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149852 https://hdl.handle.net/2286/R.I.9148 http://rightsstatements.org/vocab/InC/1.0/ All Rights Reserved 2011 viii, 70 p. : ill. (some col.) Masters Thesis Academic theses Text eng Zheng, Rui Cao, Yu Yu, Hongyu Bakkaloglu, Bertan Arizona State University Partial requirement for: M.S., Arizona State University, 2011 Includes bibliographical references (p. 45-47) Field of study: Electrical engineering Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are important reliability issues impacting analog circuit performance and lifetime. Compact reliability models and efficient simulation methods are essential for circuit level reliability prediction. This work proposes a set of compact models of NBTI and CHC effects for analog and mixed-signal circuit, and a direct prediction method which is different from conventional simulation methods. This method is applied in circuit benchmarks and evaluated. This work helps with improving efficiency and accuracy of circuit aging prediction. Electrical Engineering aging model Analog CHC NBTI Mixed signal circuits Linear integrated circuits Integrated circuits--Reliability. Aging predictive models and simulation methods for analog and mixed-signal circuits