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151596 https://hdl.handle.net/2286/R.I.17771 http://rightsstatements.org/vocab/InC/1.0/ All Rights Reserved 2013 xiii, 91 p. : ill. (some col.) Masters Thesis Academic theses Text eng Elhami Khorasani, Arash Alford, Terry Goryll, Michael Bertoni, Mariana Arizona State University Partial requirement for: M.S., Arizona State University, 2013 Includes bibliographical references (p. 89-91) Field of study: Materials science and engineering Carrier lifetime is one of the few parameters which can give information about the low defect densities in today's semiconductors. In principle there is no lower limit to the defect density determined by lifetime measurements. No other technique can easily detect defect densities as low as 10-9 - 10-10 cm-3 in a simple, contactless room temperature measurement. However in practice, recombination lifetime τr measurements such as photoconductance decay (PCD) and surface photovoltage (SPV) that are widely used for characterization of bulk wafers face serious limitations when applied to thin epitaxial layers, where the layer thickness is smaller than the minority carrier diffusion length Ln. Other methods such as microwave photoconductance decay (µ-PCD), photoluminescence (PL), and frequency-dependent SPV, where the generated excess carriers are confined to the epitaxial layer width by using short excitation wavelengths, require complicated configuration and extensive surface passivation processes that make them time-consuming and not suitable for process screening purposes. Generation lifetime τg, typically measured with pulsed MOS capacitors (MOS-C) as test structures, has been shown to be an eminently suitable technique for characterization of thin epitaxial layers. It is for these reasons that the IC community, largely concerned with unipolar MOS devices, uses lifetime measurements as a "process cleanliness monitor." However when dealing with ultraclean epitaxial wafers, the classic MOS-C technique measures an effective generation lifetime τg eff which is dominated by the surface generation and hence cannot be used for screening impurity densities. I have developed a modified pulsed MOS technique for measuring generation lifetime in ultraclean thin p/p+ epitaxial layers which can be used to detect metallic impurities with densities as low as 10-10 cm-3. The widely used classic version has been shown to be unable to effectively detect such low impurity densities due to the domination of surface generation; whereas, the modified version can be used suitably as a metallic impurity density monitoring tool for such cases. Materials Science Electrical Engineering Carrier Lifetime Epitaxial Layers MOS Capacitors Semiconductor Defects Semiconductor Device Measurement Silicon Semiconductors Epitaxy Thin films Excess carriers (Solid state physics) Carrier lifetime measurement for characterization of ultraclean thin p/p+ silicon epitaxial layers