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- All Subjects: Electrical Engineering
- Creators: Ozev, Sule
Description
Current technology does not allow for the full amount of power produced by solar arrays (PV) on spacecraft to be utilized. The arrays are designed with non-reconfigurable architectures and sent on fifteen to twenty year long missions. They cannot be changed once they are in space, so the arrays are designed for the end of life. Throughout their lifetime, solar arrays can degrade in power producing capabilities anywhere from 20% to 50%. Because there is such a drastic difference in the beginning and end of life power production, and because they cannot be reconfigured, a new design has been found necessary in order to increase power production. Reconfiguration allows the solar arrays to achieve maximum power producing capabilities at both the beginning and end of their lives. With the potential to increase power production by 50%, the reconfiguration design consists of a switching network to be able to utilize any combination of cells. The design for reconfiguration must meet the power requirements of the solar array. This thesis will explore different designs for reconfiguration, as well as possible switches for implementation. It will also review other methods to increase power production, as well as discuss future work in this field.
ContributorsJohnson, Everett Hope (Author) / Kitchen, Jennifer (Thesis director) / Ozev, Sule (Committee member) / School of International Letters and Cultures (Contributor) / Electrical Engineering Program (Contributor) / Barrett, The Honors College (Contributor)
Created2018-05
Description
Accessibility to the internal nodes of an analog/mixed-signal circuit while testing is extremely difficult. Furthermore, with technology scaling, the effect of process variations becomes more pronounced which in turn effects the test time, test cost, and die yield. As devices become more unreliable, the probability of failure of a die increases, yield decreases affecting the quality of test and cost.Therefore, test time minimization and test cost reduction are important. Moreover, process variations can affect the performance of analog/mixed circuits. Therefore, the performance of a System On-Chip(SoC) which tends to integrate multiple band gap reference circuits (BGRs) is effected due to the wide variations caused in the behavior of the BGR as a result of increasing process variations. Calibration of the BGR is, thus, important in the test process so as to obtain accuracy in the measurement of the output voltage of BGR. Furthermore, as test time minimization and test cost reduction are important in a test process, Built-in Self Test (BIST) techniques have become more popular. To obtain accuracy in the measurement of the output voltage of BGR, a VCO-based zoom-in ADC architecture that was designed to calibrate the output of the BGR voltage which dictates the circuit performance. However, the zoom-voltages for the circuit are generated using a tester. As the number of such ADCs integrated on a SoC increase, the number of nodes to be accessed by the tester increase. Moreover, the capacitance of the probe affects the accuracy of the applied input voltages of the VCO-based ADC. Therefore, accessibility decreases with increase in scaling.Further, generating a wide range of inputs becomes burdensome for the tester. For all the above reasons, an on-chip DAC circuitry was proposed as a part of this thesis, to decrease the reliance on tester. The suggested DAC architecture is a simple resistor string whose resolution depends on the number of zoom-in voltages to be generated. This architecture has a linear and monotonic behavior which is very important as the VCO has a highly non-linear behavior. Thus, the voltages generated by the DAC should be accurate with minimum error so that the worst-case Integral Non-Linearity error (INL) is less than 1mV considering resistor mismatches over process variations. With the increase in the number of VCO-based ADCs on a chip, the test time savings increase exponentially. Thus, the introduction of an on-chip DAC circuitry offers various advantages like decreasing accessibility requirement during the test process, occupying less area, reducing test cost and most importantly, decreasing the reliance on tester.
ContributorsRavouri, Yestina (Author) / Ozev, Sule (Thesis advisor) / Ogras, Umit Y. (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2017
Description
With the natural resources of earth depleting very fast, the natural resources of other celestial bodies are considered a potential replacement. Thus, there has been rise of space missions constantly and with it the need of more sophisticated spectrometer devices has increased. The most important requirement in such an application is low area and power consumption.
To save area, some scintillators have been developed that can resolve both neutrons and gamma events rather than traditional scintillators which can do only one of these and thus, the spacecraft needs two such devices. But with this development, the requirements out of the readout electronics has also increased which now need to discriminate between neutron and gamma events.
