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          <dc:identifier>https://hdl.handle.net/2286/R.I.38487</dc:identifier>
                  <dc:rights>http://rightsstatements.org/vocab/InC/1.0/</dc:rights>
          <dc:rights>All Rights Reserved</dc:rights>
                  <dc:date>2016</dc:date>
                  <dc:format>ix, 65 pages : illustrations (some color)</dc:format>
                  <dc:type>Masters Thesis</dc:type>
          <dc:type>Academic theses</dc:type>
          <dc:type>Text</dc:type>
                  <dc:language>eng</dc:language>
                  <dc:contributor>Gogulamudi, Anudeep Reddy</dc:contributor>
          <dc:contributor>Clark, Lawrence T</dc:contributor>
          <dc:contributor>Holbert, Keith E.</dc:contributor>
          <dc:contributor>Brunhaver, John</dc:contributor>
          <dc:contributor>Arizona State University</dc:contributor>
                  <dc:description>Partial requirement for: M.S., Arizona State University, 2016</dc:description>
          <dc:description>Includes bibliographical references (pages 63-65)</dc:description>
          <dc:description>Field of study: Electrical engineering</dc:description>
          <dc:description>Digital systems are essential to the technological advancements in space exploration. Microprocessor and flash memory are the essential parts of such a digital system. Space exploration requires a special class of radiation hardened microprocessors and flash memories, which are not functionally disrupted in the presence of radiation. The reference design ‘HERMES’ is a radiation-hardened microprocessor with performance comparable to commercially available designs. The reference design ‘eFlash’ is a prototype of soft-error hardened flash memory for configuring Xilinx FPGAs. These designs are manufactured using a foundry bulk CMOS 90-nm low standby power (LP) process. This thesis presents the post-silicon validation results of these designs.</dc:description>
                  <dc:subject>Electrical Engineering</dc:subject>
          <dc:subject>Computer Engineering</dc:subject>
          <dc:subject>Post-silicon Validation</dc:subject>
          <dc:subject>Radiation-hardened microprocessor</dc:subject>
          <dc:subject>TID on embedded flash memory</dc:subject>
          <dc:subject>Microprocessors</dc:subject>
          <dc:subject>Radiation hardening</dc:subject>
          <dc:subject>Flash memories (Computers)</dc:subject>
                  <dc:title>Post-silicon validation of radiation hardened microprocessor, embedded flash and test structures</dc:title></oai_dc:dc></metadata></record></GetRecord></OAI-PMH>
