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Memory systems are becoming increasingly error-prone, and thus guaranteeing their reliability is a major challenge. In this dissertation, new techniques to improve the reliability of both 2D and 3D dynamic

Memory systems are becoming increasingly error-prone, and thus guaranteeing their reliability is a major challenge. In this dissertation, new techniques to improve the reliability of both 2D and 3D dynamic random access memory (DRAM) systems are presented. The proposed schemes have higher reliability than current systems but with lower power, better performance and lower hardware cost.

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    • 2017
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    • Doctoral Dissertation Electrical Engineering 2017

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