This work presents a novel architecture for discriminating such events and compares the results with another approach developed by a partner company. The results show excellent potential in this approach for the neutron-gamma discrimination and the team at ASU is going to expand on this design and build up a working prototype for the complete spectrometer device.
To save area, some scintillators have been developed that can resolve both neutrons and gamma events rather than traditional scintillators which can do only one of these and thus, the spacecraft needs two such devices. But with this development, the requirements out of the readout electronics has also increased which now need to discriminate between neutron and gamma events.
This work presents a novel architecture for discriminating such events and compares the results with another approach developed by a partner company. The results show excellent potential in this approach for the neutron-gamma discrimination and the team at ASU is going to expand on this design and build up a working prototype for the complete spectrometer device.
ContributorsGupta, Kush (Author) / Barnaby, Hugh (Thesis advisor) / Hardgrove, Craig (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2017
Description
This thesis describes the design process used in the creation of a two stage cellular power amplifier. A background for understanding amplifier linearity, device properties, and ACLR estimation is provided. An outline of the design goals is given with a focus on linearity with high efficiency. The full design is broken into smaller elements which are discussed in detail. The main contribution of this thesis is the description of a novel interstage matching network topology for increasing efficiency. Ultimately the full amplifier design is simulated and compared to the measured results and design goals. It was concluded that the design was successful, and used in a commercially available product.
ContributorsSpivey, Erin (Author) / Aberle, James T., 1961- (Thesis advisor) / Kitchen, Jennifer (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2012
Description
Mobile electronic devices such as smart phones, netbooks and tablets have seen increasing demand in recent years, and so has the need for efficient, responsive and small power management solutions that are integrated into these devices. Every thing from the battery life to the screen brightness to how warm the device gets depends on the power management solution integrated within the device. Much of the future success of these mobile devices will depend on innovative, reliable and efficient power solutions. Perhaps this is one of the drivers behind the intense research activity seen in the power management field in recent years. The demand for higher accuracy regulation and fast response in switching converters has led to the exploration of digital control techniques as a way to implement more advanced control architectures. In this thesis, a novel digitally controlled step-down (buck) switching converter architecture that makes use of switched capacitors to improve the transient response is presented. Using the proposed architecture, the transient response is improved by a factor of two or more in comparison to the theoretical limits that can be achieved with a basic step down converter control architecture. The architecture presented in this thesis is not limited to digitally controlled topologies but rather can also be used in analog topologies as well. Design and simulation results of a 1.8V, 15W, 1MHz digitally controlled step down converter with a 12mV Analog to Digital Converter (ADC) resolution and a 2ns DPWM (Digital Pulse Width Modulator) resolution are presented.
ContributorsHashim, Ahmed (Author) / Bakkaloglu, Bertan (Thesis advisor) / Kiaei, Sayfe (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2013
Description
In thesis, a test time reduction (a low cost test) methodology for digitally-calibrated pipeline analog-to-digital converters (ADCs) is presented. A long calibration time is required in the final test to validate performance of these designs. To reduce total test time, optimized calibration technique and calibrated effective number of bits (ENOB) prediction from calibration coefficient will be presented. With the prediction technique, failed devices can be identified only without actual calibration. This technique reduces significant amount of time for the total test time.
ContributorsKim, Kibeom (Author) / Ozev, Sule (Thesis advisor) / Kitchen, Jennifer (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2013
Description
In this thesis two methodologies have been proposed for evaluating the fault response of analog/RF circuits. These proposed approaches are used to evaluate the response of the faulty circuit in terms of specifications/measurements. Faulty response can be used to evaluate important test metrics like fail probability, fault coverage and yield coverage of given measurements under process variations. Once the models for faulty and fault free circuit are generated, one needs to perform Monte Carlo sampling (as opposed to Monte Carlo simulations) to compute these statistical parameters with high accuracy. The first method is based on adaptively determining the order of the model based on the error budget in terms of computing the statistical metrics and position of the threshold(s) to decide how precisely necessary models need to be extracted. In the second method, using hierarchy in process variations a hybrid of heuristics and localized linear models have been proposed. Experiments on LNA and Mixer using the adaptive model order selection procedure can reduce the number of necessary simulations by 7.54x and 7.03x respectively in the computation of fail probability for an error budget of 2%. Experiments on LNA using the hybrid approach can reduce the number of necessary simulations by 21.9x and 17x for four and six output parameters cases for improved accuracy in test statistics estimation.
