Integrated oxide/semiconductor heterostructures have attracted intense interest for device applications which require sharp interfaces and controlled defects. The research of this dissertation has focused on the characterization of perovskite oxide/oxide and oxide/semiconductor heterostructures, and the analysis of interfaces and defect structures, using scanning transmission electrom microscopy (STEM) and related techniques.
Download count: 0
- Partial requirement for: Ph.D., Arizona State University, 2018Note typethesis
- Includes bibliographical referencesNote typebibliography
- Field of study: Materials science and engineering