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- Member of: ASU Electronic Theses and Dissertations
Description
Efficiency of components is an ever increasing area of importance to portable applications, where a finite battery means finite operating time. Higher efficiency devices need to be designed that don't compromise on the performance that the consumer has come to expect. Class D amplifiers deliver on the goal of increased efficiency, but at the cost of distortion. Class AB amplifiers have low efficiency, but high linearity. By modulating the supply voltage of a Class AB amplifier to make a Class H amplifier, the efficiency can increase while still maintaining the Class AB level of linearity. A 92dB Power Supply Rejection Ratio (PSRR) Class AB amplifier and a Class H amplifier were designed in a 0.24um process for portable audio applications. Using a multiphase buck converter increased the efficiency of the Class H amplifier while still maintaining a fast response time to respond to audio frequencies. The Class H amplifier had an efficiency above the Class AB amplifier by 5-7% from 5-30mW of output power without affecting the total harmonic distortion (THD) at the design specifications. The Class H amplifier design met all design specifications and showed performance comparable to the designed Class AB amplifier across 1kHz-20kHz and 0.01mW-30mW. The Class H design was able to output 30mW into 16Ohms without any increase in THD. This design shows that Class H amplifiers merit more research into their potential for increasing efficiency of audio amplifiers and that even simple designs can give significant increases in efficiency without compromising linearity.
ContributorsPeterson, Cory (Author) / Bakkaloglu, Bertan (Thesis advisor) / Barnaby, Hugh (Committee member) / Kiaei, Sayfe (Committee member) / Arizona State University (Publisher)
Created2013
Description
Pulse Density Modulation- (PDM-) based class-D amplifiers can reduce non-linearity and tonal content due to carrier signal in Pulse Width Modulation - (PWM-) based amplifiers. However, their low-voltage analog implementations also require a linear- loop filter and a quantizer. A PDM-based class-D audio amplifier using a frequency-domain quantization is presented in this paper. The digital-intensive frequency domain approach achieves high linearity under low-supply regimes. An analog comparator and a single-bit quantizer are replaced with a Current-Controlled Oscillator- (ICO-) based frequency discriminator. By using the ICO as a phase integrator, a third-order noise shaping is achieved using only two analog integrators. A single-loop, singlebit class-D audio amplifier is presented with an H-bridge switching power stage, which is designed and fabricated on a 0.18 um CMOS process, with 6 layers of metal achieving a total harmonic distortion plus noise (THD+N) of 0.065% and a peak power efficiency of 80% while driving a 4-ohms loudspeaker load. The amplifier can deliver the output power of 280 mW.
ContributorsLee, Junghan (Author) / Bakkaloglu, Bertan (Thesis advisor) / Kiaei, Sayfe (Committee member) / Ozev, Sule (Committee member) / Song, Hongjiang (Committee member) / Arizona State University (Publisher)
Created2011
Description
ABSTRACT To meet stringent market demands, manufacturers must produce Radio Frequency (RF) transceivers that provide wireless communication between electronic components used in consumer products at extremely low cost. Semiconductor manufacturers are in a steady race to increase integration levels through advanced system-on-chip (SoC) technology. The testing costs of these devices tend to increase with higher integration levels. As the integration levels increase and the devices get faster, the need for high-calibre low cost test equipment become highly dominant. However testing the overall system becomes harder and more expensive. Traditionally, the transceiver system is tested in two steps utilizing high-calibre RF instrumentation and mixed-signal testers, with separate measurement setups for transmitter and receiver paths. Impairments in the RF front-end, such as the I/Q gain and phase imbalance and nonlinearity, severely affect the performance of the device. The transceiver needs to be characterized in terms of these impairments in order to guarantee good performance and specification requirements. The motivation factor for this thesis is to come up with a low cost and computationally simple extraction technique of these impairments. In the proposed extraction technique, the mapping between transmitter input signals and receiver output signals are used to extract the impairment and nonlinearity parameters. This is done with the help of detailed mathematical modeling of the transceiver. While the overall behavior is nonlinear, both linear and nonlinear models to be used under different test setups are developed. A two step extraction technique has been proposed in this work. The extraction of system parameters is performed by using the mathematical model developed along with a genetic algorithm implemented in MATLAB. The technique yields good extraction results with reasonable error. It uses simple mathematical operation which makes the extraction fast and computationally simple when compared to other existing techniques such as traditional two step dedicated approach, Nonlinear Solver (NLS) approach, etc. It employs frequency domain analysis of low frequency input and output signals, over cumbersome time domain computations. Thus a test method, including detailed behavioral modeling of the transceiver, appropriate test signal design along with a simple algorithm for extraction is presented.
