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Description
As integrated technologies are scaling down, there is an increasing trend in the

process,voltage and temperature (PVT) variations of highly integrated RF systems.

Accounting for these variations during the design phase requires tremendous amount

of time for prediction of RF performance and optimizing it accordingly. Thus, there

is an increasing gap between the need

As integrated technologies are scaling down, there is an increasing trend in the

process,voltage and temperature (PVT) variations of highly integrated RF systems.

Accounting for these variations during the design phase requires tremendous amount

of time for prediction of RF performance and optimizing it accordingly. Thus, there

is an increasing gap between the need to relax the RF performance requirements at

the design phase for rapid development and the need to provide high performance

and low cost RF circuits that function with PVT variations. No matter how care-

fully designed, RF integrated circuits (ICs) manufactured with advanced technology

nodes necessitate lengthy post-production calibration and test cycles with expensive

RF test instruments. Hence design-for-test (DFT) is proposed for low-cost and fast

measurement of performance parameters during both post-production and in-eld op-

eration. For example, built-in self-test (BIST) is a DFT solution for low-cost on-chip

measurement of RF performance parameters. In this dissertation, three aspects of

automated test and calibration, including DFT mathematical model, BIST hardware

and built-in calibration are covered for RF front-end blocks.

First, the theoretical foundation of a post-production test of RF integrated phased

array antennas is proposed by developing the mathematical model to measure gain

and phase mismatches between antenna elements without any electrical contact. The

proposed technique is fast, cost-efficient and uses near-field measurement of radiated

power from antennas hence, it requires single test setup, it has easy implementation

and it is short in time which makes it viable for industrialized high volume integrated

IC production test.

Second, a BIST model intended for the characterization of I/Q offset, gain and

phase mismatch of IQ transmitters without relying on external equipment is intro-

duced. The proposed BIST method is based on on-chip amplitude measurement as

in prior works however,here the variations in the BIST circuit do not affect the target

parameter estimation accuracy since measurements are designed to be relative. The

BIST circuit is implemented in 130nm technology and can be used for post-production

and in-field calibration.

Third, a programmable low noise amplifier (LNA) is proposed which is adaptable

to different application scenarios depending on the specification requirements. Its

performance is optimized with regards to required specifications e.g. distance, power

consumption, BER, data rate, etc.The statistical modeling is used to capture the

correlations among measured performance parameters and calibration modes for fast

adaptation. Machine learning technique is used to capture these non-linear correlations and build the probability distribution of a target parameter based on measurement results of the correlated parameters. The proposed concept is demonstrated by

embedding built-in tuning knobs in LNA design in 130nm technology. The tuning

knobs are carefully designed to provide independent combinations of important per-

formance parameters such as gain and linearity. Minimum number of switches are

used to provide the desired tuning range without a need for an external analog input.
ContributorsShafiee, Maryam (Author) / Ozev, Sule (Thesis advisor) / Diaz, Rodolfo (Committee member) / Ogras, Umit Y. (Committee member) / Bakkaloglu, Bertan (Committee member) / Arizona State University (Publisher)
Created2018
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Description
Flexible hybrid electronics (FHE) is emerging as a promising solution to combine the benefits of printed electronics and silicon technology. FHE has many high-impact potential areas, such as wearable applications, health monitoring, and soft robotics, due to its physical advantages, which include light weight, low cost and the ability conform

Flexible hybrid electronics (FHE) is emerging as a promising solution to combine the benefits of printed electronics and silicon technology. FHE has many high-impact potential areas, such as wearable applications, health monitoring, and soft robotics, due to its physical advantages, which include light weight, low cost and the ability conform to different shapes. However, physical deformations that can occur in the field lead to significant testing and validation challenges. For example, designers have to ensure that FHE devices continue to meet specs even when the components experience stress due to bending. Hence, physical deformation, which is hard to emulate, has to be part of the test procedures developed for FHE devices. This paper is the first to analyze stress experience at different parts of FHE devices under different bending conditions. Then develop a novel methodology to maximize the test coverage with minimum number of text vectors with the help of a mixed integer linear programming formulation.
ContributorsGao, Hang (Author) / Ozev, Sule (Thesis advisor) / Ogras, Umit Y. (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2018
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Description
Medical ultrasound imaging is widely used today because of it being non-invasive and cost-effective. Flow estimation helps in accurate diagnosis of vascular diseases and adds an important dimension to medical ultrasound imaging. Traditionally flow estimation is done using Doppler-based methods which only estimate velocity in the beam direction. Thus

