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Description
With the natural resources of earth depleting very fast, the natural resources of other celestial bodies are considered a potential replacement. Thus, there has been rise of space missions constantly and with it the need of more sophisticated spectrometer devices has increased. The most important requirement in such an application

With the natural resources of earth depleting very fast, the natural resources of other celestial bodies are considered a potential replacement. Thus, there has been rise of space missions constantly and with it the need of more sophisticated spectrometer devices has increased. The most important requirement in such an application is low area and power consumption.

To save area, some scintillators have been developed that can resolve both neutrons and gamma events rather than traditional scintillators which can do only one of these and thus, the spacecraft needs two such devices. But with this development, the requirements out of the readout electronics has also increased which now need to discriminate between neutron and gamma events.

This work presents a novel architecture for discriminating such events and compares the results with another approach developed by a partner company. The results show excellent potential in this approach for the neutron-gamma discrimination and the team at ASU is going to expand on this design and build up a working prototype for the complete spectrometer device.
ContributorsGupta, Kush (Author) / Barnaby, Hugh (Thesis advisor) / Hardgrove, Craig (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2017
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Description
The market for high speed camera chips, or image sensors, has experienced rapid growth over the past decades owing to its broad application space in security, biomedical equipment, and mobile devices. CMOS (complementary metal-oxide-semiconductor) technology has significantly improved the performance of the high speed camera chip by enabling the monolithic

The market for high speed camera chips, or image sensors, has experienced rapid growth over the past decades owing to its broad application space in security, biomedical equipment, and mobile devices. CMOS (complementary metal-oxide-semiconductor) technology has significantly improved the performance of the high speed camera chip by enabling the monolithic integration of pixel circuits and on-chip analog-to-digital conversion. However, for low light intensity applications, many CMOS image sensors have a sub-optimum dynamic range, particularly in high speed operation. Thus the requirements for a sensor to have a high frame rate and high fill factor is attracting more attention. Another drawback for the high speed camera chip is its high power demands due to its high operating frequency. Therefore, a CMOS image sensor with high frame rate, high fill factor, high voltage range and low power is difficult to realize.

This thesis presents the design of pixel circuit, the pixel array and column readout chain for a high speed camera chip. An integrated PN (positive-negative) junction photodiode and an accompanying ten transistor pixel circuit are implemented using a 0.18 µm CMOS technology. Multiple methods are applied to minimize the subthreshold currents, which is critical for low light detection. A layout sharing technique is used to increase the fill factor to 64.63%. Four programmable gain amplifiers (PGAs) and 10-bit pipeline analog-to-digital converters (ADCs) are added to complete on-chip analog to digital conversion. The simulation results of extracted circuit indicate ENOB (effective number of bits) is greater than 8 bits with FoM (figures of merit) =0.789. The minimum detectable voltage level is determined to be 470μV based on noise analysis. The total power consumption of PGA and ADC is 8.2mW for each conversion. The whole camera chip reaches 10508 frames per second (fps) at full resolution with 3.1mm x 3.4mm area.
ContributorsZhao, Tong (Author) / Barnaby, Hugh (Thesis advisor) / Mikkola, Esko (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Arizona State University (Publisher)
Created2017
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Description
In thesis, a test time reduction (a low cost test) methodology for digitally-calibrated pipeline analog-to-digital converters (ADCs) is presented. A long calibration time is required in the final test to validate performance of these designs. To reduce total test time, optimized calibration technique and calibrated effective number of bits (ENOB)

In thesis, a test time reduction (a low cost test) methodology for digitally-calibrated pipeline analog-to-digital converters (ADCs) is presented. A long calibration time is required in the final test to validate performance of these designs. To reduce total test time, optimized calibration technique and calibrated effective number of bits (ENOB) prediction from calibration coefficient will be presented. With the prediction technique, failed devices can be identified only without actual calibration. This technique reduces significant amount of time for the total test time.
ContributorsKim, Kibeom (Author) / Ozev, Sule (Thesis advisor) / Kitchen, Jennifer (Committee member) / Barnaby, Hugh (Committee member) / Arizona State University (Publisher)
Created2013
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Description
With the advent of parallel processing, primarily the time-interleaved pipeline ADCs, high speed and high resolution ADCs became a possibility. When these speeds touch giga samples per second and resolutions go beyond 12-bits, the parallelization becomes more extensive leading to repeated presence of several identical blocks in the architecture. This