ContributorsSreenivassan, Aiswariya (Author) / Ozev, Sule (Thesis advisor) / Kiaei, Sayfe (Committee member) / Bakkaloglu, Bertan (Committee member) / Arizona State University (Publisher)
Created2011
Description
Class D Amplifiers are widely used in portable systems such as mobile phones to achieve high efficiency. The demands of portable electronics for low power consumption to extend battery life and reduce heat dissipation mandate efficient, high-performance audio amplifiers. The high efficiency of Class D amplifiers (CDAs) makes them particularly attractive for portable applications. The Digital class D amplifier is an interesting solution to increase the efficiency of embedded systems. However, this solution is not good enough in terms of PWM stage linearity and power supply rejection. An efficient control is needed to correct the error sources in order to get a high fidelity sound quality in the whole audio range of frequencies. A fundamental analysis on various error sources due to non idealities in the power stage have been discussed here with key focus on Power supply perturbations driving the Power stage of a Class D Audio Amplifier. Two types of closed loop Digital Class D architecture for PSRR improvement have been proposed and modeled. Double sided uniform sampling modulation has been used. One of the architecture uses feedback around the power stage and the second architecture uses feedback into digital domain. Simulation & experimental results confirm that the closed loop PSRR & PS-IMD improve by around 30-40 dB and 25 dB respectively.
ContributorsChakraborty, Bijeta (Author) / Bakkaloglu, Bertan (Thesis advisor) / Garrity, Douglas (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2012
Description
Modern Complex electronic system include multiple power domains and drastically varying power consumption patterns, requiring the use of multiple power conversion and regulation units. High frequency switching converters have been gaining prominence in the DC-DC converter market due to their high efficiency. Unfortunately, they are all subject to higher process variations jeopardizing stable operation of the power supply.
This research mainly focus on the technique to track changes in the dynamic loop characteristics of the DC-DC converters without disturbing the normal mode of operation using a white noise based excitation and correlation. White noise excitation is generated via pseudo random disturbance at reference and PWM input of the converter with the test signal being spread over a wide bandwidth, below the converter noise and ripple floor. Test signal analysis is achieved by correlating the pseudo-random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the shelf power converter, LM27402 is used as the DUT for the experimental verification. Experimental results show that the proposed technique can estimate converter's natural frequency and Q-factor within ±2.5% and ±0.7% error margin respectively, over changes in load inductance and capacitance.
This research mainly focus on the technique to track changes in the dynamic loop characteristics of the DC-DC converters without disturbing the normal mode of operation using a white noise based excitation and correlation. White noise excitation is generated via pseudo random disturbance at reference and PWM input of the converter with the test signal being spread over a wide bandwidth, below the converter noise and ripple floor. Test signal analysis is achieved by correlating the pseudo-random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the shelf power converter, LM27402 is used as the DUT for the experimental verification. Experimental results show that the proposed technique can estimate converter's natural frequency and Q-factor within ±2.5% and ±0.7% error margin respectively, over changes in load inductance and capacitance.