Medical ultrasound imaging is widely used today because of it being non-invasive and cost-effective. Flow estimation helps in accurate diagnosis of vascular diseases and adds an important dimension to medical ultrasound imaging. Traditionally flow estimation is done using Doppler-based methods which only estimate velocity in the beam direction. Thus when blood vessels are close to being orthogonal to the beam direction, there are large errors in the estimation results. In this dissertation, a low cost blood flow estimation method that does not have the angle dependency of Doppler-based methods, is presented.

First, a velocity estimator based on speckle tracking and synthetic lateral phase is proposed for clutter-free blood flow.

Speckle tracking is based on kernel matching and does not have any angle dependency. While velocity estimation in axial dimension is accurate, lateral velocity estimation is challenging due to reduced resolution and lack of phase information. This work presents a two tiered method which estimates the pixel level movement using sum-of-absolute difference, and then estimates the sub-pixel level using synthetic phase information in the lateral dimension. Such a method achieves highly accurate velocity estimation with reduced complexity compared to a cross correlation based method. The average bias of the proposed estimation method is less than 2% for plug flow and less than 7% for parabolic flow.

Blood is always accompanied by clutter which originates from vessel wall and surrounding tissues. As magnitude of the blood signal is usually 40-60 dB lower than magnitude of the clutter signal, clutter filtering is necessary before blood flow estimation. Clutter filters utilize the high magnitude and low frequency features of clutter signal to effectively remove them from the compound (blood + clutter) signal. Instead of low complexity FIR filter or high complexity SVD-based filters, here a power/subspace iteration based method is proposed for clutter filtering. Excellent clutter filtering performance is achieved for both slow and fast moving clutters with lower complexity compared to SVD-based filters. For instance, use of the proposed method results in the bias being less than 8% and standard deviation being less than 12% for fast moving clutter when the beam-to-flow-angle is $90^o$.

Third, a flow rate estimation method based on kernel power weighting is proposed. As the velocity estimator is a kernel-based method, the estimation accuracy degrades near the vessel boundary. In order to account for kernels that are not fully inside the vessel, fractional weights are given to these kernels based on their signal power. The proposed method achieves excellent flow rate estimation results with less than 8% bias for both slow and fast moving clutters.

The performance of the velocity estimator is also evaluated for challenging models. A 2D version of our two-tiered method is able to accurately estimate velocity vectors in a spinning disk as well as in a carotid bifurcation model, both of which are part of the synthetic aperture vector flow imaging (SA-VFI) challenge of 2018. In fact, the proposed method ranked 3rd in the challenge for testing dataset with carotid bifurcation. The flow estimation method is also evaluated for blood flow in vessels with stenosis. Simulation results show that the proposed method is able to estimate the flow rate with less than 9% bias.
ContributorsWei, Siyuan (Author) / Chakrabarti, Chaitali (Thesis advisor) / Papandreou-Suppappola, Antonia (Committee member) / Ogras, Umit Y. (Committee member) / Wenisch, Thomas F. (Committee member) / Arizona State University (Publisher)
Created2018
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Description
This dissertation proposes and presents two different passive sigma-delta

modulator zoom Analog to Digital Converter (ADC) architectures. The first ADC is fullydifferential, synthesizable zoom-ADC architecture with a passive loop filter for lowfrequency Built in Self-Test (BIST) applications. The detailed ADC architecture and a step

by step process designing the zoom-ADC along with

This dissertation proposes and presents two different passive sigma-delta

modulator zoom Analog to Digital Converter (ADC) architectures. The first ADC is fullydifferential, synthesizable zoom-ADC architecture with a passive loop filter for lowfrequency Built in Self-Test (BIST) applications. The detailed ADC architecture and a step

by step process designing the zoom-ADC along with a synthesis tool that can target various

design specifications are presented. The design flow does not rely on extensive knowledge

of an experienced ADC designer. Two example set of BIST ADCs have been synthesized

with different performance requirements in 65nm CMOS process. The first ADC achieves