ContributorsSubrahmaniyan Radhakrishnan, Gurusubrahmaniyan (Author) / Ozev, Sule (Thesis advisor) / Blain Christen, Jennifer (Committee member) / Cao, Yu (Committee member) / Arizona State University (Publisher)
Created2010
Description
An investigation of phase noise in amplifier and voltage-controller oscillator (VCO) circuits was conducted to show that active direct-current (DC) bias techniques exhibit lower phase noise performance than traditional resistive DC bias techniques. Low-frequency high-gain amplifiers like those found in audio applications exhibit much better 1/f phase noise performance and can be used to bias amplifier or VCO circuits that work at much higher frequencies to reduce the phase modulation caused by higher frequency devices. An improvement in single-side-band (SSB) phase noise of 15 dB at offset frequencies less than 50 KHz was simulated and measured. Residual phase noise of an actively biased amplifier also exhibited significant noise improvements when compared to an equivalent resistive biased amplifier.
ContributorsBaldwin, Jeremy Bart (Author) / Aberle, James T., 1961- (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2010
Description
Portable health diagnostic systems seek to perform medical grade diagnostics in non-ideal environments. This work details a robust fault tolerant portable health diagnostic design implemented in hardware, firmware and software for the detectionof HPV in low-income countries. The device under device under test (DUT) is a fluorescence based lateral flow assay (LFA) point-of-care (POC) device. This work’s contributions are: firmware and software development, calibration routine implementation, device performance characterization and a proposed method of in-software fault detection. Firmware was refactored from the original implementation of the POC fluorescence reader to expose an application programming interface (API) via USB. Companion software available for desktop environments (Windows, Mac and Linux) was created to interface with this firmware API and conduct macro level routines to request and receive fluorescence data while presenting a user-friendly interface to clinical technicians. Lastly, an environmental chamber was constructed to conduct sequential diagnostic reads in order to observe sensor drift and other deviations that might present themselves in real-world usage. The results from these evaluations show a standard deviation of less than 1% in fluorescence readings in nominal temperature environments (approx. 25C) suggesting that this system will have a favorable signal-to-noise (SNR) ratio in such a setting. In non-ideal over heated environments (≥38C), the evaluation results showed performance degradation with standard deviations as large as 15%.
ContributorsLue Sang, Christopher David (Author) / Blain Christen, Jennifer M (Thesis advisor) / Ozev, Sule (Committee member) / Goryll, Michael (Committee member) / Raupp, Gregory (Committee member) / Arizona State University (Publisher)
Created2022
Description
Testing and calibration constitute a significant part of the overall manufacturing cost of microelectromechanical system (MEMS) devices. Developing a low-cost testing and calibration scheme applicable at the user side that ensures the continuous reliability and accuracy is a crucial need. The main purpose of testing is to eliminate defective devices and to verify the qualifications of a product is met. The calibration process for capacitive MEMS devices, for the most part, entails the determination of the mechanical sensitivity. In this work, a physical-stimulus-free built-in-self-test (BIST) integrated circuit (IC) design characterizing the sensitivity of capacitive MEMS accelerometers is presented. The BIST circuity can extract the amplitude and phase response of the acceleration sensor's mechanics under electrical excitation within 0.55% of error with respect to its mechanical sensitivity under the physical stimulus. Sensitivity characterization is performed using a low computation complexity multivariate linear regression model. The BIST circuitry maximizes the use of existing analog and mixed-signal readout signal chain and the host processor core, without the need for computationally expensive Fast Fourier Transform (FFT)-based approaches. The BIST IC is designed and fabricated using the 0.18-µm CMOS technology. The sensor analog front-end and BIST circuitry are integrated with a three-axis, low-g capacitive MEMS accelerometer in a single hermetically sealed package. The BIST circuitry occupies 0.3 mm2 with a total readout IC area of 1.0 mm2 and consumes 8.9 mW during self-test operation.
ContributorsOzel, Muhlis Kenan (Author) / Bakkaloglu, Bertan (Thesis advisor) / Ozev, Sule (Thesis advisor) / Kiaei, Sayfe (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2017