ContributorsBakliwal, Priyanka (Author) / Ozev, Sule (Thesis advisor) / Bakkaloglu, Bertan (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2015
Description
The rapid growth of emerging technologies is placing enormous demand on the seamless access to the extensive amount of data, which drives an unprecedented need for substantially higher data-transfer rates. As 1.6 Terabit Ethernet (TbE) specifications are being developed, high speed interconnects along with advanced materials and processes play a crucial role in technology enabling. However, validation of interconnect performance becomes increasingly challenging at these higher speeds. High-speed interconnect behavior can be reliably predicted if interconnect models are successfully validated against measurements. In industry, it is still not common practice to perform validation at actual use conditions. Therefore, there is an urge for a restructured design methodology and metrology based on temperature and humidity, to set realistic specs for high speed interconnects and reduce probability of failure under variations. Uncertainty quantification and propagation for interconnect validation is critical to assess the correlation quality more objectively, as well as to determine the bottleneck to improve the accuracy, repeatability and reproducibility of all the measurements involved in validation. The purpose of this work is to create a methodology that is both academically rigorous and has a significant impact on industry. This methodology provides an accurate characterization of the electrical performance of interconnects under realistic use-conditions, accompanied by an uncertainty analysis to improve the assessment of correlation quality. Part of this work contributed to the Packaging Benchmark Suite developed by IEEE EPS technical committee on electrical design, modeling, and simulation.
ContributorsGeyik, Cemil S (Author) / Aberle, James T (Thesis advisor) / Zhang, Zhichao (Committee member) / Polka, Lesley A (Committee member) / Ozev, Sule (Committee member) / Arizona State University (Publisher)
Created2023
Description
Power management circuits are employed in most electronic integrated systems, including applications for automotive, IoT, and smart wearables. Oftentimes, these power management circuits become a single point of system failure, and since they are present in most modern electronic devices, they become a target for hardware security attacks. Digital circuits are typically more prone to security attacks compared to analog circuits, but malfunctions in digital circuitry can affect the analog performance/parameters of power management circuits. This research studies the effect that these hacks will have on the analog performance of power circuits, specifically linear and switching power regulators/converters. Apart from security attacks, these circuits suffer from performance degradations due to temperature, aging, and load stress. Power management circuits usually consist of regulators or converters that regulate the load’s voltage supply by employing a feedback loop, and the stability of the feedback loop is a critical parameter in the system design. Oftentimes, the passive components employed in these circuits shift in value over varying conditions and may cause instability within the power converter. Therefore, variations in the passive components, as well as malicious hardware security attacks, can degrade regulator performance and affect the system’s stability. The traditional ways of detecting phase margin, which indicates system stability, employ techniques that require the converter to be in open loop, and hence can’t be used while the system is deployed in-the-field under normal operation. Aging of components and security attacks may occur after the power management systems have completed post-production test and have been deployed, and they may not cause catastrophic failure of the system, hence making them difficult to detect. These two issues of component variations and security attacks can be detected during normal operation over the product lifetime, if the frequency response of the power converter can be monitored in-situ and in-field. This work presents a method to monitor the phase margin (stability) of a power converter without affecting its normal mode of operation by injecting a white noise/ pseudo random binary sequence (PRBS). Furthermore, this work investigates the analog performance parameters, including phase margin, that are affected by various digital hacks on the control circuitry associated with power converters. A case study of potential hardware attacks is completed for a linear low-dropout regulator (LDO).
ContributorsMalakar, Pragya Priya (Author) / Kitchen, Jennifer (Thesis advisor) / Ozev, Sule (Committee member) / Brunhaver, John (Committee member) / Arizona State University (Publisher)
Created2019
Description
The manufacturing process for electronic systems involves many players, from chip/board design and fabrication to firmware design and installation.
In today's global supply chain, any of these steps are prone to interference from rogue players, creating a security risk.
Manufactured devices need to be verified to perform only their intended operations since it is not economically feasible to control the supply chain and use only trusted facilities.
It is becoming increasingly necessary to trust but verify the received devices both at production and in the field.
Unauthorized hardware or firmware modifications, known as Trojans,
can steal information, drain the battery, or damage battery-driven embedded systems and lightweight Internet of Things (IoT) devices.
