Quantifying Chalcophile Elements and Heavy Halogens by Secondary Ion Mass Spectrometry and Demonstrating the Significant Effect of Different Secondary Ion Normalizing Procedures

A novel technique for measuring heavy trace elements in geologic materials with secondary ion mass spectrometry (SIMS) is presented. This technique combines moderate levels of mass resolving power (MRP) with energy filtering in order to remove molecular ion interferences while maintaining enough sensitivity to measure trace elements.