With the advent of parallel processing, primarily the time-interleaved pipeline ADCs, high speed and high resolution ADCs became a possibility. When these speeds touch giga samples per second and resolutions go beyond 12-bits, the parallelization becomes more extensive leading to repeated presence of several identical blocks in the architecture. This thesis discusses one such block, the sub-ADC (Flash ADC), of the pipeline and sharing it with more than two of the parallel processing channels thereby reducing area and power and input load capacitance to each stage. This work presents a design of 'sub-ADC shared in a time-interleaved pipeline ADC' in the IBM 8HP process. It has been implemented with an offset-compensated, kickback-compensated, fast decision making (large input bandwidth) and low power comparator that forms the core part of the design.
ContributorsBikkina, Phaneendra Kumar (Author) / Barnaby, Hugh (Thesis advisor) / Mikkola, Esko (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2013
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Description
The thesis focuses on cost-efficient integration of the electro-chemical residue sensor (ECRS), a novel sensor developed for the in situ and real-time measurement of the residual impurities left on the wafer surface and in the fine structures of patterned wafers during typical rinse processes, and wireless transponder circuitry that is

The thesis focuses on cost-efficient integration of the electro-chemical residue sensor (ECRS), a novel sensor developed for the in situ and real-time measurement of the residual impurities left on the wafer surface and in the fine structures of patterned wafers during typical rinse processes, and wireless transponder circuitry that is based on RFID technology. The proposed technology uses only the NMOS FD-SOI transistors with amorphous silicon as active material with silicon nitride as a gate dielectric. The proposed transistor was simulated under the SILVACO ATLAS Simulation Framework. A parametric study was performed to study the impact of different gate lengths (6 μm to 56 μm), electron motilities (0.1 cm2/Vs to 1 cm2/Vs), gate dielectric (SiO2 and SiNx) and active materials (a-Si and poly-Si) specifications. Level-1 models, that are accurate enough to acquire insight into the circuit behavior and perform preliminary design, were successfully constructed by analyzing drain current and gate to node capacitance characteristics against drain to source and gate to source voltages. Using the model corresponding to SiNx as gate dielectric, a-Si:H as active material with electron mobility equal to 0.4 cm2/V-sec, an operational amplifier was designed and was tested in unity gain configuration at modest load-frequency specifications.
ContributorsPandit, Vedhas (Author) / Vermeire, Bert (Thesis advisor) / Barnaby, Hugh (Committee member) / Chae, Junseok (Committee member) / Arizona State University (Publisher)
Created2010
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Description
In this work, a high resolution analog-to-digital converter (ADC) for use in harsh environments is presented. The ADC is implemented in bulk CMOS technology and is intended for space exploration, mining and automotive applications with a range of temperature variation in excess of 250°C. A continuous time (CT) sigma delta

In this work, a high resolution analog-to-digital converter (ADC) for use in harsh environments is presented. The ADC is implemented in bulk CMOS technology and is intended for space exploration, mining and automotive applications with a range of temperature variation in excess of 250°C. A continuous time (CT) sigma delta modulator employing a cascade of integrators with feed forward (CIFF) architecture in a single feedback loop topology is used for implementing the ADC. In order to enable operation in the intended application environments, an RC time constant tuning engine is proposed. The tuning engine is used to maintain linearity of a 10 ksps 20 bit continuous time sigma delta ADC designed for spectroscopy applications in space. The proposed circuit which is based on master slave architecture automatically selects on chip resistors to control RC time constants to an accuracy range of ±5% to ±1%. The tuning range, tuning accuracy and circuit non-idealities are analyzed theoretically. To verify the concept, an experimental chip was fabricated in JAZZ .18µm 1.8V CMOS technology. The tuning engine which occupies an area of .065mm2; consists of only an integrator, a comparator and a shift register. It can achieve a signal to noise and distortion ratio (SNDR) greater than 120dB over a ±40% tuning range.
ContributorsAnabtawi, Nijad (Author) / Barnaby, Hugh (Thesis advisor) / Vermeire, Bert (Committee member) / Gildenblat, Gennady (Committee member) / Chae, Junseok (Committee member) / Arizona State University (Publisher)
Created2011
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Description
The RADiation sensitive Field Effect Transistor (RADFET) has been conventionally used to measure radiation dose levels. These dose sensors are calibrated in such a way that a shift in threshold voltage, due to a build-up of oxide-trapped charge, can be used to estimate the radiation dose. In order to estimate