Since Trojans may be triggered in the field at an unknown instance,
it is essential to detect their presence at run-time.
However, it isn't easy to run sophisticated detection algorithms on these devices
due to limited computational power and energy, and in some cases, lack of accessibility.
Since finding a trusted sample is infeasible in general, the proposed technique is based on self-referencing to remove any effect of environmental or device-to-device variations in the frequency domain.
In particular, the self-referencing is achieved by exploiting the band-limited nature of Trojan activity using signal detection theory.
When the device enters the test mode, a predefined test application is run on the device
repetitively for a known period. The periodicity ensures that the spectral electromagnetic power of the test application concentrates at known frequencies, leaving the remaining frequencies within the operating bandwidth at the noise level. Any deviations from the noise level for these unoccupied frequency locations indicate the presence of unknown (unauthorized) activity. Hence, the malicious activity can differentiate without using a golden reference or any knowledge of the Trojan activity attributes.
The proposed technique's effectiveness is demonstrated through experiments with collecting and processing side-channel signals, such as involuntarily electromagnetic emissions and power consumption, of a wearable electronics prototype and commercial system-on-chip under a variety of practical scenarios.
In today's global supply chain, any of these steps are prone to interference from rogue players, creating a security risk.
Manufactured devices need to be verified to perform only their intended operations since it is not economically feasible to control the supply chain and use only trusted facilities.
It is becoming increasingly necessary to trust but verify the received devices both at production and in the field.
Unauthorized hardware or firmware modifications, known as Trojans,
can steal information, drain the battery, or damage battery-driven embedded systems and lightweight Internet of Things (IoT) devices.
Since Trojans may be triggered in the field at an unknown instance,
it is essential to detect their presence at run-time.
However, it isn't easy to run sophisticated detection algorithms on these devices
due to limited computational power and energy, and in some cases, lack of accessibility.
Since finding a trusted sample is infeasible in general, the proposed technique is based on self-referencing to remove any effect of environmental or device-to-device variations in the frequency domain.
In particular, the self-referencing is achieved by exploiting the band-limited nature of Trojan activity using signal detection theory.
When the device enters the test mode, a predefined test application is run on the device
repetitively for a known period. The periodicity ensures that the spectral electromagnetic power of the test application concentrates at known frequencies, leaving the remaining frequencies within the operating bandwidth at the noise level. Any deviations from the noise level for these unoccupied frequency locations indicate the presence of unknown (unauthorized) activity. Hence, the malicious activity can differentiate without using a golden reference or any knowledge of the Trojan activity attributes.
The proposed technique's effectiveness is demonstrated through experiments with collecting and processing side-channel signals, such as involuntarily electromagnetic emissions and power consumption, of a wearable electronics prototype and commercial system-on-chip under a variety of practical scenarios.
ContributorsKarabacak, Fatih (Author) / Ozev, Sule (Thesis advisor) / Ogras, Umit Y. (Thesis advisor) / Christen, Jennifer Blain (Committee member) / Kitchen, Jennifer (Committee member) / Arizona State University (Publisher)
Created2020
Description
Micro-Electro Mechanical System (MEMS) is the micro-scale technology applying on various fields. Traditional testing strategy of MEMS requires physical stimulus, which leads to high cost specified equipment. Also there are a large number of wafer-level measurements for MEMS. A method of estimation calibration coefficient only by electrical stimulus based wafer level measurements is included in the thesis. Moreover, a statistical technique is introduced that can reduce the number of wafer level measurements, meanwhile obtaining an accurate estimate of unmeasured parameters. To improve estimation accuracy, outlier analysis is the effective technique and merged in the test flow. Besides, an algorithm for optimizing test set is included, also providing numerical estimated prediction error.
ContributorsDeng, Lingfei (Author) / Ozev, Sule (Thesis advisor) / Yu, Hongyu (Committee member) / Christen, Jennifer Blain (Committee member) / Arizona State University (Publisher)
Created2012