90.4dB Signal to Noise Ratio (SNR) in 512µs measurement time and consumes 17µW

power. Another example achieves 78.2dB SNR in 31.25µs measurement time and

consumes 63µW power. The second ADC architecture is a multi-mode, dynamically

zooming passive sigma-delta modulator. The architecture is based on a 5b interpolating

flash ADC as the zooming unit, and a passive discrete time sigma delta modulator as the

fine conversion unit. The proposed ADC provides an Oversampling Ratio (OSR)-

independent, dynamic zooming technique, employing an interpolating zooming front-end.

The modulator covers between 0.1 MHz and 10 MHz signal bandwidth which makes it

suitable for cellular applications including 4G radio systems. By reconfiguring the OSR,

bias current, and component parameters, optimal power consumption can be achieved for

every mode. The ADC is implemented in 0.13 µm CMOS technology and it achieves an

SNDR of 82.2/77.1/74.2/68 dB for 0.1/1.92/5/10MHz bandwidth with 1.3/5.7/9.6/11.9mW

power consumption from a 1.2 V supply.
ContributorsEROL, OSMAN EMIR (Author) / Ozev, Sule (Thesis advisor) / Kitchen, Jennifer (Committee member) / Ogras, Umit Y. (Committee member) / Blain-Christen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2018
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Description
The reduced availability of 3He is a motivation for developing alternative neutron detectors. 6Li-enriched CLYC (Cs2LiYCl6), a scintillator, is a promising candidate to replace 3He. The neutron and gamma ray signals from CLYC have different shapes due to the slower decay of neutron pulses. Some of the well-known pulse shape

The reduced availability of 3He is a motivation for developing alternative neutron detectors. 6Li-enriched CLYC (Cs2LiYCl6), a scintillator, is a promising candidate to replace 3He. The neutron and gamma ray signals from CLYC have different shapes due to the slower decay of neutron pulses. Some of the well-known pulse shape discrimination techniques are charge comparison method, pulse gradient method and frequency gradient method. In the work presented here, we have applied a normalized cross correlation (NCC) approach to real neutron and gamma ray pulses produced by exposing CLYC scintillators to a mixed radiation environment generated by 137Cs, 22Na, 57Co and 252Cf/AmBe at different event rates. The cross correlation analysis produces distinctive results for measured neutron pulses and gamma ray pulses when they are cross correlated with reference neutron and/or gamma templates. NCC produces good separation between neutron and gamma rays at low (< 100 kHz) to mid event rate (< 200 kHz). However, the separation disappears at high event rate (> 200 kHz) because of pileup, noise and baseline shift. This is also confirmed by observing the pulse shape discrimination (PSD) plots and figure of merit (FOM) of NCC. FOM is close to 3, which is good, for low event rate but rolls off significantly along with the increase in the event rate and reaches 1 at high event rate. Future efforts are required to reduce the noise by using better hardware system, remove pileup and detect the NCC shapes of neutron and gamma rays using advanced techniques.
ContributorsChandhran, Premkumar (Author) / Holbert, Keith E. (Thesis advisor) / Spanias, Andreas (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2015
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Description
Coarse-grained Reconfigurable Arrays (CGRAs) are promising accelerators capable

of accelerating even non-parallel loops and loops with low trip-counts. One challenge

in compiling for CGRAs is to manage both recurring and nonrecurring variables in

the register file (RF) of the CGRA. Although prior works have managed recurring

variables via rotating RF, they access the nonrecurring

Coarse-grained Reconfigurable Arrays (CGRAs) are promising accelerators capable

of accelerating even non-parallel loops and loops with low trip-counts. One challenge

in compiling for CGRAs is to manage both recurring and nonrecurring variables in

the register file (RF) of the CGRA. Although prior works have managed recurring

variables via rotating RF, they access the nonrecurring variables through either a

global RF or from a constant memory. The former does not scale well, and the latter

degrades the mapping quality. This work proposes a hardware-software codesign

approach in order to manage all the variables in a local nonrotating RF. Hardware

