the PCB allows for the testing system to do more in the future. Ports have been added to the final PCB in order to connect a packaged RRAM cell. This will allow for the characterization of a real RRAM memory cell later down the line rather than a Mock-RRAM as emulation. Due to the autonomous testing, very few human intervention is needed which makes this board a great baseline for others in the future looking to add to it and collect larger pools of data.
ContributorsDobrin, Ryan Christopher (Co-author) / Halden, Matthew (Co-author) / Hall, Tanner (Co-author) / Barnaby, Hugh (Thesis director) / Kitchen, Jennifer (Committee member) / Electrical Engineering Program (Contributor, Contributor) / Barrett, The Honors College (Contributor)
Created2019-05
Description
In the sixty-seven years following the end of World War II, West Germany and Japan underwent a remarkable series of economic and social changes that irrevocably altered their respective ways of life. Formerly xenophobic, militaristic and highly socially stratified societies, both emerged from the 20th Century as liberal, prosperous and free. Both made great strides well beyond the expectations of their occupiers, and rebounded from the overwhelming destruction of their national economies within a few short decades. While these changes have yielded dramatic results, the wartime period still looms large in their respective collective memories. Therefore, an ongoing and diverse dialectical process would engage the considerable popular, official, and intellectual energy of their post-war generations. In West Germany, the term Vergangenheitsbewältigung (VGB) emerged to describe a process of coming to terms with the past, while the Japanese chose kako no kokufuku to describe their similar historical sojourns. Although intellectuals of widely varying backgrounds in both nations made great strides toward making Japanese and German citizens cognizant of the roles that their militaries played in gruesome atrocities, popular cinematic productions served to reiterate older, discredited assertions of the fundamental honor and innocence of the average soldier, thereby nurturing a historically revisionist line of reasoning that continues to compete for public attention. All forms of media would play an important role in sustaining this “apologetic narrative,” and cinema, among the most popular and visible of these mediums, was not excluded from this. Indeed, films would play a unique recurring role, like rhetorical time capsules, in offering a sanitized historical image of Japanese and German soldiers that continues to endure in modern times. Nevertheless, even as West Germany and Japan regained their sovereignty and re-examined their pasts with ever greater resolution and insight, their respective film industries continued to “reset” the clock, and accentuated the visibility and relevancy of apologetic forces still in existence within both societies. However, it is important to note that, when speaking of “Germans” and “Japanese,” that they are not meant to be thought of as being uniformly of one mind or another. Rather, the use of these words is meant as convenient shorthand to refer to the dominant forces in Japanese and German civil society at any given time over the course of their respective post- war histories. Furthermore, references to “Germany” during the Cold War period are to be understood to mean the Federal Republic of Germany, rather than their socialist counterpart, the German Democratic Republic, a nation that undertook its own coming to terms with the past in an entirely distinct fashion.
ContributorsPiscopo, Michael (Author) / Benkert, Volker (Thesis director) / Moore, Aaron (Committee member) / Machander, Sina (Committee member) / Barrett, The Honors College (Contributor) / College of Liberal Arts and Sciences (Contributor)
Created2012-12