Description
A Single Event Transient (SET) is a transient voltage pulse induced by an ionizing radiation particle striking a combinational logic node in a circuit. The probability of a storage element capturing the transient pulse depends on the width of the pulse.
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Contributors
- Shreedharan, Sanjay (Author)
- Brunhaver, John (Thesis advisor)
- Clark, Lawrence (Committee member)
- Sanchez Esqueda, Ivan (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2020
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Note
- Masters Thesis Electrical Engineering 2020