provides modulo addition based indexing mechanism to enable correct addressing

of recurring variables in a nonrotating RF. The compiler determines the number of

registers required for each recurring variable and configures the boundary between the

registers used for recurring and nonrecurring variables. The compiler also pre-loads

the read-only variables and constants into the local registers in the prologue of the

schedule. Synthesis and place-and-route results of the previous and the proposed RF

design show that proposed solution achieves 17% better cycle time. Experiments of

mapping several important and performance-critical loops collected from MiBench

show proposed approach improves performance (through better mapping) by 18%,

compared to using constant memory.
ContributorsDave, Shail (Author) / Shrivastava, Aviral (Thesis advisor) / Ren, Fengbo (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2016
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Description
In this work, a 12-bit ADC with three types of calibration is proposed for high speed security applications as well as a precision application. This converter performs for both applications because it satisfies all the necessary specifications such as minimal device mismatch and offset, programmability to decrease aging effects, high

In this work, a 12-bit ADC with three types of calibration is proposed for high speed security applications as well as a precision application. This converter performs for both applications because it satisfies all the necessary specifications such as minimal device mismatch and offset, programmability to decrease aging effects, high SNR for increased ENOB and fast conversion rate. The designed converter implements three types of calibration necessary for offset and gain error, including: a correlated double sampling integrator used in the first stage of the ADC, a power up auto zero technique implemented in the digital code to store any offset and subtract out if necessary, and an automatic startup and manual calibration to control the common mode voltages. The proposed ADC was designed in Intel’s 10nm technology. This ADC is designed to monitor DC voltages for the precision and high speed applications. The conversion rate of the analog to digital converter is programmable to 7µs or 910ns, depending on the precision or high speed application, respectively. The range of the input and reference supply is 0 to 1.25V. The ADC is designed in Intel 10nm technology using a 1.8V supply consuming an area of 0.0705mm2. This thesis explores challenges of designing a dual-purpose analog to digital converter, which include: 1.) increased offset in 10nm technology, 2.) dual application ADC that can be accurate and fast, 3.) reducing the parasitic capacitance of the ADC, and 4.) gain error that occurs in ADCs.
ContributorsSchmelter, Brooke (Author) / Bakkaloglu, Bertan (Thesis advisor) / Ogras, Umit Y. (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2017
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Description
Accessibility to the internal nodes of an analog/mixed-signal circuit while testing is extremely difficult. Furthermore, with technology scaling, the effect of process variations becomes more pronounced which in turn effects the test time, test cost, and die yield. As devices become more unreliable, the probability of failure of a die

Accessibility to the internal nodes of an analog/mixed-signal circuit while testing is extremely difficult. Furthermore, with technology scaling, the effect of process variations becomes more pronounced which in turn effects the test time, test cost, and die yield. As devices become more unreliable, the probability of failure of a die increases, yield decreases affecting the quality of test and cost.Therefore, test time minimization and test cost reduction are important. Moreover, process variations can affect the performance of analog/mixed circuits. Therefore, the performance of a System On-Chip(SoC) which tends to integrate multiple band gap reference circuits (BGRs) is effected due to the wide variations caused in the behavior of the BGR as a result of increasing process variations. Calibration of the BGR is, thus, important in the test process so as to obtain accuracy in the measurement of the output voltage of BGR. Furthermore, as test time minimization and test cost reduction are important in a test process, Built-in Self Test (BIST) techniques have become more popular. To obtain accuracy in the measurement of the output voltage of BGR, a VCO-based zoom-in ADC architecture that was designed to calibrate the output of the BGR voltage which dictates the circuit performance. However, the zoom-voltages for the circuit are generated using a tester. As the number of such ADCs integrated on a SoC increase, the number of nodes to be accessed by the tester increase. Moreover, the capacitance of the probe affects the accuracy of the applied input voltages of the VCO-based ADC. Therefore, accessibility decreases with increase in scaling.Further, generating a wide range of inputs becomes burdensome for the tester. For all the above reasons, an on-chip DAC circuitry was proposed as a part of this thesis, to decrease the reliance on tester. The suggested DAC architecture is a simple resistor string whose resolution depends on the number of zoom-in voltages to be generated. This architecture has a linear and monotonic behavior which is very important as the VCO has a highly non-linear behavior. Thus, the voltages generated by the DAC should be accurate with minimum error so that the worst-case Integral Non-Linearity error (INL) is less than 1mV considering resistor mismatches over process variations. With the increase in the number of VCO-based ADCs on a chip, the test time savings increase exponentially. Thus, the introduction of an on-chip DAC circuitry offers various advantages like decreasing accessibility requirement during the test process, occupying less area, reducing test cost and most importantly, decreasing the reliance on tester.
ContributorsRavouri, Yestina (Author) / Ozev, Sule (Thesis advisor) / Ogras, Umit Y. (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2017
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Description
Memory systems are becoming increasingly error-prone, and thus guaranteeing their reliability is a major challenge. In this dissertation, new techniques to improve the reliability of both 2D and 3D dynamic random access memory (DRAM) systems are presented. The proposed schemes have higher reliability than current systems but with lower power,