The RADiation sensitive Field Effect Transistor (RADFET) has been conventionally used to measure radiation dose levels. These dose sensors are calibrated in such a way that a shift in threshold voltage, due to a build-up of oxide-trapped charge, can be used to estimate the radiation dose. In order to estimate the radiation dose level using RADFET, a wired readout circuit is necessary. Using the same principle of oxide-trapped charge build-up, but by monitoring the change in capacitance instead of threshold voltage, a wireless dose sensor can be developed. This RADiation sensitive CAPacitor (RADCAP) mounted on a resonant patch antenna can then become a wireless dose sensor. From the resonant frequency, the capacitance can be extracted which can be mapped back to estimate the radiation dose level. The capacitor acts as both radiation dose sensor and resonator element in the passive antenna loop. Since the MOS capacitor is used in passive state, characterizing various parameters that affect the radiation sensitivity is essential. Oxide processing technique, choice of insulator material, and thickness of the insulator, critically affect the dose response of the sensor. A thicker oxide improves the radiation sensitivity but reduces the dynamic range of dose levels for which the sensor can be used. The oxide processing scheme primarily determines the interface trap charge and oxide-trapped charge development; controlling this parameter is critical to building a better dose sensor.
ContributorsSrinivasan Gopalan, Madusudanan (Author) / Barnaby, Hugh (Thesis advisor) / Holbert, Keith E. (Committee member) / Yu, Hongyu (Committee member) / Arizona State University (Publisher)
Created2010
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Description
Proton beam therapy has been proven to be effective for cancer treatment. Protons allow for complete energy deposition to occur inside patients, rendering this a superior treatment compared to other types of radiotherapy based on photons or electrons. This same characteristic makes quality assurance critical driving the need for detectors

Proton beam therapy has been proven to be effective for cancer treatment. Protons allow for complete energy deposition to occur inside patients, rendering this a superior treatment compared to other types of radiotherapy based on photons or electrons. This same characteristic makes quality assurance critical driving the need for detectors capable of direct beam positioning and fluence measurement. This work showcases a flexible and scalable data acquisition system for a multi-channel and segmented readout parallel plate ionization chamber instrument for proton beam fluence and positioning detection. Utilizing readily available, modern, off-the-shelf hardware components, including an FPGA with an embedded CPU in the same package, a data acquisition system for the detector was designed. The undemanding detector signal bandwidth allows the absence of ASICs and their associated costs and lead times in the system. The data acquisition system is showcased experimentally for a 96-readout channel detector demonstrating sub millisecond beam characteristics and beam reconstruction. The system demonstrated scalability up to 1064-readout channels, the limiting factor being FPGA I/O availability as well as amplification and sampling power consumption.
ContributorsAcuna Briceno, Rafael Andres (Author) / Barnaby, Hugh (Thesis advisor) / Brunhaver, John (Committee member) / Blyth, David (Committee member) / Arizona State University (Publisher)
Created2021
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Description
Recently, the implementation of neuromorphic accelerator hardware has gradually changed from traditional Von Neumann architectures to non-Von Neumann architectures due to the “memory wall” and “power wall”. Near-memory computing (NMC) and In- memory computing (IMC) are two common types of non-Von Neumann approaches. NMC can help reduce data movements, yet