Memory systems are becoming increasingly error-prone, and thus guaranteeing their reliability is a major challenge. In this dissertation, new techniques to improve the reliability of both 2D and 3D dynamic random access memory (DRAM) systems are presented. The proposed schemes have higher reliability than current systems but with lower power, better performance and lower hardware cost.

First, a low overhead solution that improves the reliability of commodity DRAM systems with no change in the existing memory architecture is presented. Specifically, five erasure and error correction (E-ECC) schemes are proposed that provide at least Chipkill-Correct protection for x4 (Schemes 1, 2 and 3), x8 (Scheme 4) and x16 (Scheme 5) DRAM systems. All schemes have superior error correction performance due to the use of strong symbol-based codes. In addition, the use of erasure codes extends the lifetime of the 2D DRAM systems.

Next, two error correction schemes are presented for 3D DRAM memory systems. The first scheme is a rate-adaptive, two-tiered error correction scheme (RATT-ECC) that provides strong reliability (10^10x) reduction in raw FIT rate) for an HBM-like 3D DRAM system that services CPU applications. The rate-adaptive feature of RATT-ECC enables permanent bank failures to be handled through sparing. It can also be used to significantly reduce the refresh power consumption without decreasing the reliability and timing performance.

The second scheme is a two-tiered error correction scheme (Config-ECC) that supports different sized accesses in GPU applications with strong reliability. It addresses the mismatch between data access size and fixed sized ECC scheme by designing a product code based flexible scheme. Config-ECC is built around a core unit designed for 32B access with a simple extension to support 64B and 128B accesses. Compared to fixed 32B and 64B ECC schemes, Config-ECC reduces the failure in time (FIT) rate by 200x and 20x, respectively. It also reduces the memory energy by 17% (in the dynamic mode) and 21% (in the static mode) compared to a state-of-the-art fixed 64B ECC scheme.
ContributorsChen, Hsing-Min (Author) / Chakrabarti, Chaitali (Thesis advisor) / Mudge, Trevor (Committee member) / Wu, Carole-Jean (Committee member) / Ogras, Umit Y. (Committee member) / Arizona State University (Publisher)
Created2017
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Description

This thesis details the design process of a variable gain amplifier (VGA) based circuit which maintains a consistent output power over a wide range of input power signals. This effect is achieved by using power detection circuitry to adjust the gain of the VGA based on the current input power

This thesis details the design process of a variable gain amplifier (VGA) based circuit which maintains a consistent output power over a wide range of input power signals. This effect is achieved by using power detection circuitry to adjust the gain of the VGA based on the current input power so that it is amplifier to a set power level. The paper details the theory behind this solutions as well as the design process which includes both simulations and physical testing of the actual circuit. It also analyses results of these tests and gives suggestions as to what could be done to further improve the design. The VGA based constant output power solution was designed as a section of a larger circuit which was developed as part of a senior capstone project, which is also briefly described in the paper.

ContributorsMeyer, Sheldon (Author) / Aberle, James (Thesis director) / Chakraborty, Partha (Committee member) / Electrical Engineering Program (Contributor) / School of Mathematical and Statistical Sciences (Contributor) / Barrett, The Honors College (Contributor)
Created2021-05