Recently, the implementation of neuromorphic accelerator hardware has gradually changed from traditional Von Neumann architectures to non-Von Neumann architectures due to the “memory wall” and “power wall”. Near-memory computing (NMC) and In- memory computing (IMC) are two common types of non-Von Neumann approaches. NMC can help reduce data movements, yet it cannot fully address the challenge of improving computational efficiency as the neural network size grows. IMC has been proposed as a superior alternative. This architecture performs computation inside the memory array using stackable synaptic devices to improve the latency and the energy efficiency of neural network accelerators. Both volatile and non-volatile computational memory devices can achieve IMC. Fully complementary metal-oxide semiconductor (CMOS) in-memory computing cells can be realized by adding additional transistors in standard static random access memory (SRAM) bit-cell. The SRAM-based designs investigated in this dissertation perform bit-wise logical operation to obtain XNOR-and-accumulate computation (XAC) for deep neural networks (DNNs). Hybrid in-memory computing architectures combine CMOS with embedded non-volatile memory (eNVM). Resistive random access memory (RRAM) is one class of eNVM ideally suited for hybrid IMC. In a neural network, RRAM with programmable multi-level resistance/conductance states can naturally emulate weight transitions in the synaptic elements of neural networks. In this dissertation, the operation and effects of ionizing radiation effects on both fully CMOS and hybrid IMCs are investigated. The fully CMOS architectures preform SRAM-based XAC computations. The hybrid architectures use multi-state RRAM synapse with CMOS neurons to perform multiply-and-accumulate computation (MAC). In the SRAM XAC array, an 8×8 XNOR IMC array is modeled with flipped-well enhanced-gate super low threshold voltage (EGSLVT) metal-oxide semiconductor field-effect transistors (MOSFETs) from the GlobalFoundries 22nm fully depleted silicon on insulator (FDSOI) process. The impact of total ionizing dose (TID) on the XAC synaptic array is analyzed by using radiation-aware models to mimic TID-induced voltage shifts in MOSFETs. In multi- state RRAM MAC array, 4-state conductance has been programmed in hafnium-oxide (HfOx) RRAM 1-transistor-1-resistor (1T1R) array. The impact of total ionizing dose on the multi-state behavior of HfOx RRAM is evaluated by irradiating a 64kb 1T1R array with 90nm CMOS peripheral circuitry under Co-60 γ-ray irradiation.
ContributorsHan, Xu (Author) / Barnaby, Hugh (Thesis advisor) / Kozicki, Michael (Committee member) / Marinella, Matthew (Committee member) / Esqueda, Ivan (Committee member) / Arizona State University (Publisher)
Created2022
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Description
The Deep Neural Network (DNN) is one type of a neuromorphic computing approach that has gained substantial interest today. To achieve continuous improvement in accuracy, the depth, and the size of the deep neural network needs to significantly increase. As the scale of the neural network increases, it poses a

The Deep Neural Network (DNN) is one type of a neuromorphic computing approach that has gained substantial interest today. To achieve continuous improvement in accuracy, the depth, and the size of the deep neural network needs to significantly increase. As the scale of the neural network increases, it poses a severe challenge to its hardware implementation with conventional Computer Processing Unit (CPU) and Graphic Processing Unit (GPU) from the perspective of power, computation, and memory. To address this challenge, domain specific specialized digital neural network accelerators based on Field Programmable Gate Array (FPGAs) and Application Specific Integrated Circuits (ASICs) have been developed. However, limitations still exist in terms of on-chip memory capacity, and off-chip memory access. As an alternative, Resistive Random Access Memories (RRAMs), have been proposed to store weights on chip with higher density and enabling fast analog computation with low power consumption. Conductive Bridge Random Access Memories (CBRAMs) is a subset of RRAMs, whose conductance states is defined by the existence and modulation of a conductive metal filament. Ag-Chalcogenide based Conductive Bridge RAM (CBRAM) devices have demonstrated multiple resistive states making them potential candidates for use as analog synapses in neuromorphic hardware. In this work the use of Ag-Ge30Se70 device as an analog synaptic device has been explored. Ag-Ge30Se70 CBRAM crossbar array was fabricated. The fabricated crossbar devices were subjected to different pulsing schemes and conductance linearity response was analyzed. An improved linear response of the devices from a non-linearity factor of 6.65 to 1 for potentiation and -2.25 to -0.95 for depression with non-identical pulse application is observed. The effect of improved linearity was quantified by simulating the devices in an artificial neural network. Simulations for area, latency, and power consumption of the CBRAM device in a neural accelerator was conducted. Further, the changes caused by Total Ionizing Dose (TID) in the conductance of the analog response of Ag-Ge30Se70 Conductive Bridge Random Access Memory (CBRAM)-based synapses are studied. The effect of irradiation was further analyzed by simulating the devices in an artificial neural network. Material characterization was performed to understand the change in conductance observed due to TID.
ContributorsApsangi, Priyanka (Author) / Barnaby, Hugh (Thesis advisor) / Kozicki, Michael (Committee member) / Sanchez Esqueda, Ivan (Committee member) / Marinella, Matthew (Committee member) / Arizona State University (Publisher)
Created2022